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Электронный компонент: E28F008SA-85

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November 1995
COPYRIGHT
INTEL CORPORATION 1995
Order Number 290429-005
28F008SA
8-MBIT (1-MBIT x 8) FlashFile
TM
MEMORY
Extended Temperature Specifications Included
Y
High-Density Symmetrically-Blocked
Architecture
Sixteen 64-Kbyte Blocks
Y
Extended Cycling Capability
100 000 Block Erase Cycles
1 6 Million Block Erase
Cycles per Chip
Y
Automated Byte Write and Block Erase
Command User Interface
Status Register
Y
System Performance Enhancements
RY BY
Status Output
Erase Suspend Capability
Y
Deep Power-Down Mode
0 20 mA I
CC
Typical
Y
Very High-Performance Read
85 ns Maximum Access Time
Y
SRAM-Compatible Write Interface
Y
Hardware Data Protection Feature
Erase Write Lockout during Power
Transitions
Y
Industry Standard Packaging
40-Lead TSOP 44-Lead PSOP
Y
ETOX III Nonvolatile Flash Technology
12V Byte Write Block Erase
Intel's 28F008SA 8-Mbit FlashFile
TM
Memory is the highest density nonvolatile read write solution for sol-
id-state storage The 28F008SA's extended cycling symmetrically blocked architecture fast access time
write automation and low power consumption provide a more reliable lower power lighter weight and higher
performance alternative to traditional rotating disk technology The 28F008SA brings new capabilities to porta-
ble computing Application and operating system software stored in resident flash memory arrays provide
instant-on rapid execute-in-place and protection from obsolescence through in-system software updates
Resident software also extends system battery life and increases reliability by reducing disk drive accesses
For high density data acquisition applications the 28F008SA offers a more cost-effective and reliable alterna-
tive to SRAM and battery Traditional high density embedded applications such as telecommunications can
take advantage of the 28F008SA's nonvolatility blocking and minimal system code requirements for flexible
firmware and modular software designs
The 28F008SA is offered in 40-lead TSOP (standard and reverse) and 44-lead PSOP packages Pin assign-
ments simplify board layout when integrating multiple devices in a flash memory array or subsystem This
device uses an integrated Command User Interface and state machine for simplified block erasure and byte
write The 28F008SA memory map consists of 16 separately erasable 64-Kbyte blocks
Intel's 28F008SA employs advanced CMOS circuitry for systems requiring low power consumption and noise
immunity Its 85 ns access time provides superior performance when compared with magnetic storage media
A deep powerdown mode lowers power consumption to 1 mW typical thru V
CC
crucial in portable computing
handheld instrumentation and other low-power applications The RP
power control input also provides
absolute data protection during system powerup down
Manufactured on Intel's 0 8 micron ETOX process the 28F008SA provides the highest levels of quality
reliability and cost-effectiveness
28F008SA
PRODUCT OVERVIEW
The
28F008SA
is
a
high-performance
8-Mbit
(8 388 608 bit) memory organized as 1 Mbyte
(1 048 576 bytes) of 8 bits each Sixteen 64-Kbyte
(65 536 byte) blocks are included on the 28F008SA
A memory map is shown in Figure 6 of this specifica-
tion A block erase operation erases one of the six-
teen blocks of memory in typically 1 6 seconds in-
dependent of the remaining blocks Each block can
be independently erased and written 100 000 cy-
cles Erase Suspend
mode allows system software
to suspend block erase to read data or execute
code from any other block of the 28F008SA
The 28F008SA is available in the 40-lead TSOP
(Thin Small Outline Package 1 2 mm thick) and 44-
lead PSOP
(Plastic Small Outline) packages Pin-
outs are shown in Figures 2 and 4 of this specifica-
tion
The Command User Interface serves as the inter-
face between the microprocessor or microcontroller
and the internal operation of the 28F008SA
Byte Write and Block Erase Automation
allow
byte write and block erase operations to be execut-
ed using a two-write command sequence to the
Command User Interface The internal Write State
Machine
(WSM) automatically executes the algo-
rithms and timings necessary for byte write and
block
erase
operations
including
verifications
thereby unburdening the microprocessor or micro-
controller Writing of memory data is performed in
byte increments typically within 9 ms an 80% im-
provement over current flash memory products I
PP
byte write and block erase currents
are 10 mA
typical 30 mA maximum V
PP
byte write and
block erase voltage
is 11 4V to 12 6V
The Status Register indicates the status of the
WSM and when the WSM successfully completes
the desired byte write or block erase operation
The RY BY
output gives an additional indicator of
WSM activity providing capability for both hardware
signal of status (versus software polling) and status
masking (interrupt masking for background erase
for example) Status polling using RY BY
mini-
mizes both CPU overhead and system power con-
sumption When low RY BY
indicates that the
WSM is performing a block erase or byte write oper-
ation RY BY
high indicates that the WSM is ready
for new commands block erase is suspended or the
device is in deep powerdown mode
Maximum access time is 85 ns (t
ACC
)
over the com-
mercial temperature range (0 C to a70 C) and over
V
CC
supply voltage range (4 5V to 5 5V and 4 75V to
5 25V) I
CC
active current
(CMOS Read) is 20 mA
typical 35 mA maximum at 8 MHz
When the CE
and RP
pins are at V
CC
the I
CC
CMOS Standby
mode is enabled
A Deep Powerdown mode is enabled when the
RP
pin is at GND minimizing power consumption
and providing write protection I
CC
current
in deep
powerdown is 0 20 mA typical Reset time of 400 ns
is required from RP
switching high until outputs are
valid to read attempts Equivalently the device has a
wake time of 1 ms from RP
high until writes to the
Command User Interface are recognized by the
28F008SA With RP
at GND the WSM is reset
and the Status Register is cleared
2
28F008SA
Figure 1 Block Diagram
290429
1
3
28F008SA
Table 1 Pin Description
Symbol
Type
Name and Function
A
0
A
19
INPUT
ADDRESS INPUTS
for memory addresses Addresses are internally
latched during a write cycle
DQ
0
DQ
7
INPUT OUTPUT
DATA INPUT OUTPUTS
Inputs data and commands during Command
User Interface write cycles outputs data during memory array Status
Register and Identifier read cycles The data pins are active high and
float to tri-state off when the chip is deselected or the outputs are
disabled Data is internally latched during a write cycle
CE
INPUT
CHIP ENABLE
Activates the device's control logic input buffers
decoders and sense amplifiers CE
is active low CE
high deselects
the memory device and reduces power consumption to standby levels
RP
INPUT
RESET DEEP POWERDOWN
Puts the device in deep powerdown
mode RP
is active low RP
high gates normal operation RP
also
locks out block erase or byte write operations when active low providing
data protection during power transitions RP
active resets internal
automation Exit from Deep Powerdown sets device to read-array mode
OE
INPUT
OUTPUT ENABLE
Gates the device's outputs through the data buffers
during a read cycle OE
is active low
WE
INPUT
WRITE ENABLE
Controls writes to the Command User Interface and
array blocks WE
is active low Addresses and data are latched on the
rising edge of the WE
pulse
RY BY
OUTPUT
READY BUSY
Indicates the status of the internal Write State
Machine When low it indicates that the WSM is performing a block
erase or byte write operation RY BY
high indicates that the WSM is
ready for new commands block erase is suspended or the device is in
deep powerdown mode RY BY
is always active and does NOT float
to tri-state off when the chip is deselected or data outputs are disabled
V
PP
BLOCK ERASE BYTE WRITE POWER SUPPLY
for erasing blocks of
the array or writing bytes of each block
NOTE
With V
PP
k
V
PPLMAX
memory contents cannot be altered
V
CC
DEVICE POWER SUPPLY (5V
g
10% 5V
g
5%)
GND
GROUND
4
28F008SA
Standard Pinout
290429 2
Reverse Pinout
290429 3
Figure 2 TSOP Lead Configurations
5