1
IDT74FCT162500AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
JANUARY 2002
IDT74FCT162500AT/CT
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS 18-BIT
REGISTERED
TRANSCEIVER
DESCRIPTION:
The FCT162500T 18-bit registered transceivers are built using advanced
dual metal CMOS technology. These high-speed, low-power 18-bit registered
bus transceivers combine D-type latches and D-type flip-flops to allow data flow
in transparent, latched and clocked modes. Data flow in each direction is
controlled by output-enable (OEAB and OEBA), latch enable (LEAB and LEBA)
and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device
operates in transparent mode when LEAB is high. When LEAB is low, the A data
is latched if CLKAB is held at a high or low logic level. If LEAB is low, the A bus
data is stored in the latch/flip-flop on the high-to-low transition of CLKAB. OEAB
performs the output enable function on the B port. Data flow from B port to A
port is similar but uses OEBA, LEBA and CLKBA. Flow-through organization
of signal pins simplifies layout. All inputs are designed with hysteresis for
improved noise margin.
The FCT162500T have balanced output drive with current limiting resistors.
This offers low ground bounce, minimal undershoot, and controlled output fall
timesreducing the need for external series terminating resistors. The
FCT162500T are plug-in replacements for the FCT16500T and ABT16500
for on-board bus interface applications.
B
1
C
D
C
D
A
1
LEAB
CLKAB
OEBA
LEBA
CLKBA
OEAB
TO 17 OTHER CHANNELS
C
D
C
D
1
30
28
27
55
2
3
54
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
2002 Integrated Device Technology, Inc.
DSC-5432/1
FEATURES:
0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical t
SK(o)
(Output Skew) < 250ps
Low input and output leakage
1A (max.)
ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
V
CC
= 5V 10%
Balanced Output Drivers (24mA)
Reduced system switching noise
Typical V
OLP
(Output Ground Bounce) < 0.6V at V
CC
= 5V,
T
A
= 25C
Available in SSOP and TSSOP packages
FUNCTIONAL BLOCK DIAGRAM
2
INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162500AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
SSOP/ TSSOP
TOP VIEW
PIN CONFIGURATION
G ND
B
2
B
3
G ND
B
4
B
5
V
CC
B
6
B
7
B
1
B
8
B
9
B
1 0
B
1 1
G ND
B
1 2
B
1 3
V
CC
B
1 4
G ND
C LKA B
B
1 6
B
1 5
B
1 7
G ND
B
1 8
G ND
C LKB A
O EA B
LEAB
A
1
GND
A
2
A
3
V
CC
A
4
A
5
GND
A
6
A
7
A
8
A
9
GND
A
10
A
11
V
CC
A
12
A
18
A
14
A
13
A
16
GND
A
17
LEBA
A
15
O EB A
47
37
38
39
40
41
42
43
44
45
46
33
34
35
36
56
55
49
50
51
52
53
54
48
1
2
3
4
5
6
7
8
9
10
12
13
14
15
16
17
18
19
20
11
21
22
23
24
29
30
31
32
25
26
27
28
PIN DESCRIPTION
Pin Names
Description
OEAB
A-to-B Output Enable Input
OEBA
B-to-A Output Enable Input (Active LOW)
LEAB
A-to-B Latch Enable Input
LEBA
B-to-A Latch Enable Input
CLKAB
A-to-B Clock Input (Active LOW)
CLKBA
B-to-A Clock Input (Active LOW)
A x
A-to-B Data Inputs or B-to-A 3-State Outputs
B x
B-to-A Data Inputs or A-to-B 3-State Outputs
Symbol
Description
Max
Unit
V
TERM
(2)
Terminal Voltage with Respect to GND
0.5 to 7
V
V
TERM
(3)
Terminal Voltage with Respect to GND
0.5 to V
CC
+0.5
V
T
STG
Storage Temperature
65 to +150
C
I
OUT
DC Output Current
60 to +120
mA
ABSOLUTE MAXIMUM RATINGS
(1)
(1)
(1)
(1)
(1)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Output and I/O terminals for FCT162XXX.
Symbol
Parameter
(1)
Conditions
Typ.
Max.
Unit
C
IN
Input Capacitance
V
IN
= 0V
3.5
6
pF
C
OUT
Output Capacitance
V
OUT
= 0V
3.5
8
pF
CAPACITANCE
(T
A
= +25C, F = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
FUNCTION TABLE
(1, 4)
NOTES:
1. A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA, LEBA,
and CLKBA.
2. Output level before the indicated steady-state input conditions were established.
3. Output level before the indicated steady-state input conditions were established,
provided that CLKAB was LOW before LEAB went LOW.
4. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
Z = High-impedance
= HIGH-to-LOW Transition
Inputs
Outputs
OEAB
LEAB
CLKAB
Ax
Bx
L
X
X
X
Z
H
H
X
L
L
H
H
X
H
H
H
L
L
L
H
L
H
H
H
L
H
X
B
(2)
H
L
L
X
B
(3)
3
IDT74FCT162500AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
Symbol
Parameter
Test Conditions
(1)
Min.
Typ.
(2)
Max.
Unit
V
IH
Input HIGH Level
Guaranteed Logic HIGH Level
2
--
--
V
V
IL
Input LOW Level
Guaranteed Logic LOW Level
--
--
0.8
V
I
IH
Input HIGH Current (Input pins)
(5)
V
CC
= Max.
V
I
= V
CC
--
--
1
A
Input HIGH Current (I/O pins)
(5)
--
--
1
I
IL
Input LOW Current (Input pins)
(5)
V
I
= GND
--
--
1
Input LOW Current (I/O pins)
(5)
--
--
1
I
OZH
High Impedance Output Current
V
CC
= Max.
V
O
= 2.7V
--
--
1
A
I
OZL
(3-State Output pins)
(5)
V
O
= 0.5V
--
--
1
V
IK
Clamp Diode Voltage
V
CC
= Min., I
IN
= 18mA
--
0.7
1.2
V
I
OS
Short Circuit Current
V
CC
= Max., V
O
= GND
(3)
80
140
250
mA
V
H
Input Hysteresis
--
--
100
--
mV
I
CCL
Quiescent Power Supply Current
V
CC
= Max.
--
5
500
A
I
CCH
V
IN
= GND or V
CC
I
CCZ
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= 40C to +85C, V
CC
= 5.0V 10%
OUTPUT DRIVE CHARACTERISTICS
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is 5A at T
A
= 55C.
Symbol
Parameter
Test Conditions
(1)
Min.
Typ.
(2)
Max.
Unit
I
ODL
Output LOW Current
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
O
= 1.5V
(3)
60
115
200
mA
I
ODH
Output HIGH Current
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
O
= 1.5V
(3)
60
115
200
mA
V
OH
Output HIGH Voltage
V
CC
= Min.
I
OH
= 24mA
2.4
3.3
--
V
V
IN
= V
IH
or V
IL
V
OL
Output LOW Voltage
V
CC
= Min.
I
OH
= 24mA
--
0.3
0.55
V
V
IN
= V
IH
or V
L
4
INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162500AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
Symbol
Parameter
Test Conditions
(1)
Min.
Typ.
(2)
Max.
Unit
I
CC
Quiescent Power Supply Current
V
CC
= Max.
--
0.5
1.5
mA
TTL Inputs HIGH
V
IN
= 3.4V
(3)
I
CCD
Dynamic Power Supply
V
CC
= Max.
V
IN
= V
CC
--
75
120
A/
Current
(4)
Outputs Open
V
IN
= GND
MHz
OEAB = OEBA = V
CC
or GND
One Input Togging
50% Duty Cycle
I
C
Total Power Supply Current
(6)
V
CC
= Max.
V
IN
= V
CC
--
0.8
1.7
mA
Outputs Open
V
IN
= GND
f
CP
= 10MHz (CLKAB)
50% Duty Cycle
OEAB = OEBA = V
CC
LEAB = GND
V
IN
= 3.4V
--
1.3
3.2
One Bit Toggling
V
IN
= GND
fi = 5MHz
50% Duty Cycle
V
CC
= Max.
V
IN
= V
CC
--
3.8
6.5
(5)
Outputs Open
V
IN
= GND
f
CP
= 10MHz (CLKAB)
50% Duty Cycle
OEAB = OEBA = V
CC
LEAB = GND
V
IN
= 3.4V
--
8.5
20.8
(5)
Eighteen Bits Toggling
V
IN
= GND
f
i
= 2.5MHz
50% Duty Cycle
POWER SUPPLY CHARACTERISTICS
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
I
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + fiNi)
I
CC
= Quiescent Current (I
CCL
, I
CCH
and I
CCZ
)
I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
N
CP
= Number of Clock Inputs at f
CP
fi = Input Frequency
Ni = Number of Inputs at fi
5
IDT74FCT162500AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
74FCT162500AT
74FCT162500CT
Symbol Parameter
Condition
(1)
Min.
(2)
Max.
Min.
(2)
Max.
Unit
f
MAX
CLKAB or CLKBA frequency
(4)
C
L
= 50pF
--
150
--
150
MHz
t
PLH
Propagation Delay
R
L
= 500
1.5
5.1
1.5
3.8
ns
t
PHL
Ax to Bx or Bx to Ax
t
PLH
Propagation Delay
1.5
5.6
1.5
4.2
ns
t
PHL
LEBA to Ax, LEAB to Bx
t
PLH
Propagation Delay
1.5
5.6
1.5
4.4
ns
t
PHL
CLKBA to Ax, CLKAB to Bx
t
PZH
Output Enable Time
1.5
6
1.5
4.8
ns
t
PZL
OEBA to Ax, OEAB to Bx
t
PHZ
Output Disable Time
1.5
5.6
1.5
4.4
ns
t
PLZ
OEBA to Ax, OEAB to Bx
t
SU
Set-up Time, HIGH or LOW
3
--
2.4
--
ns
Ax to CLKAB, Bx to CLKBA
t
H
Hold Time, HIGH or LOW
0
--
0
--
ns
Ax to CLKAB, Bx to CLKBA
t
SU
Set-up Time HIGH or LOW
Clock HIGH
3
--
2
--
ns
Ax to LEAB, Bx to LEBA
Clock LOW
1.5
--
1.5
--
ns
t
H
Hold Time, HIGH or LOW
1.5
--
0.5
--
ns
Ax to LEAB, Bx to LEBA
t
W
LEAB or LEBA Pulse Width HIGH
(4)
3
--
3
--
ns
t
W
CLKAB or CLKBA Pulse Width HIGH or LOW
(4)
3
--
3
--
ns
t
SK(o)
Output Skew
(3)
--
0.5
--
0.5
ns
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
NOTES:
1. See test circuits and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
4. This parameter is guaranteed but not tested.
6
INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162500AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
Pulse
Generator
R
T
D.U.T.
V
CC
V
IN
C
L
V
OUT
50pF
500
500
7.0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
D ATA
INPUT
TIM IN G
INPUT
ASYNC HR ONOUS C ONTROL
PRES ET
CLEA R
ETC .
SYNCHR ON OUS CONTROL
t
SU
t
H
t
R EM
t
SU
t
H
PRES ET
CLEA R
CLOCK ENABLE
ETC .
HIGH-LOW -H IGH
PU LSE
LOW -HIGH-LOW
PU LSE
t
W
1.5V
1.5V
SAM E PHASE
INPUT TRAN SITION
3V
1.5V
0V
1.5V
V
O H
t
PLH
OU TPU T
OPPOSITE P HASE
INPUT TRAN SITION
3V
1.5V
0V
t
PL H
t
PH L
t
PH L
V
O L
CONTROL
IN PU T
3V
1.5V
0V
3.5V
0V
OUTPU T
NORM ALLY
LOW
OUTPU T
NORM ALLY
H IGH
SW ITCH
C LOSE D
SW ITC H
OPEN
V
OL
0.3V
0.3V
t
PLZ
t
PZL
t
PZH
t
PHZ
3.5V
0V
1.5V
1.5V
ENABLE
D ISABLE
V
OH
TEST CIRCUITS AND WAVEFORMS
Propagation Delay
Test Circuits for All Outputs
Enable and Disable Times
Set-up, Hold, and Release Times
Pulse Width
Test
Switch
Open Drain
Disable Low
Closed
Enable Low
All Other Tests
Open
SWITCH POSITION
DEFINITIONS:
C
L
= Load capacitance: includes jig and probe capacitance.
R
T
= Termination resistance: should be equal to Z
OUT
of the Pulse Generator.
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate
1.0MHz; t
F
2.5ns; t
R
2.5ns.
7
IDT74FCT162500AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT XX
Temp. Range
XXXX
D evice Type
XX
Package
PV
PA
Shrink Small O utline Package
Thin Shrink Small Outline Package
18-Bit Registered Transceiver
74
40
C to +85
C
162
D ouble-Density, 5 Volt, Balanced D rive
FCT
XXX
Family
500AT
500CT
DATA SHEET DOCUMENT HISTORY
1/21/2002
Removed Military temp grade
CORPORATE HEADQUARTERS
for SALES:
for Tech Support:
2975 Stender Way
800-345-7015 or 408-727-6116
logichelp@idt.com
Santa Clara, CA 95054
fax: 408-492-8674
(408) 654-6459
www.idt.com
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