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Электронный компонент: 2N4351

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N-Channel Enhancement Mode
MOSFET General Purpose
Amplifier/Switch
2N4351
FEATURES

Low ON Resistance

Low Capacitance

High Gain

High Gate Breakdown Voltage

Low Threshold Voltage
ABSOLUTE MAXIMUM RATINGS
(T
A
= 25
o
C unless otherwise noted)
Drain-Source Voltage or Drain-Body Voltage . . . . . . . . . . 25V
Peak Gate-Source Voltage (Note 1) . . . . . . . . . . . . . . .
125V
Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100mA
Storage Temperature Range . . . . . . . . . . . . . -65
o
C to +200
o
C
Operating Temperature Range . . . . . . . . . . . -55
o
C to +150
o
C
Lead Temperature (Soldering, 10sec) . . . . . . . . . . . . . +300
o
C
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 375mW
Derate above 25
o
C . . . . . . . . . . . . . . . . . . . . . . . . . . 3mW/
o
C
NOTE: Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device. These are
stress ratings only and functional operation of the device at these or
any other conditions above those indicated in the operational sections
of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
ORDERING INFORMATION
Part
Package
Temperature Range
2N4351
Hermetic TO-72
-55
o
C to +150
o
C
X2N4351
Sorted Chips in Carriers
-55
o
C to +150
o
C
CORPORATION
PIN CONFIGURATION
TO-72
G
D
C
S
ELECTRICAL CHARACTERISTICS (T
A
= 25
o
C unless otherwise specified)
SYMBOL
PARAMETER
MIN
MAX
UNITS
TEST CONDITIONS
BV
DSS
Drain-Source Breakdown Voltage
25
V
I
D
= 10
A, V
GS
= 0
I
GSS
Gate Leakage Current
10
pA
V
GS
=
30V, V
DS
= 0
I
DSS
Zero-Gate-Voltage Drain Current
10
nA
V
DS
= 10V, V
GS
= 0
V
GS(th)
Gate-Source Threshold Voltage
1
5
V
V
DS
= 10V, I
D
= 10
A
I
D(on)
"ON" Drain Current
3
mA
V
GS
= 10V, V
DS
= 10V
V
DS(on)
Drain-Source "ON" Voltage
1
V
I
D
= 2mA, V
GS
= 10V
r
DS(on)
Drain-Source Resistance
300
ohms
V
GS
= 10V, I
D
= 0, f = 1kHz
| y
fs
|
Forward Transfer Admittance
1000
S
V
DS
= 10V, I
D
= 2mA, f = 1kHz
C
rss
Reverse Transfer Capacitance (Note 2)
1.3
pF
V
DS
= 0, V
GS
= 0, f = 1MHz
C
iss
Input Capacitance (Note 2)
5.0
V
DS
= 10V, V
GS
= 0, f = 1MHz
C
d(sub)
Drain-Substrate Capacitance (Note 2)
5.0
V
D(SUB)
= 10V, f = 1MHz
t
d(on)
Turn-On Delay (Note 2)
45
ns
t
r
Rise Time (Note 2)
65
t
d(off)
Turn-Off Delay (Note 2)
60
t
f
Fall Time (Note 2)
100
NOTES: 1. Device must not be tested at
125V more than once or longer than 300ms.
2. For design reference only, not 100% tested.
1003