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Электронный компонент: LS7030

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8 DECADE MULTIPLEXED COUNTER
FEATURES:
DC to 7.5 MHz Count Frequency
Multiplexed BCD and 7 Segment Outputs
DC to 500 kHz Scan Frequency
+4.75V to +15V Operation (V
DD
-V
SS
)
Compatible with CMOS Logic
High Input Noise Immunity
Counter Output Latches
Leading Zero Blanking
Low Power Dissipation
All inputs protected
40 Pin DIP- See Figure 1
DESCRIPTION:
The LS7030 is a monolithic, ion implanted MOS Silicon Gate, 8
decade up counter. The circuit includes latches, multiplexer,
leading zero blanking and 7 segment data outputs.
8 DECADE UP COUNTER
The eight decade ripple through counter increments on the neg-
ative edge of the input count pulse. Maximum ripple time is 12s
(99999999 to 00000000). Maximum count frequency is 7.5MHz.
RESET
All decades are reset to zero when Reset input is brought low for
a minimum of 4s. The Overflow flip-flop is reset at the same
time. Reset must be high for a minimum of 1s before next valid
count can be recorded.
LATCHES
Contents of counter are transferred to latches when LOAD signal
is brought low for a minimum of 4s and kept low until a minimum
of 12s has elapsed from previous negative edge of count pulse
(ripple time). Storage of valid data occurs when LOAD signal is
high for a minimum of 1s before next negative edge of count
pulse or reset. Data is transferred for Overflow flip-flop to Over-
flow latch at the same time.
SCAN OSCILLATOR AND COUNTER
The scan counter is driven by an internal oscillator whose fre-
quency is determined by a capacitor connected between Os-
cillator input and Scan input. An external scan clock applied to
Scan input can also drive the scan counter. Scan counter ad-
vances on negative edge of scan clock.
The counter scans from MSD to LSD. When Scan Reset input is
brought high the scan counter is forced to MSD state. Internal
synchonization guarantees proper scanning no matter when Scan
Reset is brought low relative to scan clock. Maximum scan
frequency is 500kHz.
DECIMAL POINT
A high at the Decimal Point input resets the Blanking flip-flop
causing the display to unblank. Decimal Point should be brought
high at start of digit time which has active Decimal Point.
December 2002
7030-121102-1
LSI/CSI
LSI Computer Systems, Inc. 1235 Walt Whitman Road, Melville, NY 11747 (631) 271-0400 FAX (631) 271-0405
LS7030
LSI
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
FIGURE 1
CONNECTION DIAGRAM - TOP VIEW
OSC. INPUT
SCAN INPUT
LAMP TEST INPUT
a
b
N.C.
c
d
COUNT INPUT
e
f
g
TEST COUNT INPUT, DIGITS 3 - 8
V
SS
V
GG
N.C.
N.C.
V
DD
RESET COUNTER INPUT
LOAD LATCH INPUT
SCAN RESET INPUT
MSD STROBE 8
S T R O B E 7
S T R O B E 6
S T R O B E 5
S T R O B E 4
S T R O B E 3
S T R O B E 2
L S D S T R O B E 1
DECIMAL POINT INPUT
BLANK OUTPUT
O V E R F L O W O U T P U T
OVERFLOW INPUT
DECADE 6 OUTPUT, D8
DECADE 7 OUTPUT, D7
DECADE 6 OUTPUT, D6
B8
B4
B2
B1
BCD
DATA
O U T P U T S
DIGIT
S T R O B E
O U T P U T S
L S 7 0 3 0
SEGMENT
O U T P U T S
S E G M E N T
O U T P U T S
DIGIT STROBES
Timing of Digit Strobes is arranged such that both edges of strobe
are guardbanded by a minimum 400ns within valid BCD data when
scan frequency is 100kHz or less. The guardband is a minimum of
200ns at 250kHz scan frequency. At 500kHz only negative edge of
Strobe is guaranteed to be within valid BCD data by a minimum
200ns.
OVERFLOW
The Overflow flip-flop sets on the first negative transition of the Over-
flow Input and remains set until Reset is brought low. Data is trans-
ferred from Overflow flip-flop to Overflow Latch when Load is brought
low. A high at the Overflow Latch causes display to unblank. Over-
flow Output is output of Overflow Latch. MSB outputs of Decades
6, 7, 8 are available for use as Overflow Input.
BLANKING
Leading zero blanking is employed. At start of each MSD to LSD
scan, display is blanked until a nonzero digit or active decimal point is
encountered. Displaly unblanks during LSD time and for a whole
scan when Overflow output is high. When Scan Reset is applied, dis-
play blanks to prevent display damage.
Blanking information is available at Blank output and is incorporated
into 7 segment information.
UL
A3800
With V
GG
at -12V, V
DD
at OV and Vss at +5V, all inputs are TTL
and CMOS compatible. All outputs are CMOS compatible and
BCD and BLANK outputs also provide standard TTL compat-
ibility. In addition, Overflow Output is low power TTL compatible.
In either mode outputs swing between V
DD
and Vss.
MAXIMUM RATINGS
PARAMETER
SYMBOL
VALUE
UNITS
Storage Temperature
Tstg
-65 to +150
C
Operating Temperature T
A
-25 to +70
C
Voltage (any pin to Vss) Vmax
-30 to +0.5
V
PARAMETER
SYMBOL
MIN
MAX
UNITS
Operating Supply Current
Idds
-
15
mA
(f
C
= 7.5MHz)
Input Noise Immunity
Low and High
Vni
25%
-
V
(Vss-V
DD
)
Test Count Input
Vil
Vss - 20
Vss - 3.95
V
Vih
Vss - 1.0
Vss
V
Output Voltage "0"
Vol
-
+0.2
V
Output Voltage "1"
Voh
Vss - 1.0
-
V
Output Voltage "0"
(sinking 10A)
Vol
-
+0.5
V
Output Voltage "1"
Vss = 4.75 (Voh = Vss - 0.5V)
-
0.05
-
mA
(Voh = Vss - 1V)
-
0.25
-
mA
(Voh = Vss - 4V)
-
0.90
-
mA
Vss = 10V (Voh = Vss - 2V)
-
2.0
-
mA
(Voh = Vss - 3V)
-
3.0
-
mA
Vss = 15V (Voh = Vss - 2V)
-
3.0
-
mA
(Voh = Vss - 3V)
-
4.5
-
mA
NOTE 1: Current Sink = Same as segment and strobe outputs.
Current Source = N/A at Voh = Vss -.5V for Vss = +4.75V
35A at Voh = Vss -1V for Vss = +4.75V
40% of segment and strobe outputs at all other specified operating points.
NOTE 2: Limit segment current to 4.5mA maximum.
Limit strobe current to 6mA maximum.
The following inputs have internal pull down resistors to V
DD
with maximum sink current of 5A at Vss input.
Scan Reset Test Count
Count
Decimal Point Overflow
Lamp Test
DC ELECTRICAL CHARACTERISTICS
(V
DD
= V
GG
= OV, Vss = +4.75 to +15V, -25C
T
A
+70C unless otherwise specified.)
D6, D7, D8
OF, BCD
Blank
(See Note 1)
Segment
and
Strobe
Outputs
(See Note 2)
BCD and 7 SEGMENT DATA
Data is available in BCD and 7 segment format. BCD data can be
demultiplexed using Digit Strobes as latch enable signals.
POWER SUPPLIES
+4.75 Volts to +15 Volts single power supply operation is obtained
when V
GG
and V
DD
are tied together. Inputs and outputs are
CMOS compatible and Minimum Input Noise Immunity of 25% of
power supply is guaranteed except for Test Count Input. (Inputs
are TTL compatible at +4.75V to +5.25V operation.)
SCAN OSCILLATOR
CAPACITANCE TYPICAL OSCILLATOR FREQUENCY
4.75V
10V
15V
50pF
40.0 kHz
24.2kHz
22.2 kHz
100pF
22.2 kHz
14.8kHz
13.8 kHz
470pF
5.0 kHz
3.6kHz
3.5 kHz
750pF
3.3 kHz
2.4kHz
2.2 kHz
2000pF
1.3 kHz
0.91kHz
0.85 kHz
{
7030-110201-2
ELECTRICAL CHARACTERISTICS:
(V
DD
= V
GG
= OV, Vss = +4.75 to +15V, -25C
T
A
+70C unless otherwise specified.)
PARAMETER
SYMBOL
MIN
MAX
UNITS
Count test and Count frequency
(Vss = +5V 5%)
f
c
, f
tc
DC
7.5
MHz
(Vss = +10V)
f
c
, f
tc
DC
6
MHz
(Vss = +15V)
f
c
, f
tc
DC
5
MHz
Scan frequency
f
sc
DC
500
kHz
Count Pulse Width
(Vss = +5V 5%)
t
cpw
66
-
ns
(Vss = +10V)
t
cpw
83
-
ns
(Vss = +15V)
t
cpw
100
-
ns
Count Ripple Time
t
cr
-
12
s
Load Pulse Width
t
lpw
4
-
s
Load Removal Tme
t
lr
-
1
s
Reset Pulse Width
t
rpw
4
-
s
Reset Removal Time
t
rr
-
1
s
Rise and fall time
Count Pulse
t
rfc
-
4
s
Reset Pulse
t
rfr
-
4
s
test Count Pulse
t
rftc
-
80
s
*Strobe Guard Band time
t
gb
400
-
ns
(f
SC
100kHz)
*Strobe Guard Band time
t
gb
200
-
ns
(100kHz
f
SC
250kHz)
*Strobe Guard Band time
t
gb
200
-
ns
(250kHz
f
SC
500kHz)
negative edge only
FIGURE 2. GUARD BANDED STROBE
BCD
S T R O B E
t
gb
t
gb
f
b
a
g
d
e
c
FIGURE 3. SEVEN SEGMENT FONT
TTL COMPATIBLE OUTPUTS:
POWER SUPPLIES: Vss = +5V 5%, V
DD
= 0V, V
GG
= -12V 5%
OUTPUT LEVELS: "1" Level
Vss - 0.5V (sourcing 100A)
"0" Level
0.4V (sinking 1.6mA)
"1" Level
Vss - 0.5V (sourcing 40A)
"0" Level
0.4V (sinking .18mA)
All other outputs as specified for single power supply, Vss = + 15V, operation.
Inputs as specified for single power supply, Vss = +5V 5% operation.
}
}
BLANK AND BCD
DATA OUTPUTS
OVERFLOW
OUTPUT
The information included herein is believed to be
accurate and reliable. However, LSI Computer Systems,
Inc. assumes no responsibilities for inaccuracies, nor for
any infringements of patent rights of others which may
result from its use.
7030-110601-3
1 2
4
8
BCD
COUNTER
R
C
1 2 4
8
BCD
COUNTER
R
C
1
2 4
8
BCD
COUNTER
R
C
1 2 4
8
BCD
COUNTER
R
C
1
2
4
8
BCD
COUNTER
R
C
1
2
4
8
BCD
COUNTER
R
C
1
2 4
8
BCD
COUNTER
R
C
1 2
4
8
BCD
COUNTER
R
C
4 BIT
LATCH
ST
4 BIT
LATCH
ST
4 BIT
LATCH
ST
4 BIT
LATCH
ST
4 BIT
LATCH
ST
4 BIT
LATCH
ST
4 BIT
LATCH
ST
4 BIT
LATCH
ST
1 2 4 8
B1
B2
B4
B8
B1
B2
B4
B8
B1
B2
B4
B8
B1
B2
B4
B8
B1
B2
B4
MUX
GATE
G
B8
SEGMENT
DECODER
DATA
OUTPUT
BUFFER
SEVEN
D6 OUTPUT
D7 OUTPUT
D8 OUTPUT
OVFLW
F/F
OVERFLOW INPUT
1 BIT
LATCH
BCD
DATA
OUTPUT
BLANK OUT
LAMP TEST INPUT
Vss
V
GG
V
DD
OVERFLOW OUTPUT
ST
BLANKING
F/F
S
R
Q
C
R
NZ
8 DIGIT STROBE OUTPUTS
OUTPUT
BUFFERS
8 STATE STATIC SCAN
COUNTER & DECODED
LSD
MSD
R
C
OSCILLATOR
OR
BUFFER
SCAN RESET INPUT
(RESET TO MSD)
FIGURE 4. LS7030 BLOCK DIAGRAM
OSC. INPUT
SCAN INPUT
2
1
3
4
5
6
7
8
TEST COUNT INPUT
RESET
INPUT
LOAD
LATCH
INPUT
1 2 4 8
MUX
GATE
G
1 2 4 8
MUX
GATE
G
1 2 4 8
MUX
GATE
G
1 2 4 8
MUX
GATE
G
1 2 4 8
MUX
GATE
G
1 2 4 8
MUX
GATE
G
1 2 4 8
MUX
GATE
G
COUNT
INPUT
SEVEN
SEGMENT
DATA
OUT
22
40
39
LSD
MSD
DECIMAL POINT
INPUT
10
27
26
23
11
17
18
19
20
37
36
34
33
31
30
29
38
12
13
14
15
16
28
32
21
9
8
7
6
5
4
3
2
1
B1
B2
B4
B8
a
b
c
d
e
f
g