1
1998 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
PROG
PROGRAM
CONTROL
DI
CS
DATA
REGISTER
& EEPROM
13
CLK
SERIAL
CONTROL
DAC 2
DAC 3
DAC 4
11
10
6
V 1
OUT
V 2
OUT
V 3
OUT
V 4
OUT
DO
SERIAL
DATA
OUTPUT
REGISTER
8
9
GND
V L
REF
V H
REF
V
PP
V
DD
3
1
14
7
5
2
4
DAC 1
12
FEATURES
s
Output settings retained without power
s
Output range includes both supply rails
s
4 independently addressable outputs
s
1 LSB Accuracy
s
Serial
P interface
s
Single supply operation: 2.7V-5.5V
s
Setting read-back without effecting outputs
APPLICATIONS
s
Automated product calibration.
s
Remote control adjustment of equipment
s
Offset, gain and zero adjustments in Self-
Calibrating and Adaptive Control systems.
s
Tamper-proof calibrations.
DESCRIPTION
The CAT504 is a quad 8-Bit Memory DAC designed as
an electronic replacement for mechanical potentiom-
eters and trim pots. Intended for final calibration of
products such as camcorders, fax machines and cellular
telephones on automated high volume production lines,
it is also well suited for systems capable of self calibra-
tion, and applications where equipment which is either
difficult to access or in a hazardous environment, re-
quires periodic adjustment.
The 4 independently programmable DAC's have an
output range which includes both supply rails. Output
settings, stored in non-volatile EEPROM memory, are
not lost when the device is powered down and are
automatically reinstated when power is returned. Each
output can be dithered to test new output values without
effecting the stored settings and stored settings can be
read back without disturbing the DAC's output.
Control of the CAT504 is accomplished with a simple 3
wire serial interface. A Chip Select pin allows several
CAT504s to share a common serial interface and com-
munication back to the host controller is via a single
serial data line thanks to the CAT504's Tri-Stated Data
Output pin.
The CAT504 operates from a single 35 volt power
supply drawing just a few milliwatts of power. When
storing data in EEPROM memory an additional 20 volt
low current supply is required.
The CAT504 is available in the 0 to 70
C Commercial
and 40
C to + 85
C Industrial operating temperature
ranges and offered in 14-pin plastic DIP and Surface
mount packages.
FUNCTIONAL DIAGRAM
PIN CONFIGURATION
CAT504
8-Bit Quad DACpot
DIP Package (P)
SOIC Package (J)
CAT504
VPP
CLK
CS
PROG
DI
DO
VDD
2
3
4
13
12
11
5
6
7
10
9
8
1
14
GND
VREFH
VOUT1
VOUT2
VOUT3
VOUT4
VREFL
VPP
CLK
CS
PROG
DI
DO
VDD
2
3
4
13
12
11
5
6
7
10
9
8
1
14
GND
VREFH
VOUT1
VOUT2
VOUT3
VOUT4
VREFL
CAT
504
CAT
504
Doc. No. 25048-0A 2/98 M-1
CAT504
2
Doc. No. 25048-0A 2/98 M-1
ABSOLUTE MAXIMUM RATINGS*
Supply Voltage
V
DD
to GND ...................................... 0.5V to +7V
V
PP
to GND ..................................... 0.5V to +22V
Inputs
CLK to GND ............................ 0.5V to V
DD
+0.5V
CS to GND .............................. 0.5V to V
DD
+0.5V
DI to GND ............................... 0.5V to V
DD
+0.5V
PROG to GND ........................ 0.5V to V
DD
+0.5V
V
REF
H to GND ........................ 0.5V to V
DD
+0.5V
V
REF
L to GND ......................... 0.5V to V
DD
+0.5V
Outputs
D
0
to GND ............................... 0.5V to V
DD
+0.5V
V
OUT
1 4 to GND ................... 0.5V to V
DD
+0.5V
Operating Ambient Temperature
Commercial (`C' suffix) .................... 0
C to +70
C
Industrial (`I' suffix) ...................... 40
C to +85
C
Junction Temperature ..................................... +150
C
Storage Temperature ....................... 65
C to +150
C
Lead Soldering (10 sec max) .......................... +300
C
* Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Absolute
Maximum Ratings are limited values applied individually while
other parameters are within specified operating conditions,
and functional operation at any of these conditions is NOT
implied. Device performance and reliability may be impaired by
exposure to absolute rating conditions for extended periods of
time.
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Min
Max
Units
Test Method
V
ZAP
(1)
ESD Susceptibility
2000
Volts
MIL-STD-883, Test Method 3015
I
LTH
(1)(2)
Latch-Up
100
mA
JEDEC Standard 17
NOTES: 1. This parameter is tested initially and after a design or process change that affects the parameter.
2. Latch-up protection is provided for stresses up to 100mA on address and data pins from 1V to V
CC
+ 1V.
Logic Inputs
I
IH
Input Leakage Current
V
IN
= V
DD
--
--
10
A
I
IL
Input Leakage Current
V
IN
= 0V
--
--
10
A
V
IH
High Level Input Voltage
2
--
V
DD
V
V
IL
Low Level Input Voltage
0
--
0.8
V
References
V
RH
V
REF
H Input Voltage Range
2.7
--
V
DD
V
V
RL
V
REF
L Input Voltage Range
GND
--
V
DD
-2.7
V
Z
IN
V
REF
HV
REF
L Resistance
--
7k
--
Logic Outputs
V
OH
High Level Output Voltage
I
OH
= 40
A
V
DD
0.3
--
--
V
V
OL
Low Level Output Voltage
I
OL
= 1 mA, V
DD
= +5V
--
--
0.4
V
I
OL
= 0.4 mA, V
DD
= +3V
--
--
0.4
V
Symbol
Parameter
Conditions
Min
Typ
Max
Units
Resolution
8
--
--
Bits
Accuracy
INL
Integral Linearity Error
I
LOAD
= 250 nA, T
R
= C
--
--
1
LSB
T
R
= I
--
--
1
LSB
I
LOAD
= 1
A, T
R
= C
--
--
2
LSB
T
R
= I
--
--
2
LSB
DNL
Differential Linearity Error
I
LOAD
= 250 nA, T
R
= C
--
--
0.5
LSB
T
R
= I
--
--
0.5
LSB
I
LOAD
= 1
A, T
R
= C
--
--
1.5
LSB
T
R
= I
--
--
1.5
LSB
DC ELECTRICAL CHARACTERISTICS:
V
DD
= 2.7V to 5.5V, V
REF
H = V
DD
, V
REF
L = 0V, unless otherwise specified
CAT504
3
Doc. No. 25048-0A 2/98 M-1
DC ELECTRICAL CHARACTERISTICS (Cont.):
V
DD
= 2.7V to 5.5V, V
REF
H = +V
DD
, V
REF
L = 0V, unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Units
Symbol
Parameter
Conditions
Min
Typ
Max
Units
Digital
t
CSMIN
Minimum CS Low Time
150
--
--
ns
t
CSS
CS Setup Time
100
--
--
ns
t
CSH
CS Hold Time
0
--
--
ns
t
DIS
DI Setup Time
50
--
--
ns
t
DIH
DI Hold Time
50
--
--
ns
t
DO1
Output Delay to 1
--
--
150
ns
t
DO0
Output Delay to 0
--
--
150
ns
t
HZ
Output Delay to High-Z
--
400
--
ns
t
LZ
Output Delay to Low-Z
--
400
--
ns
t
PROG
Erase/Write Pulse Width
3
5
--
ms
t
PS
PROG Setup Time
150
--
--
ns
t
CLK
H
Minimum CLK High Time
500
--
--
ns
t
CLK
L
Minimum CLK Low Time
300
--
--
ns
f
C
Clock Frequency
DC
--
1
MHz
Analog
t
DS
DAC Settling Time to 1/2 LSB
C
LOAD
= 10 pF, V
DD
= +5V
--
3
10
s
C
LOAD
= 10 pF, V
DD
= +3V
--
6
10
s
Pin Capacitance
C
IN
Input Capacitance
V
IN
= 0V, f = 1 MHz
(2)
--
8
--
pF
C
OUT
Output Capacitance
V
OUT
= 0V, f = 1 MHz
(2)
--
6
--
pF
NOTES: 1. All timing measurements are defined at the point of signal crossing V
DD
/ 2.
2. These parameters are periodically sampled and are not 100% tested.
C
L
= 100 pF
see note 1
AC ELECTRICAL CHARACTERISTICS:
V
DD
= 2.7V to 5.5V, V
REF
H = +V
DD
, V
REF
L = 0V, unless otherwise specified
Analog Output
FSO
Full-Scale Output Voltage
V
R
= V
REF
HV
REF
L
0.99 V
R
0.995 V
R
--
V
ZSO
Zero-Scale Output Voltage
V
R
= V
REF
HV
REF
L
--
0.005 V
R
0.10 V
R
V
I
L
DAC Output Load Current
--
--
1
A
R
OUT
DAC Output Impedance
V
DD
= +5V
--
--
20k
V
DD
= +3V
--
--
40k
PSSR
Power Supply Rejection
I
LOAD
= 250 nA
--
--
1
LSB / V
Temperature
TC
O
V
OUT
Temperature Coefficient
V
REF
H = +5V, V
REF
L = 0V
--
--
200
V/
C
V
DD
= +5V, I
LOAD
= 250nA
TC
REF
Temperature Coefficient of
V
REF
H to V
REF
L
--
700
--
ppm /
C
V
REF
Resistance
Power Supply
I
DD
Supply Current
Excludes V
REF
--
--
50
A
I
PP
Programming Current
V
PP
= +19V
--
200
500
A
V
DD
Operating Voltage Range
2.7
--
5.5
V
V
PP
Programing Voltage Range
18
19
20
V
CAT504
4
Doc. No. 25048-0A 2/98 M-1
t
o
1 2 3 4 5
t
o
1 2 3 4 5
CLK
CS
DI
DO
PROG
t H CLK
Rising CLK edge to falling CLK edge
t L CLK
Falling CLK edge to CLK rising edge
t CSH
Falling CLK edge for last data bit (DI)
to falling CS edge
t CSS
Rising CS edge to next rising CLK edge
t CSMIN
Falling CS edge to rising CS edge
t DIS
Data valid to first rising CLK
edge after CS = high
t DIH
Rising CLK edge to end of data valid
t DO0
Rising CLK edge to D0 = low
t LZ
Rising CS edge to D0 becoming high
low impedance (active output)
t DO1
Rising CLK edge to D0 = high
t HZ
Falling CS edge to D0 becoming high
impedance (Tri-State)
t PS
Rising PROG edge to next rising
CLK edge
t PROG
Rising PROG edge to falling PROG
edge
t H CLK
t L CLK
t CSH
t CSS
t CSMIN
t DIS
t DIH
t DO0
t LZ
t DO1
t PS
t HZ
t PROG
TIMING
FROM TO
MIN/MAX
Min
Min
Min
Min
Min
Min
Min
Max
(Max)
Max
(Max)
Min
Min
PARAM
NAME
A. C. TIMING DIAGRAM
CAT504
5
Doc. No. 25048-0A 2/98 M-1
PIN DESCRIPTION
Pin
Name
Function
1
V
DD
Power supply positive.
2
CLK
Clock input pin
3
V
PP
EEPROM Programming Voltage
4
CS
Chip Select
5
DI
Serial data input pin.
6
DO
Serial data output pin.
7
PROG
EEPROM Programming Enable
Input
8
GND
Power supply ground.
9
V
REF
L
Minimum DAC output voltage.
10
V
OUT
4
DAC output channel 4.
11
V
OUT
3
DAC output channel 3.
12
V
OUT
2
DAC output channel 2.
13
V
OUT
1
DAC output channel 1.
14
V
REF
H
Maximum DAC output voltage.
DEVICE OPERATION
The CAT504 is a quad 8-bit Digital to Analog Converter
(DAC) whose outputs can be programmed to any one of
256 individual voltage steps. Once programmed, these
output settings are retained in non-volatile EEPROM
memory and will not be lost when power is removed from
the chip. Upon power up the DACs return to the settings
stored in EEPROM memory. Each DAC can be written
to and read from independently without effecting the
output voltage during the read or write cycle. Each
output can also be temporarily adjusted without chang-
ing the stored output setting, which is useful for testing
new output settings before storing them in memory.
DIGITAL INTERFACE
The CAT504 employs a standard 3 wire serial control
interface consisting of Clock (CLK), Chip Select (CS)
and Data In (DI) inputs. For all operations, address and
data are shifted in LSB first. In addition, all digital data
must be preceded by a logic "1" as a start bit. The DAC
address and data are clocked into the DI pin on the
clock's rising edge. When sending multiple blocks of
information a minimum of two clock cycles is required
between the last block sent and the next start bit.
Multiple devices may share a common input data line by
selectively activating the CS control of the desired IC.
Data Outputs (DO) can also share a common line
because the DO pin is Tri-Stated and returns to a high
impedance when not in use.
CHIP SELECT
Chip Select (CS) enables and disables the CAT504's
read and write operations. When CS is high data may be
read to or from the chip, and the Data Output (DO) pin is
active. Data loaded into the DAC control registers will
remain in effect until CS goes low. Bringing CS to a logic
low returns all DAC outputs to the settings stored in
EEPROM memory and switches DO to its high imped-
ance Tri-State mode.
Because CS functions like a reset the CS pin has been
equipped with a 30 ns to 90 ns filter circuit to prevent
noise spikes from causing unwanted resets and the loss
of volatile data.
CLOCK
The CAT504's clock controls both data flow in and out of
the IC and EEPROM memory cell programming. Serial
data is shifted into the DI pin and out of the DO pin on the
clock's rising edge. While it is not necessary for the clock
to be running between data transfers, the clock must be
operating in order to write to EEPROM memory, even
though the data being saved may already be resident in
the DAC control register.
No clock is necessary upon system power-up. The
CAT504's internal power-on reset circuitry loads data
from EEPROM to the DACs without using the external
clock.
As data transfers are edge triggered clean clock transi-
tions are necessary to avoid falsely clocking data into the
control registers. Standard CMOS and TTL logic fami-
lies work well in this regard and it is recommended that
any mechanical switches used for breadboarding or
device evaluation purposes be debounced by a flip-flop
or other suitable debouncing circuit.
DAC addressing is as follows:
DAC OUTPUT
A0
A1
V
OUT
1
0
0
V
OUT
2
1
0
V
OUT
3
0
1
V
OUT
4
1
1
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