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Электронный компонент: IS41LV4400X

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Integrated Silicon Solution, Inc. -- 1-800-379-4774
1
Rev. D
06/24/01
ISSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any
errors which may appear in this publication. Copyright 2000, Integrated Silicon Solution, Inc.
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
FEATURES
Extended Data-Out (EDO) Page Mode access cycle
TTL compatible inputs and outputs
Refresh Interval:
2,048 cycles/32 ms
4,096 cycles/64 ms
Refresh Mode:
RAS-Only,
CAS-before-RAS (CBR), and Hidden
Single power supply:
5V10% or 3.3V 10%
Byte Write and Byte Read operation via two
CAS
Industrial temperature range -40C to 85C
DESCRIPTION
The
ISSI
4400 Series is a 4,194,304 x 4-bit high-performance
CMOS Dynamic Random Access Memory. These
devices offer an accelerated cycle access called EDO
Page Mode. EDO Page Mode allows 2,048 or 4096
random accesses within a single row with access cycle
time as short as 20 ns per 4-bit word.
These features make the 4400 Series ideally suited for
high-bandwidth graphics, digital signal processing,
high-performance computing systems, and peripheral
applications.
The 4400 Series is packaged in a 24-pin 300-mil SOJ with
JEDEC standard pinouts.
4M x 4 (16-MBIT) DYNAMIC RAM
WITH EDO PAGE MODE
JUNE, 2001
KEY TIMING PARAMETERS
Parameter
-50
-60
Unit
RAS Access Time (t
RAC
)
50
60
ns
CAS Access Time (t
CAC
)
13
15
ns
Column Address Access Time (t
AA
)
25
30
ns
EDO Page Mode Cycle Time (t
PC
)
20
25
ns
Read/Write Cycle Time (t
RC
)
84
104
ns
PRODUCT SERIES OVERVIEW
Part No.
Refresh
Voltage
IS41C44002
2K
5V 10%
IS41C44004
4K
5V 10%
IS41LV44002
2K
3.3V 10%
IS41LV44004
4K
3.3V 10%
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
VCC
I/O0
I/O1
WE
RAS
*A11(NC)
A10
A0
A1
A2
A3
VCC
GND
I/O3
I/O2
CAS
OE
A9
A8
A7
A6
A5
A4
GND
* A11 is NC for 2K Refresh devices
.
PIN DESCRIPTIONS
A0-A11
Address Inputs (4K Refresh)
A0-A10
Address Inputs (2K Refresh)
I/O0-3
Data Inputs/Outputs
WE
Write Enable
OE
Output Enable
RAS
Row Address Strobe
CAS
Column Address Strobe
Vcc
Power
GND
Ground
NC
No Connection
PIN CONFIGURATION
24 Pin SOJ
2
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
FUNCTIONAL BLOCK DIAGRAM
OE
WE
CAS
CAS
WE
OE
DATA I/O BUS
COLUMN DECODERS
SENSE AMPLIFIERS
MEMORY ARRAY
4,194,304 x 4
ROW DECODER
DATA I/O BUFFERS
CAS
CONTROL
LOGIC
WE
CONTROL
LOGICS
OE
CONTROL
LOGIC
I/O0-I/O3
RAS
RAS
A0-A10(A11)
RAS
CLOCK
GENERATOR
REFRESH
COUNTER
ADDRESS
BUFFERS
TRUTH TABLE
Function
RAS
CAS
WE
OE
Address t
R
/t
C
I/O
Standby
H
H
X
X
X
High-Z
Read
L
L
H
L
ROW/COL
D
OUT
Write: Word (Early Write)
L
L
L
X
ROW/COL
D
IN
Read-Write
L
L
H
L
L
H
ROW/COL
D
OUT
, D
IN
EDO Page-Mode Read
1st Cycle:
L
H
L
H
L
ROW/COL
D
OUT
2nd Cycle:
L
H
L
H
L
NA/COL
D
OUT
EDO Page-Mode Write
1st Cycle:
L
H
L
L
X
ROW/COL
D
IN
2nd Cycle:
L
H
L
L
X
NA/COL
D
IN
EDO Page-Mode
1st Cycle:
L
H
L
H
L
L
H
ROW/COL
D
OUT
, D
IN
Read-Write
2nd Cycle:
L
H
L
H
L
L
H
NA/COL
D
OUT
, D
IN
Hidden Refresh
Read
L
HL
L
H
L
ROW/COL
D
OUT
Write
(1)
L
HL
L
L
X
ROW/COL
D
OUT
RAS-Only Refresh
L
H
X
X
ROW/NA
High-Z
CBR Refresh
H
L
L
X
X
X
High-Z
Note:
1. EARLY WRITE only.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
3
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
Functional Description
The IS41C4400x and IS41LV4400x are CMOS
DRAMs optimized for high-speed bandwidth, low
power applications. During READ or WRITE cycles, each
bit is uniquely addressed through the 11 or 12 address
bits. These are entered 11 bits (A0-A10) at a time for the
2K refresh device or 12 bits (A0-A11) at a time for the 4K
refresh device. The row address is latched by the Row
Address Strobe (
RAS). The column address is latched by
the Column Address Strobe (
CAS). RAS is used to latch
the first nine bits and
CAS is used the latter ten bits.
Memory Cycle
A memory cycle is initiated by bring
RAS LOW and it is
terminated by returning both
RAS and CAS HIGH. To
ensures proper device operation and data integrity any
memory cycle, once initiated, must not be ended or
aborted before the minimum t
RAS
time has expired. A new
cycle must not be initiated until the minimum precharge
time t
RP
, t
CP
has elapsed.
Read Cycle
A read cycle is initiated by the falling edge of
CAS or OE,
whichever occurs last, while holding
WE HIGH. The
column address must be held for a minimum time
specified by t
AR
. Data Out becomes valid only when t
RAC
,
t
AA
, t
CAC
and t
OEA
are all satisfied. As a result, the access
time is dependent on the timing relationships between
these parameters.
Write Cycle
A write cycle is initiated by the falling edge of
CAS and
WE, whichever occurs last. The input data must be valid
at or before the falling edge of
CAS or WE, whichever
occurs last.
Auto Refresh Cycle
To retain data, 2,048 refresh cycles are required in each
32 ms period, or 4,096 refresh cycles are required in
each 64ms period. There are two ways to refresh the
memory:
1. By clocking each of the 2,048 row addresses (A0
through A10) or 4096 row addresses (A0 through
A11) with RAS at least once every 32 ms or 64ms
respectively. Any read, write, read-modify-write or
RAS-only cycle refreshes the addressed row.
2. Using a
CAS-before-RAS refresh cycle. CAS-before-RAS
refresh is activated by the falling edge of
RAS, while
holding
CAS LOW. In CAS-before-RAS refresh cycle,
an internal 9-bit counter provides the row addresses
and the external address inputs are ignored.
CAS-before-RAS is a refresh-only mode and no data
access or device selection is allowed. Thus, the output
remains in the High-Z state during the cycle.
Power-On
After application of the V
CC
supply, an initial pause of 200
s is required followed by a minimum of eight initialization
cycles (any combination of cycles containing a
RAS
signal).
During power-on, it is recommended that
RAS track with
V
CC
or be held at a valid V
IH
to avoid current surges.
4
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Parameters
Rating
Unit
V
T
Voltage on Any Pin Relative to GND
5V
1.0 to +7.0
V
3.3V
0.5 to +4.6
V
CC
Supply Voltage
5V
1.0 to +7.0
V
3.3V
0.5 to +4.6
I
OUT
Output Current
50
mA
P
D
Power Dissipation
1
W
T
A
Commercial Operation Temperature
0 to +70
C
Industrial Operation Temperature
-40 to +85
T
STG
Storage Temperature
55 to +125
C
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device.
This is a stress rating only and functional operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
RECOMMENDED OPERATING CONDITIONS
(Voltages are referenced to GND.)
Symbol
Parameter
Min.
Typ.
Max.
Unit
V
CC
Supply Voltage
5V
4.5
5.0
5.5
V
3.3V
3.0
3.3
3.6
V
IH
Input High Voltage
5V
2.4
--
V
CC
+ 1.0
V
3.3V
2.0
--
V
CC
+ 0.3
V
IL
Input Low Voltage
5V
1.0
--
0.8
V
3.3V
0.3
--
0.8
T
A
Commercial Ambient Temperature
0
--
70
C
Industrial Ambient Temperature
-40
--
85
C
CAPACITANCE
(1,2)
Symbol
Parameter
Max.
Unit
C
IN
1
Input Capacitance: A0-A10(A11)
5
pF
C
IN
2
Input Capacitance:
RAS, CAS, WE, OE
7
pF
C
IO
Data Input/Output Capacitance: I/O0-I/O3
7
pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: T
A
= 25C, f = 1 MHz.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
5
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
ELECTRICAL CHARACTERISTICS
(1)
(Recommended Operating Conditions unless otherwise noted.)
Symbol
Parameter
Test Condition
V
CC
Speed
Min.
Max.
Unit
I
IL
Input Leakage Current
Any input 0V
V
IN
Vcc
5
5
A
Other inputs not under test = 0V
I
IO
Output Leakage Current
Output is disabled (Hi-Z)
5
5
A
0V
V
OUT
Vcc
V
OH
Output High Voltage Level
I
OH
= 5.0 mA, Vcc = 5V
2.4
--
V
I
OH
= 2.0 mA, Vcc = 3.3V
V
OL
Output Low Voltage Level
I
OL
= 4.2 mA, Vcc = 5V
--
0.4
V
I
OL
= 2 mA, Vcc = 3.3V
I
CC
1
Standby Current: TTL
RAS, CAS
V
IH
Commercial
5V
--
2
mA
3.3V
--
0.5
Industrial
5V
--
3
3.3V
--
2
I
CC
2
Standby Current: CMOS
RAS, CAS
V
CC
0.2V
5V
--
1
mA
3.3V
--
0.5
I
CC
3
Operating Current:
RAS, CAS,
-50
--
120
mA
Random Read/Write
(2,3,4)
Address Cycling, t
RC
= t
RC
(min.)
-60
--
110
Average Power Supply Current
I
CC
4
Operating Current:
RAS = V
IL
,
CAS,
-50
--
90
mA
EDO Page Mode
(2,3,4)
Cycling t
PC
= t
PC
(min.)
-60
--
80
Average Power Supply Current
I
CC
5
Refresh Current:
RAS Cycling, CAS
V
IH
-50
--
120
mA
RAS-Only
(2,3)
t
RC
= t
RC
(min.)
-60
--
110
Average Power Supply Current
I
CC
6
Refresh Current:
RAS, CAS Cycling
-50
--
120
mA
CBR
(2,3,5)
t
RC
= t
RC
(min.)
-60
--
110
Average Power Supply Current
Notes:
1. An initial pause of 200 s is required after power-up followed by eight
RAS refresh cycles (RAS-Only or CBR) before proper device
operation is assured. The eight
RAS cycles wake-up should be repeated any time the t
REF
refresh requirement is exceeded.
2. Dependent on cycle rates.
3. Specified values are obtained with minimum cycle time and the output open.
4. Column-address is changed once each EDO page cycle.
5. Enables on-chip refresh and address counters.
6
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
AC CHARACTERISTICS
(1,2,3,4,5,6)
(Recommended Operating Conditions unless otherwise noted.)
-50
-60
Symbol
Parameter
Min.
Max.
Min.
Max.
Units
t
RC
Random READ or WRITE Cycle Time
84
--
104
--
ns
t
RAC
Access Time from
RAS
(6, 7)
--
50
--
60
ns
t
CAC
Access Time from
CAS
(6, 8, 15)
--
13
--
15
ns
t
AA
Access Time from Column-Address
(6)
--
25
--
30
ns
t
RAS
RAS Pulse Width
50
10K
60
10K
ns
t
RP
RAS Precharge Time
30
--
40
--
ns
t
CAS
CAS Pulse Width
(23)
8
10K
10
10K
ns
t
CP
CAS Precharge Time
(9)
9
--
9
--
ns
t
CSH
CAS Hold Time
(21)
38
--
40
--
ns
t
RCD
RAS to CAS Delay Time
(10, 20)
12
37
14
45
ns
t
ASR
Row-Address Setup Time
0
--
0
--
ns
t
RAH
Row-Address Hold Time
8
--
10
--
ns
t
ASC
Column-Address Setup Time
(20)
0
--
0
--
ns
t
CAH
Column-Address Hold Time
(20)
8
--
10
--
ns
t
AR
Column-Address Hold Time
30
--
40
--
ns
(referenced to
RAS)
t
RAD
RAS to Column-Address Delay Time
(11)
10
25
12
30
ns
t
RAL
Column-Address to
RAS Lead Time
25
--
30
--
ns
t
RPC
RAS to CAS Precharge Time
5
--
5
--
ns
t
RSH
RAS Hold Time
8
--
10
--
ns
t
RHCP
RAS Hold Time from CAS Precharge
30
--
35
--
ns
t
CLZ
CAS to Output in Low-Z
(15, 24)
0
--
0
--
ns
t
CRP
CAS to RAS Precharge Time
(21)
5
--
5
--
ns
t
OD
Output Disable Time
(19, 24)
3
15
3
15
ns
t
OE
Output Enable Time
(15, 16)
--
12
--
15
ns
t
OED
Output Enable Data Delay (Write)
12
--
15
--
ns
t
OEHC
OE HIGH Hold Time from CAS HIGH
5
--
5
--
ns
t
OEP
OE HIGH Pulse Width
10
--
10
--
ns
t
OES
OE LOW to CAS HIGH Setup Time
5
--
5
--
ns
t
RCS
Read Command Setup Time
(17, 20)
0
--
0
--
ns
t
RRH
Read Command Hold Time
0
--
0
--
ns
(referenced to
RAS)
(12)
t
RCH
Read Command Hold Time
0
--
0
--
ns
(referenced to
CAS)
(12, 17, 21)
t
WCH
Write Command Hold Time
(17)
8
--
10
--
ns
t
WCR
Write Command Hold Time
40
--
50
--
ns
(referenced to
RAS)
(17)
t
WP
Write Command Pulse Width
(17)
8
--
10
--
ns
t
WPZ
WE Pulse Widths to Disable Outputs
7
--
7
--
ns
Integrated Silicon Solution, Inc. -- 1-800-379-4774
7
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
AC CHARACTERISTICS (Continued)
(1,2,3,4,5,6)
(Recommended Operating Conditions unless otherwise noted.)
-50
-60
Symbol
Parameter
Min.
Max.
Min.
Max.
Units
t
RWL
Write Command to
RAS Lead Time
(17)
13
--
15
--
ns
t
CWL
Write Command to
CAS Lead Time
(17, 21)
8
--
10
--
ns
t
WCS
Write Command Setup Time
(14, 17, 20)
0
--
0
--
ns
t
DHR
Data-in Hold Time (referenced to
RAS)
39
--
39
--
ns
t
ACH
Column-Address Setup Time to
CAS
15
--
15
--
ns
Precharge during WRITE Cycle
t
OEH
OE Hold Time from WE during
8
--
10
--
ns
READ-MODIFY-WRITE cycle
(18)
t
DS
Data-In Setup Time
(15, 22)
0
--
0
--
ns
t
DH
Data-In Hold Time
(15, 22)
8
--
10
--
ns
t
RWC
READ-MODIFY-WRITE Cycle Time
108
--
133
--
ns
t
RWD
RAS to WE Delay Time during
64
--
77
--
ns
READ-MODIFY-WRITE Cycle
(14)
t
CWD
CAS to WE Delay Time
(14, 20)
26
--
32
--
ns
t
AWD
Column-Address to
WE Delay Time
(14)
39
--
47
--
ns
t
PC
EDO Page Mode READ or WRITE
20
--
25
--
ns
Cycle Time
t
RASP
RAS Pulse Width in EDO Page Mode
50
100K
60
100K
ns
t
CPA
Access Time from
CAS Precharge
(15)
--
30
--
35
ns
t
PRWC
EDO Page Mode READ-WRITE
56
--
68
--
ns
Cycle Time
t
COH
Data Output Hold after
CAS LOW
5
--
5
--
ns
t
OFF
Output Buffer Turn-Off Delay from
0
12
0
15
ns
CAS or RAS
(13,15,19, 24)
t
WHZ
Output Disable Delay from
WE
3
10
3
10
ns
t
CSR
CAS Setup Time (CBR REFRESH)
(20, 25)
5
--
5
--
ns
t
CHR
CAS Hold Time (CBR REFRESH)
( 21, 25)
8
--
10
--
ns
t
ORD
OE Setup Time prior to RAS during
0
--
0
--
ns
HIDDEN REFRESH Cycle
t
REF
Auto Refresh Period
2,048 Cycles
--
32
--
32
ms
4,096 Cycles
--
64
--
64
t
T
Transition Time (Rise or Fall)
(2, 3)
1
50
1
50
ns
AC TEST CONDITIONS
Output load:
Two TTL Loads and 50 pF
Input timing reference levels: V
IH
= 2.4V, V
IL
= 0.8V
Output timing reference levels: V
OH
= 2.0V, V
OL
= 0.8V
8
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
Notes:
1. An initial pause of 200 s is required after power-up followed by eight
RAS refresh cycle (RAS-Only or CBR) before proper device
operation is assured. The eight
RAS cycles wake-up should be repeated any time the t
REF
refresh requirement is exceeded.
2. V
IH
(MIN) and V
IL
(MAX) are reference levels for measuring timing of input signals. Transition times, are measured between V
IH
and
V
IL
(or between V
IL
and V
IH
) and assume to be 1 ns for all inputs.
3. In addition to meeting the transition rate specification, all input signals must transit between V
IH
and V
IL
(or between V
IL
and V
IH
) in a
monotonic manner.
4. If
CAS and RAS = V
IH
, data output is High-Z.
5. If
CAS = V
IL
, data output may contain data from the last valid READ cycle.
6. Measured with a load equivalent to one TTL gate and 50 pF.
7. Assumes that t
RCD
- t
RCD
(MAX). If t
RCD
is greater than the maximum recommended value shown in this table, t
RAC
will increase by the
amount that t
RCD
exceeds the value shown.
8. Assumes that t
RCD
t
RCD
(MAX).
9. If
CAS is LOW at the falling edge of RAS, data out will be maintained from the previous cycle. To initiate a new cycle and clear the data
output buffer,
CAS and RAS must be pulsed for t
CP
.
10. Operation with the t
RCD
(MAX) limit ensures that t
RAC
(MAX) can be met. t
RCD
(MAX) is specified as a reference point only; if t
RCD
is
greater than the specified t
RCD
(MAX) limit, access time is controlled exclusively by t
CAC
.
11. Operation within the t
RAD
(MAX) limit ensures that t
RCD
(MAX) can be met. t
RAD
(MAX) is specified as a reference point only; if t
RAD
is
greater than the specified t
RAD
(MAX) limit, access time is controlled exclusively by t
AA
.
12. Either t
RCH
or t
RRH
must be satisfied for a READ cycle.
13. t
OFF
(MAX) defines the time at which the output achieves the open circuit condition; it is not a reference to V
OH
or V
OL
.
14. t
WCS
, t
RWD
, t
AWD
and t
CWD
are restrictive operating parameters in LATE WRITE and READ-MODIFY-WRITE cycle only. If t
WCS
t
WCS
(MIN), the cycle is an EARLY WRITE cycle and the data output will remain open circuit throughout the entire cycle. If t
RWD
t
RWD
(MIN),
t
AWD
t
AWD
(MIN) and t
CWD
t
CWD
(MIN), the cycle is a READ-WRITE cycle and the data output will contain data read from the selected
cell. If neither of the above conditions is met, the state of I/O (at access time and until
CAS and RAS or OE go back to V
IH
) is
indeterminate.
OE held HIGH and WE taken LOW after CAS goes LOW result in a LATE WRITE (OE-controlled) cycle.
15. Output parameter (I/O) is referenced to corresponding
CAS input.
16. During a READ cycle, if
OE is LOW then taken HIGH before CAS goes HIGH, I/O goes open. If OE is tied permanently LOW, a LATE
WRITE or READ-MODIFY-WRITE is not possible.
17. Write command is defined as
WE going low.
18. LATE WRITE and READ-MODIFY-WRITE cycles must have both t
OD
and t
OEH
met (
OE HIGH during WRITE cycle) in order to ensure
that the output buffers will be open during the WRITE cycle. The I/Os will provide the previously written data if
CAS remains LOW and
OE is taken back to LOW after t
OEH
is met.
19. The I/Os are in open during READ cycles once t
OD
or t
OFF
occur.
20. Determined by falling edge of
CAS.
21. Determined by rising edge of
CAS.
22. These parameters are referenced to
CAS leading edge in EARLY WRITE cycles and WE leading edge in LATE WRITE or READ-
MODIFY-WRITE cycles.
23.
CAS must meet minimum pulse width.
24. The 3 ns minimum is a parameter guaranteed by design.
25. Enables on-chip refresh and address counters.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
9
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
READ CYCLE
Note:
1. t
OFF
is referenced from rising edge of
RAS or CAS, whichever occurs last.
t
RAS
t
RC
t
RP
t
AR
t
CAH
t
ASC
t
RAD
t
RAL
OE
I/O
WE
ADDRESS
CAS
RAS
Row
Column
Row
Open
Open
Valid Data
t
CSH
t
CAS
t
RSH
t
CRP
t
CLCH
t
RCD
t
RAH
t
ASR
t
RRH
t
RCH
t
RCS
t
AA
t
CAC
t
OFF
(1)
t
RAC
t
CLC
t
OES
t
OE
t
OD
Don't Care
10
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
EARLY WRITE CYCLE
(
OE = DON'T CARE)
t
RAS
t
RC
t
RP
t
AR
t
CAH
t
ASC
t
RAD
t
RAL
t
ACH
I/O
WE
ADDRESS
CAS
RAS
Row
Column
Row
t
CSH
t
CAS
t
RSH
t
CRP
t
CLCH
t
RCD
t
RAH
t
ASR
t
CWL
t
WCR
t
WCH
t
RWL
t
WP
t
WCS
t
DH
t
DS
t
DHR
Valid Data
Don't Care
Integrated Silicon Solution, Inc. -- 1-800-379-4774
11
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
READ WRITE CYCLE
(LATE WRITE and READ-MODIFY-WRITE Cycles)
t
RAS
t
RWC
t
RP
t
AR
t
CAH
t
ASC
t
RAD
t
RAL
t
ACH
WE
OE
ADDRESS
CAS
RAS
Row
Column
Row
t
CSH
t
CAS
t
RSH
t
CRP
t
CLCH
t
RCD
t
RAH
t
ASR
t
RWD
t
CWL
t
CWD
t
RWL
t
AWD
t
WP
t
RCS
t
CAC
t
CLZ
t
DS
t
DH
t
OEH
t
OD
t
OE
t
RAC
t
AA
I/O
Open
Open
Valid D
OUT
Valid D
IN
Don't Care
12
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
EDO-PAGE-MODE READ CYCLE
Note:
1. t
PC
can be measured from falling edge of
CAS to falling edge of CAS, or from rising edge of CAS to rising edge of CAS. Both
measurements must meet the t
PC
specifications.
t
RASP
t
RP
ADDRESS
CAS
RAS
Row
Row
t
CAS,
t
CLCH
t
CRP
t
RCD
t
CSH
t
CP
t
CAS,
t
CLCH
t
CAH
t
CAS,
t
CLCH
t
RAL
t
RSH
t
CP
t
CP
t
PC
(1)
t
ASR
t
RAH
t
RAD
t
AR
Column
Column
t
CAH
t
CAH
Column
t
ASC
t
ASC
OE
I/O
WE
Open
Open
Valid Data
t
AA
t
AA
t
CPA
t
CAC
t
CAC
t
RAC
t
COH
t
CLZ
t
OEP
t
OE
t
OES
t
OES
t
OD
t
OE
t
OEHC
Valid Data
t
RCH
t
RRH
t
AA
t
CPA
t
CAC
t
OFF
t
CLZ
Valid Data
t
OD
t
ASC
t
RCS
Don't Care
Integrated Silicon Solution, Inc. -- 1-800-379-4774
13
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
EDO-PAGE-MODE EARLY-WRITE CYCLE
t
RASP
t
RP
ADDRESS
CAS
RAS
Row
Row
t
CAS,
t
CLCH
t
CRP
t
RCD
t
CSH
t
CP
t
CAS,
t
CLCH
t
CAH
t
CAS,
t
CLCH
t
RAL
t
RSH
t
CP
t
CP
t
PC
t
ASR
t
RAH
t
RAD
t
AR
t
ACH
Column
Column
t
ACH
t
ACH
t
CAH
t
CAH
Column
t
ASC
t
ASC
OE
I/O
WE
Valid Data
t
ASC
t
WCS
t
WCH
t
CWL
t
WP
t
WCS
t
WCH
t
CWL
t
WP
t
DS
t
DH
t
DHR
t
WCR
t
WCS
t
WCH
t
CWL
t
WP
Valid Data
t
DS
t
DH
Valid Data
t
DS
t
RWL
t
DH
Don't Care
14
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
EDO-PAGE-MODE READ-WRITE CYCLE
(LATE WRITE and READ-MODIFY WRITE Cycles)
Note:
1. t
PC
can be measured from falling edge of
CAS to falling edge of CAS, or from rising edge of CAS to rising edge of CAS. Both
measurements must meet the t
PC
specifications.
t
RASP
t
RP
ADDRESS
CAS
RAS
Row
Row
t
CRP
t
RCD
t
CSH
t
CP
t
CAH
t
CAS,
t
CLCH
t
RAL
t
RSH
t
CP
t
CP
t
RAH
t
RAD
t
AR
t
ASR
Column
Column
t
CAH
t
CAH
Column
t
ASC
t
ASC
t
CAS,
t
CLCH
t
CAS,
t
CLCH
OE
I/O
WE
t
ASC
t
RWD
t
RCS
t
CWL
t
WP
t
AWD
t
CWD
t
DH
t
DS
t
CAC
t
CLZ
t
AWD
t
CWD
t
CWL
t
WP
t
AWD
t
CWD
t
CWL
t
RWL
t
WP
Open
Open
D
IN
D
OUT
t
OE
t
OE
t
OE
t
OD
t
OEH
t
OD
t
OD
t
DH
t
DS
t
CPA
t
AA
t
CAC
t
CLZ
D
IN
D
OUT
t
DH
t
DS
t
CAC
t
CLZ
D
IN
D
OUT
t
CPA
t
AA
t
RAC
t
AA
t
PC
/ t
PRWC
(1)
Don't Care
Integrated Silicon Solution, Inc. -- 1-800-379-4774
15
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
EDO-PAGE-MODE READ-EARLY-WRITE CYCLE
(Psuedo READ-MODIFY WRITE)
t
RASP
t
RP
ADDRESS
CAS
RAS
Row
Row
t
CRP
t
RCD
t
PC
t
CSH
t
CP
t
CAH
t
CAS
t
RAL
t
RSH
t
CP
t
CP
t
ACH
t
RAH
t
RAD
t
AR
t
ASR
Column (A)
Column (N)
t
CAH
t
CAH
Column (B)
t
ASC
t
ASC
t
CAS
t
CAS
OE
I/O
WE
t
ASC
t
CAC
t
RCH
t
DH
Open
Open
Valid Data (A)
t
OE
t
WCS
t
CAC
t
COH
D
IN
t
CPA
t
WCH
t
RAC
t
AA
t
PC
Valid Data (B)
t
WHZ
t
DS
t
RCS
t
AA
Don't Care
16
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
AC WAVEFORMS
READ CYCLE
(With
WE-Controlled Disable)
RAS-ONLY REFRESH CYCLE
(
OE, WE = DON'T CARE)
t
AR
t
CAH
t
ASC
t
ASC
t
RAD
OE
I/O
WE
ADDRESS
CAS
RAS
Row
Column
Open
Open
Valid Data
t
CSH
t
CAS
t
CRP
t
RCD
t
CP
t
RAH
t
ASR
t
RCH
t
RCS
t
RCS
t
AA
t
CAC
t
WHZ
t
RAC
t
CLZ
t
CLZ
t
OE
t
OD
Column
t
RAS
t
RC
t
RP
I/O
ADDRESS
CAS
RAS
Row
Row
Open
t
CRP
t
RAH
t
ASR
t
RPC
Don't Care
Don't Care
Integrated Silicon Solution, Inc. -- 1-800-379-4774
17
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
HIDDEN REFRESH CYCLE
(1)
(
WE = HIGH; OE = LOW)
CBR REFRESH CYCLE
(Addresses;
WE, OE = DON'T CARE)
Notes:
1. A Hidden Refresh may also be performed after a Write Cycle. In this case,
WE = LOW and OE = HIGH.
2. t
OFF
is referenced from rising edge of
RAS or CAS, whichever occurs last.
t
RAS
t
RAS
t
RP
t
RP
I/O
CAS
RAS
Open
t
CP
t
RPC
t
CSR
t
CHR
t
RPC
t
CSR
t
CHR
t
RAS
t
RAS
t
RP
CAS
RAS
t
CRP
t
RCD
t
RSH
t
CHR
t
AR
t
ASC
t
RAD
ADDRESS
Row
Column
t
RAH
t
ASR
t
RAL
t
CAH
I/O
Open
Open
Valid Data
t
AA
t
CAC
t
RAC
t
CLZ
t
OFF
(2)
OE
t
OE
t
ORD
t
OD
Don't Care
Don't Care
18
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
ORDERING INFORMATION
Commercial Range: 0C to 70C
Voltage: 5V
Speed (ns)
Order Part No.
Refresh
Package
50
IS41C44002-50J
2K
300-mil SOJ
60
IS41C44002-60J
2K
300-mil SOJ
Speed (ns)
Order Part No.
Refresh
Package
50
IS41C44004-50J
4K
300-mil SOJ
60
IS41C44004-60J
4K
300-mil SOJ
Voltage: 3.3V
Speed (ns)
Order Part No.
Refresh
Package
50
IS41LV44002-50J
2K
300-mil SOJ
60
IS41LV44002-60J
2K
300-mil SOJ
Speed (ns)
Order Part No.
Refresh
Package
50
IS41LV44004-50J
4K
300-mil SOJ
60
IS41LV44004-60J
4K
300-mil SOJ
Integrated Silicon Solution, Inc. -- 1-800-379-4774
19
Rev. D
06/24/01
IS41C4400
X
IS41LV4400
X
S
ERIES
ISSI
ORDERING INFORMATION
Industrial Range: -40C to 85C
Voltage: 5V
Speed (ns)
Order Part No.
Refresh
Package
50
IS41C44002-50JI
2K
300-mil SOJ
60
IS41C44002-60JI
2K
300-mil SOJ
Speed (ns)
Order Part No.
Refresh
Package
50
IS41C44004-50JI
4K
300-mil SOJ
60
IS41C44004-60JI
4K
300-mil SOJ
Voltage: 3.3V
Speed (ns)
Order Part No.
Refresh
Package
50
IS41LV44002-50JI
2K
300-mil SOJ
60
IS41LV44002-60JI
2K
300-mil SOJ
Speed (ns)
Order Part No.
Refresh
Package
50
IS41LV44004-50JI
4K
300-mil SOJ
60
IS41LV44004-60JI
4K
300-mil SOJ
ISSI
Integrated Silicon Solution, Inc.
2231 Lawson Lane
Santa Clara, CA 95054
Tel: 1-800-379-4774
Fax: (408) 588-0806
E-mail: sales@issi.com
www.issi.com