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Электронный компонент: PAL20V8

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Flash Erasable,
Reprogrammable CMOS PAL
Device
fax id: 6010
PALCE20V8
Cypress Semiconductor Corporation
3901 North First Street
San Jose
CA 95134
408-943-2600
June 1994 Revised March 26, 1997
1P AL CE 20 V8
Features
Active pull-up on data input pins
Low power version (20V8L)
-- 55 mA max. commercial (15, 25 ns)
-- 65 mA max. military/industrial
(15, 25 ns)
Standard version has low power
-- 90 mA max. commercial
(15, 25 ns)
-- 115 mA max. commercial (10 ns)
-- 130 mA max. military/industrial (15, 25 ns)
CMOS Flash technology for electrical erasability and
reprogrammability
User-programmable macrocell
-- Output polarity control
-- Individually selectable for registered or combinato-
rial operation
QSOP package available
-- 10, 15, and 25 ns com'l version
-- 15, and 25 ns military/industrial versions
High reliability
-- Proven Flash technology
-- 100% programming and functional testing
Functional Description
The Cypress PALCE20V8 is a CMOS Flash Erasable sec-
ond-generation programmable array logic device. It is imple-
mented with the familiar sum-of-product (AND-OR) logic struc-
ture and the programmable macrocell.
The PALCE20V8 is executed in a 24-pin 300-mil molded DIP,
a 300-mil cerdip, a 28-lead square ceramic leadless chip car-
rier, a 28-lead square plastic leaded chip carrier, and a 24-lead
quarter size outline. The device provides up to 20 inputs and
8 outputs. The PALCE20V8 can be electrically erased and re-
programmed. The programmable macrocell enables the de-
vice to function as a superset to the familiar 24-pin PLDs such
as 20L8, 20R8, 20R6, 20R4.
PAL is a registered trademark of Advanced Micro Devices, Inc.
Logic Block Diagram (PDIP/CDIP/QSOP)
20V81
8
8
8
8
8
8
8
8
10
9
8
7
6
5
4
3
2
1
13
15
16
17
18
19
20
21
22
23
PROGRAMMABLE
AND ARRAY
(64 x 40)
Macrocell
Macrocell
Macrocell
Macrocell
Macrocell
Macrocell
Macrocell
Macrocell
I
9
I
8
I
7
I
6
I
5
I
4
I
3
I
2
I
1
CLK/I
0
OE/I
11
I/O
0
I/O
1
I/O
2
I/O
3
I/O
4
I/O
5
I/O
6
I/O
7
I
13
12
GND
11
I
10
MUX
24
V
CC
MUX
14
I
12
PALCE20V8
2
Shaded area contains preliminary information.
Functional Description
(continued)
The PALCE20V8 features 8 product terms per output and 40
input terms into the AND array. The first product term in a mac-
rocell can be used either as an internal output enable control
or as a data product term.
There are a total of 18 architecture bits in the PALCE20V8
macrocell; two are global bits that apply to all macrocells and
16 that apply locally, two bits per macrocell. The architecture
bits determine whether the macrocell functions as a register or
combinatorial with inverting or noninverting output. The output
enable control can come from an external pin or internally from
a product term. The output can also be permanently enabled,
functioning as a dedicated output or permanently disabled,
functioning as a dedicated input. Feedback paths are select-
able from either the input/output pin associated with the mac-
rocell, the input/output pin associated with an adjacent pin, or
from the macrocell register itself.
Power-Up Reset
All registers in the PALCE20V8 power-up to a logic LOW for
predictable system initialization. For each register, the associ-
ated output pin will be HIGH due to active-LOW outputs.
Electronic Signature
An electronic signature word is provided in the PALCE20V8
that consists of 64 bits of programmable memory that can con-
tain user-defined data.
Security Bit
A security bit is provided that defeats the readback of the in-
ternal programmed pattern when the bit is programmed.
Low Power
The Cypress PALCE20V8 provides low-power operation
through the use of CMOS technology, and increased testability
with Flash reprogrammability.
Product Term Disable
Product Term Disable (PTD) fuses are included for each prod-
uct term. The PTD fuses allow each product term to be individ-
ually disabled.
Input and I/O Pin Pull-Ups
The PALCE20V8 input and I/O pins have built-in active
pull-ups that will float unused inputs and I/Os to an active
HIGH state (logical 1). All unused inputs and three-stated I/O
pins should be connected to another active input, V
CC
, or
Ground to improve noise immunity and reduce I
CC
.
Pin Configuration
PLCC/LCC
Top View
20V82
DIP/QSOP
Top View
25
24
23
22
21
20
19
5
6
7
8
9
10
11
121314 1516 1718
4 3 2
2827 26
1
1
2
3
4
5
6
7
8
9
10
11
14
15
16
20
19
18
17
21
24
23
22
12
13
OE/I
11
I/O
7
I/O
0
I/O
2
I/O
1
I/O
6
I/O
5
I
12
I/O
3
V
CC
I/O
4
GND
I
1
CLK/I
0
I
13
20V83
I
2
I
3
I
4
I
5
I
6
I
7
I
8
I
9
I
10
I
3
I
4
I
5
I
6
I
7
I
8
NC
I/O
2
I/O
1
I/O
6
I/O
5
I/O
3
I/O
4
NC
Selection Guide
Generic Part Number
t
PD
ns
t
S
ns
t
CO
ns
I
CC
mA
Com'l/Ind
Mil
Com'l/Ind
Mil
Com'l/Ind
Mil
Com'l
Mil/Ind
PALCE20V8
-
5
5
3
4
115
PALCE20V8
-
7
7.5
7
5
115
PALCE20V8
-
10
10
10
10
10
7
10
115
130
PALCE20V8
-
15
15
15
12
12
10
12
90
130
PALCE20V8
-
25
25
25
15
20
12
20
90
130
PALCE20V8L
-
15
15
15
12
12
10
12
55
65
PALCE20V8L
-
25
25
25
15
20
12
20
55
65
PALCE20V8
3
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature
..................................... -
65
C to +150
C
Ambient Temperature with
Power Applied
.................................................. -
55
C to +125
C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12)
.................................................-
0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State
.....................................................-
0.5V to +7.0V
DC Input Voltage
.................................................-
0.5V to +7.0V
Output Current into Outputs (LOW)............................. 24 mA
DC Programming Voltage............................................. 12.5V
Latch-Up Current ..................................................... >200 mA
Configuration Table
CG
0
CG
1
CL0
x
Cell Configuration
Devices Emulated
0
1
0
Registered Output
Registered Med PALs
0
1
1
Combinatorial I/O
Registered Med PALs
1
0
0
Combinatorial Output
Small PALs
1
0
1
Input
Small PALs
1
1
1
Combinatorial I/O
20L8 only
Macrocell
Q
Q
D
CLK
20V84
1
1
0
0
1
X
CL1
x
0
1
X
0
1 1
I/O
x
From
Adjacent
Pin
CL0
x
CG
1
for pin 16 to 21 (DIP)
CG
0
for pin 15 and 22 (DIP)
1
0
0
1
1 1
0 0
0
1
X
0
1 1
OE
V
CC
To
Adjacent
Macrocell
CL0
x
CG
1
V
CC
Operating Range
Range
Ambient
Temperature
V
CC
Commercial
0
C to +75
C
5V
5%
Industrial
-
40
C to +85
C
5V
10%
Military
[1]
-
55
C to +125
C
5V
10%
Note:
1.
T
A
is the "instant on" case temperature.
PALCE20V8
4
Electrical Characteristics
Over the Operating Range
[2]
Parameter
Description
Test Conditions
Min.
Max.
Unit
V
OH
Output HIGH Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
I
OH
=
-
3.2 mA
Com'l
2.4
V
I
OH
=
-
2 mA
Mil/Ind
V
OL
Output LOW Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
I
OL
= 24 mA
Com'l
0.5
V
I
OL
= 12 mA
Mil/Ind
V
IH
Input HIGH Level
Guaranteed Input Logical HIGH Voltage for All Inputs
[3]
2.0
V
V
IL
[4]
Input LOW Level
Guaranteed Input Logical LOW Voltage for All Inputs
[3]
-
0.5
0.8
V
I
IH
Input or I/O HIGH Leakage
Current
3.5V < V
IN
< V
CC
10
A
I
IL
[5]
Input or I/O LOW Leakage
Current
0V < V
IN
< V
IN
(Max.)
-
100
A
I
SC
Output Short Circuit Current V
CC
= Max., V
OUT
= 0.5V
[6,7]
-
30
-
150
mA
I
CC
Operating Power Supply
Current
V
CC
= Max.,
V
IL
= 0V, V
IH
= 3V,
Output Open,
f = 15 MHz
(counter)
5, 7, 10 ns
Com'l
115
mA
15, 25 ns
90
mA
15L, 25L ns
55
mA
10, 15, 25 ns
Mil/Ind
130
mA
15L, 25L ns
Mil/Ind
65
mA
Capacitance
[7]
Parameter
Description
Test Conditions
Typ.
Unit
C
IN
Input Capacitance
V
IN
= 2.0V @ f = 1 MHz
5
pF
C
OUT
Output Capacitance
V
OUT
= 2.0V @ f = 1 MHz
5
pF
Endurance Characteristics
[7]
Parameter
Description
Test Conditions
Min.
Max.
Unit
N
Minimum Reprogramming Cycles
Normal Programming Conditions
100
Cycles
Notes:
2.
See the last page of this specification for Group A subgroup testing information.
3.
These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4.
V
IL
(Min.) is equal to
-
3.0V for pulse durations less than 20 ns.
5.
The leakage current is due to the internal pull-up resistor on all pins.
6.
Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
OUT
= 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
7.
Tested initially and after any design or process changes that may affect these parameters.
PALCE20V8
5
AC Test Loads and Waveforms
90%
10%
3.0V
GND
90%
10%
ALL INPUT PULSES
2 ns
2 ns
20V85
OUTPUT
R2
R1
C
L
S1
5V
TEST POINT
20V86
Specification
S
1
C
L
Commercial
Military
Measured Output Value
R
1
R
2
R
1
R
2
t
PD
, t
CO
Closed
50 pF
200
390
390
750
1.5V
t
PZX
, t
EA
Z
H: Open
Z
L: Closed
1.5V
t
PXZ
, t
ER
H
Z: Open
L
Z: Closed
5 pF
H
Z: V
OH
-
0.5V
L
Z: V
OL
+ 0.5V