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Электронный компонент: 54BCT244RPFB

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1
Memory
All data sheets are subject to change without notice
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com
Octal Buffers/Drivers
54BCT244
2001 Maxwell Technologies
All rights reserved.
12.19.01 Rev 5
1000608
F
EATURES
:
3-state outputs drive bus lines or buffer memory address
registers
R
AD
-P
AK
radiation-hardened against natural space radia-
tion
Total dose hardness:
- >100 krad (Si), depending upon space mission
Package:
- 20-pin R
AD
-P
AK
flat package
Operating temperature range:
-55 to 125
C
P-N-P inputs reduce DC loading
Typical V
OLP
(output ground bounce)
- < 0.8 V at V
CC
=3.3 V, T
A
=25
C
ESD protection exceeds 2000 V
D
ESCRIPTION
:
Maxwell Technologies' 54BCT244 octal buffers and line driv-
ers features a greater than 100 krad (Si) total dose tolerance;
depending upon space misssion. The 54BCT244 is organized
as two 4-bit drivers with separate output enable (OE) inputs.
When OE is low, the device passes data from the A inputs to
the Y outputs. When OE is high, the outputs are in the high
impedance state.
Maxwell Technologies' patented R
AD
-P
AK
packaging technol-
ogy incorporates radiation shielding in the microcircuit pack-
age. It eliminates the need for box shielding while providing
the required radiation shielding for a lifetime in orbit or a space
mission. In a GEO orbit, R
AD
-P
AK
provides true greater than
100 krad (Si) total radiation dose tolerance, dependent upon
space mission. This product is available with packaging and
screening up to Class S.
Logic Diagram
Memory
2
All data sheets are subject to change without notice
2001 Maxwell Technologies
All rights reserved.
Octal Buffers/Drivers
54BCT244
12.19.01 Rev 5
1000608
T
ABLE
1. P
INOUT
D
ESCRIPTION
P
IN
S
YMBOL
D
ESCRIPTION
1, 19
1OE-2OE
Output Enables
2, 4, 6, 8
1A1-1A4
Input
3, 5, 7, 9
2Y4-2Y1
Output
10
GND
Ground
11, 13, 15, 17
2A1-2A4
Input
12, 14, 16, 18
1Y4-1Y1
Output
20
V
CC
Power Supply
T
ABLE
2. 54BCT244 A
BSOLUTE
M
AXIMUM
R
ATINGS
1
1. Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maxi-
mum levels may degrade performance and affect reliability.
P
ARAMETER
S
YMBOL
M
IN
M
AX
U
NIT
Supply Voltage Range
V
CC
-0.5
7.0
V
Input Voltage Range
2
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
V
I
-0.5
7.0
V
Voltage Range Applied to any Output in the Disable or Power-Off
State
2
V
O
-0.5
5.5
V
Voltage Range Applied to any Output in High State
2
V
O
-0.5
V
CC
V
Current Into Any Output in the Low State
I
O
--
96
mA
Total Power Dissipation @ T
A
= +55
C
3
3. Must be able to withstand the additional P
D
due to short circuit test, e.g. I
DS
. The P
D
number is based upon dc values.
P
D
--
651
mW
Operating Temperature Range
T
A
-55
125
C
Storage Temperature Range
T
S
-65
150
C
T
ABLE
3. D
ELTA
L
IMITS
P
ARAMETER
V
ARIATION
I
CC(OP)
10% of specified value on Table 5
I
OZH
10% of specified value on Table 5
I
OZL
10% of specified value on Table 5
Memory
3
All data sheets are subject to change without notice
2001 Maxwell Technologies
All rights reserved.
Octal Buffers/Drivers
54BCT244
12.19.01 Rev 5
1000608
T
ABLE
4. 54BCT244 R
ECOMMENDED
O
PERATING
C
ONDITIONS1
P
ARAMETER
S
YMBOL
M
IN
M
AX
U
NIT
Supply Voltage
V
CC
4.5
5.5
V
High-Level Input Voltage
V
IH
2.0
--
V
Low-Level Input Voltage
V
IL
--
0.8
V
High-Level Output Current
I
OH
--
-12
mA
Low-Level Output Current
I
OL
--
48
mA
Input Clamp Current
I
IK
--
-18
mA
Thermal Impedance -- Flat Package
JC
--
5.56
C/W
Operating Temperature
T
A
-55
125
C
1. All unused control inputs must be held high or low to ensure proper device operation.
T
ABLE
5. 54BCT244 DC E
LECTRICAL
C
HARACTERISTICS
(V
CC
= 5V 10%, T
A
= -55
C
TO
125
C,
UNLESS
OTHERWISE
SPECIFIED
)
P
ARAMETER
S
YMBOL
T
EST
C
ONDITIONS
M
IN
M
AX
U
NIT
Input Clamp Voltage
V
IK
V
CC
= 4.5 V
I
I
= -18 mA
--
-1.2
V
High-Level Output Voltage
V
OH
V
CC
= 4.5 V
I
OH
= -3 mA
2.4
--
V
I
OH
= -12 mA
2
--
Low-Level Output Voltage
V
OL
V
CC
= 4.5 V
I
OL
= 48 mA
--
0.55
V
Input Current
I
I
V
CC
= 5.5 V
V
I
= 7 V
0.1
mA
Off-State Output Current High-Level Volt-
age Applied
I
OZH
V
CC
= 5.5 V
V
I
= 2.7 V
--
50
A
Off-State Output Current Low-Level Volt-
age Applied
I
OZL
V
CC
= 5.5 V
V
O
= 0.5 V
--
-50
A
High Level Input Current
I
IH1
V
CC
= 5.5 V
V
I
= 7 V
--
0.1
mA
I
IH2
V
CC
= 5.5 V
V
I
= 2.7 V
--
20
A
Low Level Input Current
I
IL
V
CC
= 5.5 V
V
I
= 0.5 V
--
-1.0
mA
Short-circuit Output Current
1
1. Not more than one output should be shorted at one time and the duration of test shall not exceed one second.
I
OS
V
CC
= 5.5 V
V
O
= 0.0 V
-100
-225
mA
Supply Current, Outputs High
I
CCH
V
CC
= 5.5 V
Outputs Open
--
40
mA
Supply Current, Outputs Low
I
CCL
V
CC
= 5.5 V
Outputs Open
--
80
mA
Supply Current, Outputs Disabled to High
Impedance State
I
CCZ
V
CC
= 5.5 V
Outputs Open
--
10
mA
Memory
4
All data sheets are subject to change without notice
2001 Maxwell Technologies
All rights reserved.
Octal Buffers/Drivers
54BCT244
12.19.01 Rev 5
1000608
T
ABLE
6. 54BCT244 AC E
LECTRICAL
C
HARACTERISTICS
(V
CC
= 5V 10%, T
A
= -55
C
TO
125
C,
UNLESS
OTHERWISE
SPECIFIED
)
P
ARAMETER
S
YMBOL
T
EST
C
ONDITIONS
M
IN
M
AX
U
NIT
Propagation Delay Time
An to Yn
t
PLH
V
CC
= 4.5 to 5.5 V C
L
= 50 pF
R
1
= 500
R
2
= 500
0.9
5.3
ns
t
PHL
T
A
= -55 to +125
C
1.4
6
t
PLH
V
CC
= 5.0 V C
L
= 50 pF
R
1
= 500
R
2
= 500
1.2
4.4
t
PHL
T
A
= +25
C
1.7
5
Output Enable Time
OE to Yn
t
PZH
V
CC
= 4.5 to 5.5 V C
L
= 50 pF
R
1
= 500
R
2
= 500
2
9
ns
t
PZL
T
A
= -55 to +125
C
2
9.4
t
PZH
V
CC
= 5.0 V C
L
= 50 pF
R
1
= 500
R
2
= 500
2
7.8
t
PZL
T
A
= +25
C
2
8.1
Output Disable Time
OE to Yn
t
PHZ
V
CC
= 4.5 to 5.5 V C
L
= 50 pF
R
1
= 500
R
2
= 500
2
8
ns
t
PLZ
T
A
= -55 to +125
C
2
9.8
t
PHZ
V
CC
= 5.0 V C
L
= 50 pF
R
1
= 500
R
2
= 500
2
6.7
t
PLZ
T
A
= +25
C
2
7.6
T
ABLE
7. F
UNCTION
T
ABLE
(
EACH
BUFFER
)
INPUTS
OUTPUT
OE
A
Y
l
H
H
L
L
L
H
X
Z
Memory
5
All data sheets are subject to change without notice
2001 Maxwell Technologies
All rights reserved.
Octal Buffers/Drivers
54BCT244
12.19.01 Rev 5
1000608
F
IGURE
1. L
OAD
C
IRCUIT
FOR
O
UTPUTS
F
IGURE
N
OTE
:
1. C
L
INCLUDES
PROBE
AND
JOG
CAPACITANCE
F
IGURE
2. V
OLTAGE
W
AVEFORMS
P
ULSE
D
URATION
F
IGURE
3. O
UTPUT
E
NABLE
T
IMING
P
ARAMETER
M
EASUREMENT
I
NFORMATION
T
EST
S1
T
PLH
/T
PHL
Open
T
PLZ
/T
PZL
6V
T
PHZ
/T
PZH
GND