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Low Cost 1.2 g Dual
Axis Accelerometer
ADXL213
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.326.8703
2004 Analog Devices, Inc. All rights reserved.
FEATURES
Dual axis accelerometer on a single IC chip
5 mm 5 mm 2 mm LCC package
1 mg resolution at 60 Hz
Low power: 700 A at V
S
= 5 V (typical)
High zero g bias stability
High sensitivity accuracy
Pulse width modulated digital outputs
X and Y axes aligned to within 0.1 (typical)
BW adjustment with a single capacitor
Single-supply operation
3500 g shock survival
APPLICATIONS
Automotive tilt alarms
Data projectors
Navigation
Platform stabilization/leveling
Alarms and motion detectors
High accuracy, 2-axis tilt sensing
GENERAL DESCRIPTION
The ADXL213 is a low cost, low power, complete dual axis
accelerometer with signal conditioned, duty cycle modulated
outputs, all on a single monolithic IC. The ADXL213 measures
acceleration with a full-scale range of 1.2 g (typical). The
ADXL213 can measure both dynamic acceleration (e.g.,
vibration) and static acceleration (e.g., gravity).
The outputs are digital signals whose duty cycles (ratio of pulse
width to period) are proportional to acceleration (30%/g). The
duty cycle outputs can be directly measured by a microcontrol-
ler without an A/D converter or glue logic.
Innovative design techniques are used to ensure high zero g bias
stability (typically better than 0.25 mg/C), as well as tight sensi-
tivity stability (typically better than 50 ppm/C).
The typical noise floor is 160 g/Hz, allowing signals below
1 mg (0.06 of inclination) to be resolved in tilt sensing applica-
tions using narrow bandwidths (<60 Hz).
The user selects the bandwidth of the accelerometer using
capacitors C
X
and C
Y
at the X
FILT
and Y
FILT
pins. Bandwidths of
0.5 Hz to 250 Hz may be selected to suit the application.
The ADXL213 is available in a 5 mm 5 mm 2 mm, 8-pad
hermetic LCC package.
FUNCTIONAL BLOCK DIAGRAM
04742-0-001
ADXL213
SENSOR
32k
32k
+V
S
OUTPUT
AMP
OUTPUT
AMP
DCM
COM
ST
X
FILT
Y
FILT
+V
S
C
DC
C
X
DEMOD
C
Y
T2
Y
OUT
X
OUT
R
SET
AC
AMP
A(g) = (T1/T2 0.5)/30%
0g = 50% DUTY CYCLE
T2(s) = R
SET
/125M
T2
T1
Figure 1.
ADXL213
Rev. 0 | Page 2 of 12
TABLE OF CONTENTS
Specifications..................................................................................... 3
Absolute Maximum Ratings............................................................ 4
Typical Performance Characteristics ............................................. 5
Theory of Operation ........................................................................ 8
Performance .................................................................................. 8
Applications....................................................................................... 9
Power Supply Decoupling ........................................................... 9
Setting the Bandwidth Using C
X
and C
Y
.................................... 9
Self Test .......................................................................................... 9
Design Trade-Offs for Selecting Filter Characteristics:
The Noise/BW Trade-Off........................................................9
Using the ADXL213 with Operating Voltages Other
than 5 V................................................................................... 10
Using the ADXL213 as a Dual-Axis Tilt Sensor..................... 10
Pin Configurations and Functional Descriptions ...................... 11
Outline Dimensions ....................................................................... 12
ESD Caution................................................................................ 12
Ordering Guide .......................................................................... 12
REVISION HISTORY
Revision 0: Initial Version
ADXL213
Rev. 0 | Page 3 of 12
SPECIFICATIONS
T
A
= 40C to +85C, V
S
= 5 V, C
X
= C
Y
= 0.1 F, Acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications
are guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter Conditions
Min
Typ
Max
Unit
SENSOR INPUT
Each axis
Measurement Range
1
1.2
g
Nonlinearity
% of full scale
0.5
%
Package Alignment Error
1
Degrees
Alignment Error
X sensor to Y sensor
0.1
Degrees
Cross Axis Sensitivity
2
%
SENSITIVITY (Ratiometric)
2
Each axis
Sensitivity at X
OUT
, Y
OUT
V
S
= 5 V
27
30
33
%/g
Sensitivity Change due to Temperature
3
V
S
= 5 V
0.3
%
ZERO g BIAS LEVEL (Ratiometric)
Each axis
0 g Voltage at X
OUT
, Y
OUT
V
S
= 5 V
50
%
Initial 0 g Output Deviation from Ideal
V
S
= 5 V, 25C
2
%
0 g Offset vs. Temperature
0.25
mg/C
NOISE PERFORMANCE
Noise Density
@25C
160
g/Hz rms
FREQUENCY RESPONSE
4
C
X
, C
Y
Range
5
0.002
4.7
F
R
FILT
Tolerance
22
32
42
k
Sensor Resonant Frequency
5.5
kHz
SELF TEST
6
Logic Input Low
1
V
Logic Input High
4
V
ST Input Resistance to Ground
30
50
k
Output Change at X
OUT
, Y
OUT
Self test 0 to 1
23
%
PWM Output
F
SET
R
SET
= 125 k
1
kHz
T2 Drift versus Temperature
0.3
%
POWER SUPPLY
Operating Voltage Range
3
6
V
Quiescent Supply Current
0.7
1.1
mA
Turn-On Time
7
20
ms
1
Guaranteed by measurement of initial offset and sensitivity.
2
Sensitivity varies with V
S
. At V
S
= 3 V, sensitivity is typically 28%/g.
3
Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature.
4
Actual frequency response controlled by user-supplied external capacitor (C
X
, C
Y
).
5
Bandwidth = 1/(2 32 k C). For C
X
, C
Y
= 0.002 F, Bandwidth = 2500 Hz. For C
X
, C
Y
= 4.7 F, Bandwidth = 1 Hz. Minimum/maximum values are not tested.
6
Self-test response changes with V
S
. At V
S
= 3 V, self-test output is typically 8%.
7
Larger values of C
X
, C
Y
increase turn-on time. Turn-on time is approximately 160 C
X
or C
Y
+ 4 ms, where C
X
, C
Y
are in F.
ADXL213
Rev. 0 | Page 4 of 12
ABSOLUTE MAXIMUM RATINGS
Table 2. ADXL213 Stress Ratings
Parameter Rating
Acceleration (Any Axis, Unpowered)
3,500 g
Acceleration (Any Axis, Powered)
3,500 g
Drop Test (Concrete Surface)
1.2 m
V
S
0.3 V to +7.0 V
All Other Pins
(COM 0.3 V) to
(V
S
+ 0.3 V)
Output Short-Circuit Duration
(Any Pin to Common)
Indefinite
Operating Temperature Range
55C to +125C
Storage Temperature
65C to +150C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 3. Package Characteristics
Package Type
JA
JC
Device Weight
8-Lead CLCC
120C/W
20C/W
<1.0 gram
03757-0-002
t
P
t
L
t
25C TO PEAK
t
S
PREHEAT
CRITICAL ZONE
T
L
TO T
P
TE
MP
E
RATURE
TIME
RAMP-DOWN
RAMP-UP
T
SMIN
T
SMAX
T
P
T
L
Condition
Profile Feature
Sn63/Pb37 Pb
Free
Average Ramp Rate (T
L
to T
P
) 3C/second
max
Preheat
Minimum Temperature (T
SMIN
)
100C 150C
Minimum Temperature (T
SMAX
)
150C 200C
Time (T
SMIN
to T
SMAX
) (t
S
)
60120 seconds
60150 seconds
T
SMAX
to T
L
Ramp-Up Rate
3C/second
Time Maintained above Liquidous (T
L
)
Liquidous Temperature (T
L
)
183C 217C
Time (t
L
)
60150 seconds
60150 seconds
Peak Temperature (T
P
)
240C +0C/5C
260C +0C/5C
Time within 5C of Actual Peak Temperature (t
P
)
1030 seconds
2040 seconds
Ramp-Down Rate
6C/second max
Time 25C to Peak Temperature
6 minutes max
8 minutes max
Figure 2. Recommended Soldering Profile
ADXL213
Rev. 0 | Page 5 of 12
TYPICAL PERFORMANCE CHARACTERISTICS
(V
S
= 5 V for all graphs, unless otherwise noted.)
PERCENT OF POPULATION (
%
)
0
25.0
20.0
15.0
10.0
5.0
04742-0-002
DUTY CYCLE OUTPUT (%)
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
Figure 3. X Axis Zero g Bias Deviation from Ideal at 25C
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
0
30.0
20.0
25.0
15.0
10.0
5.0
04742-0-003
TEMPCO (mg/C)
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
Figure 4. X Axis Zero g Bias Tempco
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
0
30.0
20.0
25.0
15.0
10.0
5.0
04742-0-004
DUTY CYCLE OUTPUT (% per g)
28.0
28.4
28.8
29.2
29.6
30.0
30.4
30.8
31.2
31.6
32.0
Figure 5. X Axis Sensitivity at 25C
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
0
25.0
20.0
15.0
10.0
5.0
04742-0-005
DUTY CYCLE OUTPUT (%)
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
Figure 6. Y Axis Zero g Bias Deviation from Ideal at 25C
P
E
RCE
NT OF P
O
P
U
LATION (%)
0
40.0
20.0
25.0
30.0
35.0
15.0
10.0
5.0
04742-0-006
TEMPCO (mg/C)
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
Figure 7. Y Axis Zero g Bias Tempco
P
E
RCE
NT OF P
O
P
U
LATION (%)
0
30.0
20.0
25.0
15.0
10.0
5.0
04742-0-007
DUTY CYCLE OUTPUT (% per g)
28.0
28.4
28.8
29.2
29.6
30.0
30.4
30.8
31.2
31.6
32.0
Figure 8. Y Axis Sensitivity at 25C
ADXL213
Rev. 0 | Page 6 of 12
TEMPERATURE (C)
DUTY
CY
CLE
(%)
40
46.0
53.0
52.5
52.0
51.5
51.0
50.0
50.5
49.0
49.5
48.0
48.5
47.0
46.5
47.5
53.5
54.0
30
20
10
0
10
20
30
50
40
60
70
80
90
04742-0-008
Figure 9. Zero g Bias vs. Temperature Parts Soldered to PCB
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
0
40.0
25.0
30.0
35.0
20.0
15.0
10.0
5.0
04742-0-009
NOISE DENSITY (
g
Hz)
100
110
120
130
140
160
150
190
180
170
200
210
220
240
230
250
Figure 10. X Axis Noise Density at 25C
PERCENT SENSITIVITY (%)
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
5.0
0
30
25
20
15
10
5
35
40
4.0
3.0
2
.
0
1.0
0
1.0
2.0
3.0
4.0
5.0
03757-0-005
Figure 11. Z vs. X Cross-Axis Sensitivity
TEMPERATURE (C)
SEN
SITIVITY (
%
/
g
)
50
40
28.50
31.00
30.75
30.50
30.00
30.25
29.75
29.25
29.50
28.75
29.00
31.25
31.50
30
20
10
0
10
20
30
50
40
60
70
80
90
04742-0-010
Figure 12. Sensitivity vs. Temperature Parts Soldered to PCB
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
0
40.0
25.0
30.0
35.0
20.0
15.0
10.0
5.0
04742-0-011
NOISE DENSITY (
g
Hz)
100
110
120
130
140
160
150
190
180
170
200
210
220
240
230
250
Figure 13. Y Axis Noise Density at 25C
PERCENT SENSITIVITY (%)
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
5.0
0
30
25
20
15
10
5
35
40
4.0
3.0
2
.
0
1.0
0
1.0
2.0
3.0
4.0
5.0
03757-0-006
Figure 14. Z vs. Y Cross-Axis Sensitivity
ADXL213
Rev. 0 | Page 7 of 12
TEMPERATURE (C)
CURRE
NT (mA)
0.3
0.8
0.7
0.6
0.5
0.4
0.9
03757-0-020
150
100
50
0
50
V
S
= 5V
V
S
= 3V
Figure 15. Supply Current vs. Temperature
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
0
16.0
10.0
12.0
14.0
8.0
6.0
4.0
2.0
04742-0-012
DELTA IN DUTY CYCLE (%)
3
1
3
0
2
9
2
8
2
7
2
6
2
4
2
5
2
3
2
2
2
1
2
0
1
9
1
8
Figure 16. X Axis Self Test Response at 25C
TEMPERATURE (C)
SELF TEST OUTPUT (%)
50
20
25
24
23
22
21
26
40
30
20
10
0
10
20
30
50
40
60
70
80
90
04742-0-013
Figure 17. Self Test Response vs. Temperature
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
0
80
70
60
50
40
30
20
10
90
100
03757-0-018
A
3V
5V
200
300
400
500
600
700
800
900
1000
Figure 18. Supply Current at 25C
PER
C
E
N
T
OF POPU
LA
TION
(
%
)
0
16.0
10.0
12.0
14.0
8.0
6.0
4.0
2.0
04742-0-014
DELTA IN DUTY CYCLE (%)
3
1
3
0
2
9
2
8
2
7
2
6
2
4
2
5
2
3
2
2
2
1
2
0
1
9
1
8
Figure 19. Y Axis Self Test Response at 25C
03757-
0-
009
Figure 20. Turn-On Time C
X
, C
Y
= 0.1 F, Time Scale = 2 ms/div
ADXL213
Rev. 0 | Page 8 of 12
THEORY OF OPERATION
EARTH'S SURFACE
04742-0-015
TOP VIEW
(Not to Scale)
PIN 8
X
OUT
= 50%
Y
OUT
= 80%
X
OUT
= 50%
Y
OUT
= 50%
PIN 8
X
OUT
= 50%
Y
OUT
= 20%
PIN 8
X
OUT
= 80%
Y
OUT
= 50%
PIN 8
X
OUT
= 20%
Y
OUT
= 50%
Figure 21. Output Response vs. Orientation
The ADXL213 is a complete dual axis acceleration measure-
ment system on a single monolithic IC. It contains a polysilicon
surface-micromachined sensor and signal conditioning
circuitry to implement an open-loop acceleration measurement
architecture. The output signals are duty cycle modulated digital
signals proportional to acceleration. The ADXL213 is capable of
measuring both positive and negative accelerations to 1.2 g.
The accelerometer can measure static acceleration forces such
as gravity, allowing the ADXL213 to be used as a tilt sensor.
The sensor is a surface-micromachined polysilicon structure
built on top of the silicon wafer. Polysilicon springs suspend the
structure over the surface of the wafer and provide a resistance
against acceleration forces. Deflection of the structure is mea-
sured using a differential capacitor that consists of independent
fixed plates and plates attached to the moving mass. The fixed
plates are driven by 180 out-of-phase square waves. Accelera-
tion deflects the beam and unbalances the differential capacitor,
resulting in an output square wave whose amplitude is propor-
tional to acceleration. Phase sensitive demodulation techniques
are then used to rectify the signal and determine the direction
of the acceleration.
The output of the demodulator is amplified and brought off-
chip through a 32 k resistor. At this point, the user can set the
signal bandwidth of the device by adding a capacitor. This
filtering improves measurement resolution and helps prevent
aliasing.
After being low-pass filtered, the duty cycle modulator converts
the analog signals to duty cycle modulated outputs that can be
read by a counter. A single resistor (R
SET
) sets the period for a
complete cycle. A 0 g acceleration produces a 50% nominal duty
cycle. The acceleration can be determined by measuring the
length of the positive pulse width (t1) and the period (t2). The
nominal transfer function of the ADXL213 is
Acceleration = ((t1/t2) Zero g Bias)/Sensitivity
Where in the case of the ADXL213
Zero g Bias = 50% nominal
Sensitivity = 30%/g nominal
t2 = R
SET
/125 M
PERFORMANCE
Rather than using additional temperature compensation
circuitry, innovative design techniques have been used to ensure
that high performance is built in. As a result, there is essentially
no quantization error or nonmonotonic behavior, and
temperature hysteresis is very low (typically less than 10 mg
over the 40C to +85C temperature range).
Figure 9 shows the zero g output performance of eight parts (X
and Y axis) over a 40C to +85C temperature range.
Figure 12 demonstrates the typical sensitivity shift over
temperature for V
S
= 5 V. Sensitivity stability is optimized for
V
S
= 5 V, but is still very good over the specified range; it is
typically better than 2% over temperature at V
S
= 3 V.
ADXL213
Rev. 0 | Page 9 of 12
APPLICATIONS
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 F capacitor, C
DC
, adequately
decouples the accelerometer from noise on the power supply.
However, in some cases, particularly where noise is present at
the 140 kHz internal clock frequency (or any harmonic
thereof), noise on the supply may cause interference on the
ADXL213's output. If additional decoupling is needed, a 100
(or smaller) resistor or ferrite beads may be inserted in the
supply line of the ADXL213. Additionally, a larger bulk bypass
capacitor (in the range of 1 F to 22 F) may be added in
parallel to C
DC
.
SETTING THE BANDWIDTH USING C
X
AND C
Y
The ADXL213 has provisions for bandlimiting the X
OUT
and
Y
OUT
pins. Capacitors must be added at these pins to implement
low-pass filtering for antialiasing and noise reduction. The
equation for the 3 dB bandwidth is
F
3 dB
= 1/(2(32 k) C
(X, Y)
)
or more simply,
F
3 dB
= 5 F/C
(X, Y)
The tolerance of the internal resistor (R
FILT
) can vary typically as
much as 25% of its nominal value (32 k); thus, the band-
width varies accordingly. A minimum capacitance of 2000 pF
for C
X
and C
Y
is required in all cases.
Table 4. Filter Capacitor Selection, C
X
and C
Y
Bandwidth (Hz)
Capacitor (F)
1 4.7
10 0.47
50 0.10
100 0.05
200 0.027
500 0.01
SELF TEST
The ST pin controls the self-test feature. When this pin is set to
V
S
, an electrostatic force is exerted on the beam of the accelero-
meter. The resulting movement of the beam allows the user to
test if the accelerometer is functional. The typical change in
output is 750 mg (corresponding to 23%). This pin may be left
open circuit, or may be connected to common in normal use.
The ST pin should never be exposed to voltages greater than
V
S
+ 0.3 V. If the system design is such that this condition
cannot be guaranteed (i.e., multiple supply voltages present), a
low V
F
clamping diode between ST and V
S
is recommended.
DESIGN TRADE-OFFS FOR SELECTING FILTER
CHARACTERISTICS: THE NOISE/BW TRADE-OFF
The accelerometer bandwidth selected ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent on
the analog filter bandwidth at X
FILT
and Y
FILT
.
The output of the ADXL213 has a typical bandwidth of 2.5 kHz.
The user must filter the signal at this point to limit aliasing
errors. The analog bandwidth must be no more than one-fifth
the PWM frequency to minimize aliasing. The analog
bandwidth may be further decreased to reduce noise and
improve resolution.
The ADXL213 noise has the characteristics of white Gaussian
noise, which contributes equally at all frequencies and is
described in terms of g/Hz (i.e., the noise is proportional to
the square root of the accelerometer's bandwidth). The user
should limit bandwidth to the lowest frequency needed by the
application in order to maximize the resolution and dynamic
range of the accelerometer.
With the single pole roll-off characteristic, the typical noise of
the ADXL213 is determined by
)
6
.
1
(
)
Hz
/
160
(
=
BW
g
rmsNoise
At 100 Hz the noise is
g
g
rmsNoise
m
2
)
6
.
1
100
(
)
Hz
/
160
(
=
=
Often, the peak value of the noise is desired. Peak-to-peak noise
can only be estimated by statistical methods. Table 5 is useful
for estimating the probabilities of exceeding various peak
values, given the rms value.
Table 5. Estimation of Peak-to-Peak Noise
Peak-to-Peak Value
% of Time that Noise Will Exceed
Nominal Peak-to-Peak Value
2 RMS
32
4 RMS
4.6
6 RMS
0.27
8 RMS
0.006
ADXL213
Rev. 0 | Page 10 of 12
Peak-to-peak noise values give the best estimate of the
uncertainty in a single measurement. Table 6 gives the typical
noise output of the ADXL213 for various C
X
and C
Y
values.
Table 6. Filter Capacitor Selection (C
X
, C
Y
)
Bandwidth(Hz)
C
X
, C
Y
(F)
RMS Noise
(mg)
Peak-to-Peak Noise
Estimate (mg)
10 0.47
0.64
3.8
50 0.1
1.4
8.6
100 0.047
2 12
500 0.01
4.5
27.2
USING THE ADXL213 WITH OPERATING
VOLTAGES OTHER THAN 5 V
The ADXL213 is tested and specified at V
S
= 5 V; however, it can
be powered with V
S
as low as 3 V or as high as 6 V. Some perfor-
mance parameters will change as the supply voltage is varied.
The ADXL213 output varies proportionally to supply voltage. At
V
S
= 3 V, the output sensitivity is typically 28%/g.
The zero g bias output is ratiometric, so the zero g output is
nominally equal to 50% at all supply voltages.
The output noise also varies with supply voltage. At V
S
= 3 V, the
noise density is typically 200 g/Hz.
Self-test response in g is roughly proportional to the square of
the supply voltage. So at V
S
= 3 V, the self-test response is
equivalent to approximately 270 mg (typical), or 8%.
The supply current decreases as the supply voltage decreases.
Typical current consumption at V
DD
= 3 V is 450 A.
USING THE ADXL213 AS A DUAL-AXIS TILT
SENSOR
One of the most popular applications of the ADXL213 is tilt
measurement. An accelerometer uses the force of gravity as an
input vector to determine the orientation of an object in space.
An accelerometer is most sensitive to tilt when its sensitive axis
is perpendicular to the force of gravity, i.e., parallel to the earth's
surface. At this orientation, its sensitivity to changes in tilt is
highest. When the accelerometer is oriented on axis to gravity,
i.e., near its +1 g or 1 g reading, the change in output accelera-
tion per degree of tilt is negligible. When the accelerometer is
perpendicular to gravity, its output changes nearly 17.5 mg per
degree of tilt. At 45, its output changes at only 12.2 mg per
degree and resolution declines.
Dual-Axis Tilt Sensor: Converting Acceleration to Tilt
When the accelerometer is oriented so both its X and Y axes are
parallel to the earth's surface, it can be used as a 2-axis tilt
sensor with a roll axis and a pitch axis. Once the output signal
from the accelerometer has been converted to an acceleration
that varies between 1 g and +1 g, the output tilt in degrees is
calculated as follows:
PITCH = ASIN(A
X
/1 g)
ROLL = ASIN(A
Y
/1 g)
Be sure to account for overranges. It is possible for the
accelerometers to output a signal greater than 1 g due to
vibration, shock, or other accelerations.
ADXL213
Rev. 0 | Page 11 of 12
PIN CONFIGURATIONS AND FUNCTIONAL DESCRIPTIONS
ADXL213E
TOP VIEW
(Not to Scale)
ST
1
T2
2
COM
3
Y
OUT
4
X
FILT
Y
FILT
X
OUT
7
6
5
V
S
8
04742-0-016
Figure 22. ADXL213 8-Lead CLCC
Table 7. ADXL213 8-Lead CLCC Pin Function Descriptions
Pin No.
Mnemonic
Description
1 ST
Self
Test
2 T2
R
SET
Resistor to Common
3 COM Common
4 Y
OUT
Y Channel Output
5 X
OUT
X Channel Output
6 Y
FILT
Y Channel Filter Pin
7 X
FILT
X Channel Filter Pin
8 V
S
3 V to 6 V
ADXL213
Rev. 0 | Page 12 of 12
OUTLINE DIMENSIONS
BOTTOM VIEW
1
3
5
7
0.64
1.90
2.50
2.50
0.38 DIAMETER
0.50 DIAMETER
1.27
1.27
1.27
4.50
SQ
5.00
SQ
TOP VIEW
R 0.38
0.15
1.78
R 0.20
Figure 23. 8-Terminal Ceramic Leadless Chip Carrier [LCC]
(E-8)
Dimensions shown in millimeters
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
ORDERING GUIDE
ADXL213 Products
Number
of Axes
Specified
Voltage (V)
Temperature
Range
Package Description
Package
Option
ADXL213AE
1
1
5
40C to +85C
8-Lead Ceramic Leadless Chip Carrier
E-8
ADXL213AEREEL
1
1
5
40C to +85C
8-Lead Ceramic Leadless Chip Carrier
E-8
ADXL213EB
Evaluation
Board
1
Lead Finish--Gold over Nickel over Tungsten.
2004 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D0474204/04(0)
Document Outline
- FEATURES
- APPLICATIONS
- GENERAL DESCRIPTION
- FUNCTIONAL BLOCK DIAGRAM
-
-
-
-
-
-
-
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