EL1056ACEL1056C
March
1993
Rev
A
EL1056AC EL1056C
Monolithic High-Speed Pin Driver
Note All information contained in this data sheet has been carefully checked and is believed to be accurate as of the date of publication however this data sheet cannot be a ``controlled document'' Current revisions if any to these
specifications are maintained at the factory and are available upon your request We recommend checking the revision level before finalization of your design documentation
1993 Elantec Inc
Features
Wide
g
12V output levels
250 ps dispersion
3 ns delay times
1V ns slew rate
adjustable
Low overshoot and aberrations in
50
X systems
3-state output
Power-down mode reduces
output leakage to nanoamperes
Overcurrent sense flag available
to protect internal output devices
Buffered analog inputs
Differential logic inputs are
compatible with ECL TTL and
CMOS
Applications
Memory testers
ASIC testers
Functional board testers
Analog digital incoming
component verifiers
Logic emulators
Ordering Information
Part No
Temp Range
Package
Outline
EL1056CM
0 C to
a
75 C
24-Lead
MDP0027
Thermal SOL
EL1056ACM 0 C to
a
75 C
24-Lead
MDP0027
Thermal SOL
General Description
The EL1056 is designed to drive high-quality test signals into
close or terminated loads It has a dispersion of 250 ps or less
whether due to signal size or direction of edge It can output a
very wide 24V output span encompassing all logic families as
well as analog levels The EL1056 is fabricated in Elantec's ox-
ide isolated process which eliminates the possibility of latch-up
and provides a very durable circuit
The output can be turned off in two ways the OE pins allow
the output to be put in a high-impedance state which makes the
output look like a large resistance in parallel with 3 pF even for
back-driven signals with as much as 2 5V
ms slew rate The E
pins put the output in an even higher impedance state guaran-
teed to 150 nA leakage in the EL1056A This allows accurate
measurements on the bus without disconnecting the EL1056
with a relay
The EL1056 incorporates an output current sense which can
warn the system controller that excessive output current is
flowing The trip point is set by two external resistors
Connection Diagram
24-Lead Thermal SOL Package
1056 1
and Heat-spreader
Top View
EL1056AC EL1056C
Monolithic High-Speed Pin Driver
Absolute Maximum Ratings
(T
A
e
25 C)
V
S
Voltage between V
a
and V
b
a
33V
V
b
Supply Voltage
b
18V
B
a
Supply Voltage
V
INH
to V
a
B
b
Supply Voltage
V
b
to V
INL
I
SR
Input Current
0 mA to 3 mA
V
SR
Input Voltage
Power-Down Mode
b
0 3V to
a
6V
Shunt
a
Input Voltage
(B
a
)
b
5V to B
a
Shunt
b
Input Voltage
B
b
to (B
b
)
a
5V
Data Data Input Voltages
V
b
to V
a
or
g
6V Differential
OE OE
Input Voltages
V
b
to V
a
or
g
6V Differential
E E
Input Voltages
V
b
to V
a
or
g
6V Differential
Sense Output Voltage
V
b
to V
a
V
INH
Input Voltage
V
INL
b
0 3V to B
a
V
INL
Input Voltage
B
b
to V
INH
a
0 3V
I
OUT
Output Current
b
60 mA to
a
60 mA
T
J
Junction Temperature
150 C
T
A
Operating Ambient Temperature
Range
b
0 C to
a
75 C
T
ST
Storage Temperature
b
65 C to
a
150 C
P
D
Power Dissipation (T
A
e
25 C)
(See Curves)
3 1W
Important Note
All parameters having Min Max specifications are guaranteed The Test Level column indicates the specific device testing actually
performed during production and Quality inspection Elantec performs most electrical tests using modern high-speed automatic test
equipment specifically the LTX77 Series system Unless otherwise noted all tests are pulsed tests therefore T
J
e
T
C
e
T
A
Test Level
Test Procedure
I
100% production tested and QA sample tested per QA test plan QCX0002
II
100% production tested at T
A
e
25 C and QA sample tested at T
A
e
25 C
T
MAX
and T
MIN
per QA test plan QCX0002
III
QA sample tested per QA test plan QCX0002
IV
Parameter is guaranteed (but not tested) by Design and Characterization Data
V
Parameter is typical value at T
A
e
25 C for information purposes only
DC Electrical Characteristics
T
A
e
25 C V
a e
B
a e
15V V
b e
B
b e b
10V R
SHUNTa
e
R
SHUNTb
e
6 5
X no load Data E and OE from
b
1 6V to
b
0 8V I
SR
e
800
mA V
INH
e
5V V
INL
e b
1 6V
Parameter
Description
Min
Typ
Max
Test
Units
Level
I
S
(V
a
)
a
(B
a
) (V
b
)
a
(B
b
) Supply Currents
52
60
I
mA
I
S
dis
(V
a
)
a
(B
a
) (V
b
)
a
(B
b
) Supply Currents Disabled
17
25
I
mA
I
VINH
b
20
b
3
20
I
mA
I
VINL
b
20
2
20
I
mA
I
DATA
b
30
b
15
30
I
mA
I
OE
OE Input Current
b
30
b
14
30
I
mA
I
E
E Input Current
b
20
7
20
I
mA
V
SR
Voltage at I
SR
Pin
0
20
40
I
mV
I
SHUNTa
I
SHUNTb
4
7
I
mA
V
SHUNTa
V
SHUNTb
Sense Threshold at Shunts
160
200
250
I
mV
I
SENSE
Sense Output Currents
1
1 5
2
I
mA
V
OS
Output Offset Data High V
INH
e
0V V
INL
e b
1 6V
b
50
50
I
mV
Data Low V
INL
e
0V V
INH
e
5V
b
100
100
I
mV
2
TD
is
27in
EL1056AC EL1056C
Monolithic High-Speed Pin Driver
DC Electrical Characteristics
Contd
T
A
e
25 C V
a e
B
a e
15V V
b e
B
b e b
10V R
SHUNTa
e
R
SHUNTb
e
6 5
X no load Data E and OE from
b
1 6V to
b
0 8V I
SR
e
800
mA V
INH
e
5V V
INL
e b
1 6V
Parameter
Description
Min
Typ
Max
Test
Units
Level
Eg
Gain Error Data High V
INH
from 0V to 5V V
INL
e b
1 6V No Load
b
1 5
b
0 6
0
I
%
Data Low V
INH
e
5V V
INL
from
b
5V to 0V No Load
b
1 5
b
0 6
0
I
%
NL
Gain Nonlinearity Data High V
INH
from 0V to 10V V
INL
e b
1 6V No Load
0 04
V
%
Data Low V
INH
e
5V V
INL
from
b
10V to 0V No Load
0 06
V
%
PSRR
Power Supply Rejection Ratio of V
OUT
with Respect
2 2
V
mV V
to B
a
B
b
Shunt
a
or Shunt
b
Potential
R
o
en
Output Resistance Enabled Il
e
g
20 mA
4 5
6
7 5
I
X
R
o
dis
Output Resistance Output Disabled V
O
e b
1 6V to
b
5V EL1056C
20K
100K
I
X
EL1056AC
100K
200K
I
o
dis
Output Current Output Disabled V
O
e
0V
b
20
5
20
I
mA
I
o
off
Output Leakage E Low (Shut-Down) V
O
e
0V EL1056C
b
20
20
I
mA
EL1056AC
b
150
150
I
nA
AC Electrical Characteristics
T
A
e
25 C V
a e
B
a e a
15V V
b e
B
b e b
10V R
SHUNTa
e
R
SHUNTb
e
6 5
X R
L
e
500
X 50X
a
22 pF snubber
included at output Data E and OE from
b
1 6V to
b
0 8V I
SR
e
800
mA ECL swing is defined by V
INH
e b
0 8V and V
INL
e
b
1 6V CMOS swing defined by V
INH
e
5V and V
INL
e
0V Propagation delay is measured at 0 4V movement of output
Parameter
Description
Min
Typ
Max
Test
Units
Level
T
PD
Propagation Delay CMOS Swing
1 0
3 0
4 5
I
ns
Dis
Propagation Delay Dispersion
Due to Output Edge Direction
250
450
I
ps
From ECL to CMOS Swings
250
450
I
ps
Due to Repetition Rate
80
V
ps
SR
Output Slew Rate CMOS Swing 20% 80%
0 8
1
1 2
I
V ns
SR
sym
Slew Rate Symmetry
3
10
I
%
TR
Output Rise Time ECL Swing 20% 80%
2 2
V
ns
OS
Output Overshoot
CMOS Swing
190
500
I
mV
ECL Swing (I
SR
e
350
mA)
65
V
mV
T
dis
Output Disable Delay Time
4 7
6 5
I
ns
T
en
Output Enable Delay Time
6 0
8 5
I
ns
C
o
dis
Output Capacitance in Disable
3
V
pF
T
off
Power-Down Delay Time
0 5
V
ms
T
on
Power-On Delay Time
90
V
ns
C
o
off
Output Capacitance in Power-Down
50
V
pF
T
sense
Comparator Delay Time
Switching ON
1 5
V
ms
Switching Off
0 4
V
ms
3
TD
is
23in
TD
is
36in
EL1056AC EL1056C
Monolithic High-Speed Pin Driver
Block Diagram
1056 5
4
EL1056AC EL1056C
Monolithic High-Speed Pin Driver
Typical Performance Curves
10V CMOS TTL and ECL
Outputs into 550X Load
1056 6
CMOS and ECL Outputs As Seen
at the End of an Unterminated
Cable Backmatched at Driver
1056 7
CMOS Output at I
SR
e
100 mA
200 mA 400 mA and 1000 mA
1056 8
Output Slewrate vs I
SR
(Two Samples)
1056 9
Propagation Delay vs I
SR
1056 10
Output Slewrate vs
Die Temperature
1056 11
5
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