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Электронный компонент: 8408RPFE

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Memory
All data sheets are subject to change without notice
(858) 503-3300- Fax: (858) 503-3301- www.maxwell.com
Quad 8-Bit Multiplying CMOS
8408
2002 Maxwell Technologies
All rights reserved.
D/A Converter with Memory
08.20.02 REV 1
F
EATURES
:
R
AD
-P
AK
patented shielding against natural
space radiation
Total dose hardness:
- equal to 100 krad (Si), depending upon orbit
and space mission
Package:
- 28 pin R
AD
-P
AK
Flat Pack
Single Supply Ooperation (+5V)
Four 8 Bit DACs in one 28 Pin Package
D/As Matched to within 1%
TTL/CMOS Compatable
Four-Quadrant Multiplication
D
ESCRIPTION
:
Maxwell Technologies' 8408 is a monolithic quad 8-bit multi-
plying digital-to-analog CMOS converter. Each DAC has its
own reference input, feedback resistor, and onboard data
latches that feature read/write capability. The readback func-
tion serves as memory for those systems requiring self-diag-
nostics.
A common 8-bit TTL/CMOS compatible input port is used to
load data into any of the four DAC data-latches. Control lines
DS1, DS2 and A/B determine which DAC will accept data.
Data loading is similar to that of a RAMs write cycle. Data can
be read back onto the same bus with control line R/W. The
8408 is a bus compatible with most 8-bit microprocessors,
including the 6800, 8080, 8085, and Z80. The 8408 operates
on a single +5 volt supply and dissipates less than 20 mW.
The 8408 is manufactured using highly stable, thin-film resis-
tors on an advanced oxide-isolated, silicon-gate, CMOS pro-
cess. The improved latch-up resistant design eliminates the
need for external protective Schottky diodes.
Maxwell Technologies' patented R
AD
-P
AK
packaging technol-
ogy incorporates radiation shielding in the microcircuit pack-
age. It eliminates the need for box shielding while providing
the required radiation shielding for a lifetime in orbit or space
mission. In a GEO orbit, R
AD
-P
AK
provides greater than 100
krad (Si) radiation dose tolerance. This product is available
with screening up to Class S.
Logic Diagram
Memory
2
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
T
ABLE
1. 8408 P
INOUT
D
ESCRIPTION
P
IN
S
YMBOL
D
ESCRIPTION
1
V
DD
Supply Voltage
2
V
REF
A
REF Voltage (A)
3
R
FB
A
REF Feedback (A)
4
I
OUT 1A
Current Output (1A)
5
I
OUT 2A
/I
OUT 2B
Current Output (2A/2B)
6
I
OUT 1B
Current Output (1B)
7
R
FB
B
REF Feedback (B)
8
V
REF
B
REF Voltage (B)
9
DB0 (LSB)
Data Bit 0, least significant bit
10 - 15
DB 1 - 6
Data bits 1-6
16
DB 7 (MSB)
Data Bit 7, most significant bit
17
A/B
A/B
18
R/W
Read/Write
19 - 20
DS1 - 2
Data Strobes
21
V
REF
D
REF Voltage (D)
22
R
FB
D
REF Feedback (D)
23
I
OUT 1D
Current Output (1D)
24
I
OUT 2C
/I
OUT 2D
Current Output (2C/2D)
25
I
OUT 1C
Current Output (1C)
26
R
FB
C
REF Feedback (C)
27
V
REF
C
REF Voltage (C)
28
DGND
Digital Ground
T
ABLE
2. 8408 A
BSOLUTE
M
AXIMUM
R
ATINGS
P
ARAMETER
S
YMBOL
M
IN
M
AX
U
NIT
V
DD
to I
OUT 2A,
I
OUT 2B,
I
OUT 2C,
I
OUT 2D
--
0
7
V
V
DD
to DGND
--
0
7
V
I
OUT 1A,
I
OUT 1B,
I
OUT 1C,
I
OUT 1D
to DGND
--
-0.3
V
DD
+ 0.3
V
R
RF
A, R
RF
B, V
RF
C, R
RF
D to I
OUT
--
--
25
V
I
OUT 2A,
I
OUT 2B,
I
OUT 2C,
I
OUT 2D
to DGND
--
-0.3
V
DD
+ 0.3
V
DB0 through DB7 to DGND
--
-0.3
V
DD
+ 0.3
V
Control Logic Input Voltage to DGND
--
-0.3
V
DD
+ 0.3
V
V
REF
A, V
REF
B, V
REF
C, V
REF
D to I
OUT 2A,
I
OUT 2B,
I
OUT 2C,
I
OUT 2D
--
--
25
V
Memory
3
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
Power Dissipation
P
D
--
20
mW
Operating Temperature
T
A
-55
125
C
Storage Temperature Range
T
S
-65
150
C
T
ABLE
3. D
ELTA
L
IMITS
P
ARAMETER
V
ARIATION
I
DD
10% of value specified in Table 4
T
ABLE
4. 8408 S
PECIFICATIONS
(V
DD
= +5 V; V
REF
= 10V; V
OUT
A, B, C, D = 0V, T
A
= -55
TO
125
C
UNLESS
OTHERWISE
NOTED
)
P
ARAMETER
S
YMBOL
T
EST
C
ONDITION
S
UBGROUPS
M
IN
T
YP
M
AX
U
NIT
STATIC ACCURACY
Resolution
N
1, 2, 3
8
--
--
Bits
Non-linearity
1, 2
INL
1, 2, 3
--
--
1/2
LSB
Differential Nonlinearity
DNL
1, 2, 3
--
--
1
LSB
Gain Error
G
FSE
(Using Internal R
FB
)
1, 2, 3
--
--
1
LSB
Gain Tempco
3, 4
TC
GFS
1, 2, 3
--
2
40
ppm/
C
Power Supply Rejection
PSR
V
DD
= 10%
1, 2, 3
--
--
0.001
%FSR/
%
I
OUT 1A, B,C, D
Leakage Current
5
I
LKG
+25C
1
--
--
30
nA
-55 to 125C
2, 3
--
--
200
REFERENCE INPUT
Input Voltage Range
--
1, 2, 3
--
--
20
V
Input Resistance
R
IN
1, 2, 3
6
10
14
K
DIGITAL INPUTS
Digital Input High Voltage
V
IH
1, 2, 3
2.4
--
--
V
Digital Input Low Voltage
V
IL
1, 2, 3
--
--
0.8
V
Digital Input Current
6
I
IN
+25C
1
--
0.01
1.0
A
-55 to 125C
2, 3
--
--
10.0
Digital Input Capacitance
4
C
IN
1, 2, 3
--
--
8
pF
DATA BUS OUTPUTS
Digital Output Low
V
OL
16 mA Sink
1, 2, 3
--
--
0.4
V
Digital Output High
V
OH
400 A Source
1, 2, 3
4
--
--
V
T
ABLE
2. 8408 A
BSOLUTE
M
AXIMUM
R
ATINGS
P
ARAMETER
S
YMBOL
M
IN
M
AX
U
NIT
Memory
4
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
Output Leakage Current
I
LKG
+25C
1
--
0.005
1.0
A
-55 to 125C
2, 3
--
0.075
10.0
DAC OUTPUTS
4
Propogation Delay
7
t
PD
9, 10, 11
--
150
180
ns
Settling Time
8, 9
t
s
9, 10, 11
--
190
250
ns
Output Capacitance
C
OUT
DAC latches All "0s"
9, 10, 11
--
--
30
pF
DAC latches All "1s"
9, 10, 11
--
--
50
AC Feedthrough
FT
20 V
P-P
@ F = 100 kHz
9, 10, 11
54
--
--
dB
SWITCHING CHARACTERISTICS
4, 10
Write to Data Strobe Time
t
DS1
+25C
9
90
--
--
ns
t
DS2
-55 to 125C
10, 11
145
--
--
Data Valid to Strobe Set-up Time
t
DSU
+25C
9
150
--
--
ns
-55 to 125C
10, 11
175
--
--
Data Valid to Strobe Hold Time
t
DH
9, 10, 11
10
--
--
ns
DAC Select to Strobe Set-Up Time
t
AS
9, 10, 11
0
--
--
ns
DAC Select to Strobe Hold Time
t
AH
9, 10, 11
0
--
--
ns
Write Select to Strobe Set-Up
Time
t
WSU
9, 10, 11
0
--
--
ns
Write Select to Strobe Hold Time
t
WH
9, 10, 11
0
--
--
ns
Read to Data Strobe Width
t
RDS
+25C
9
220
--
--
ns
-55 to 125C
10, 11
350
--
--
Data Strobe to Output Valid Time
t
CO
+25C
9
320
--
--
ns
-55 to 125C
10, 11
430
--
--
Output Data Deselect Time
t
OTD
+25C
9
200
--
--
ns
-55 to 125C
10, 11
270
--
--
Read Select to Strobe Set-Up
Time
t
RSU
9, 10, 11
0
--
--
ns
Read Select to Strobe Hold Time
t
RH
9, 10, 11
0
--
--
ns
POWER SUPPLY
Voltage Range
V
DD
1, 2, 31
4.5
--
5.5
V
Supply Current
11
I
DD
1, 2, 3
--
--
50
A
Supply Current
12
I
DD
+25C
1
--
--
1.0
mA
-55 to 125C
2, 3
--
--
1.5
T
ABLE
4. 8408 S
PECIFICATIONS
(V
DD
= +5 V; V
REF
= 10V; V
OUT
A, B, C, D = 0V, T
A
= -55
TO
125
C
UNLESS
OTHERWISE
NOTED
)
P
ARAMETER
S
YMBOL
T
EST
C
ONDITION
S
UBGROUPS
M
IN
T
YP
M
AX
U
NIT
Memory
5
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
1. This is an end-point linearity specification.
2. Guaranteed to be monotonic over the full operating temperature range.
3. ppm/C of FSR (FSR = Full Scale Range = V
REF
-1 LSB).
4. Guaranteed by design.
5. All Digital Inputs = 0V; VREF = +10V.
6. Logic Inputs are MOS gates. Typical input current at +25C is less than 10 nA.
7. From Digital Input to 90% of final analog output current.
8. Digital Inputs = 0V to V
DD
or V
DD
to 0V.
9. Extrapolated: ts (1/2 LSB) = tPD + 6.2
where
= the measured first constant of the final RC decay.
10.See Timing Diagram
11. All Digital Inputs "0" or V
DD
.
12.All Digital Inputs V
IH
or V
IL
Memory
6
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
F
IGURE
1. T
IMING
D
IAGRAM
F
IGURE
2. S
UPPLY
C
URRENT
VS
. L
OGIC
L
EVEL
Memory
7
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
CIRCUIT INFORMATION
The 8408 combines four identical 8-bit CMOS DACs onto a single monolithic chip. Each DAC has its own reference
input, feedback resistor, and on-board data latches. It also features a read/write function that serves as an accessible
memory location for digital-input data words. The DAC's three-state readback drivers place the data word back onto
the data bus.
D/A CONVERTER SECTION
Each DAC contains a highly stable, silicon-chromium, thin-film, R-2R resistor ladder network and eight pairs of current
steering switches. These switches are in series with each ladder resistor and are single-pole, double-throw NMOS
transistors; the gates of these transistors are controlled by CMOS inverters. Figure 3 shows a simplified circuit of the
R-2R resistor ladder section, and Figure 4 shows an approximate equivalent switch circuit. The current through each
resistor leg is switched between IOUT 1 and IOUT 2. This maintains a constant current in each leg, regardless of the
digital input logic states.
Each transistor switch has a finite "ON" resistance that can introduce errors to the DAC's specified performance.
These resistances must be accounted for by making the voltage drop across each transistor equal to each other. This
is done by binarily scaling the transistor's "ON" resistance from the most significant bit (MSB) to the least significant bit
(LSB). With 10 volts applied at the reference input, the current through the MSB switch is 0.5 mA, the next bit is 0.25
mA, etc.; this maintains a constant 10 mV drop across each switch and the converter's accuracy is maintained. It also
results in a constant resistance appearing at the DAC's reference input terminal; this allows the DAC to be driven by a
voltage or current source, ac or dc, of positive or negative polarity.
Shown in Figure 5 is an equivalent output circuit for DAC A. The circuit is shown with all digital inputs high. The leak-
age current source is the combination of surface and junction leakages to the substrate. The 1/256 current source rep-
resents the constant 1-bit current drain through the ladder terminating resistor. The situation is reversed with all digital
inputs low, as shown in Figure 6. The output capacitance is code dependent, and therefore, is modulated between the
low and high values.
Memory
8
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
F
IGURE
3. S
IMPLIFIED
D/A C
IRCUIT
OF
8408
F
IGURE
4. N-C
HANNEL
C
URRENT
S
TEERING
S
WITCH
F
IGURE
5. E
QUIVALENT
DAC C
IRCUIT
(AII D
IGITAL
I
NPUTS
HIGH)
Memory
9
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
F
IGURE
6. E
QUIVALENT
DAC C
IRCUIT
(AII D
IGITAL
I
NPUTS
LOW)
DIGITAL SECTION
Figure 7 shows the digital input/output structure for one bit. The digital WR, WR, and RD controls shown in the figure
are internally generated from the external A/B, R/W, DS1, and DS2 signals. The combination of these signals decide
which DAC is selected. The digital inputs are CMOS inverters, designed such that TTL input levels (2.4 V and 0.8 V)
are converted into CMOS logic levels. When the digital input is in the region of 1.2 V to 1.8 V, the input stages operate
in their linear region and draw current from the +5 V supply (see Typical Supply Current vs. Logic Level curve on page
6). It is recommended that the digital input voltages be as close to VDD and DGND as is practical in order to minimize
supply currents. This allows maximum savings in power dissipation inherent with CMOS devices. The three-state
readback digital output drivers (in the active mode) provide TTL-compatible digital outputs with a fan-out of one TTL
load. The three state digital readback leakage-current is typically 5 nA.
F
IGURE
7. D
IGITAL
I
NPUT
/O
UTPUT
S
TRUCTURE
Memory
10
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
NTERFACE LOGIC SECTION
DAC Operating Modes
All DACs in HOLD MODE.
DAC A, B, C, or D individually selected (WRITE MODE).
DAC A, B, C, or D individually selected (READ MODE).
DACs A and C simultaneously selected (WRITE MODE).
DACs B and D simultaneously selected (WRITE MODE).
DAC Selection: Control inputs, DS1, DS2, and A/B select which DAC can accept data from the input port (see Mode
Selection Table).
Mode Selection: Control inputs DS and R/W control the operating mode of the selected DAC.
Write Mode: When the control inputs DS and R/W are both low, the selected DAC is in the write mode. The input data
latches of the selected DAC are transparent, and its analog output responds to activity on the data inputs DB0DB7.
Hold Mode: The selected DAC latch retains the data that was present on the bus line just prior to DS or R/W going to
a high state. All analog outputs remain at the values corresponding to the data in their respective latches.
Read Mode: When DS is low and R/W is high, the selected DAC is in the read mode, and the data held in the appro-
priate latch is put back onto the data bus.
Memory
11
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
T
ABLE
4. MODE SELECTION TABLE
BASIC APPLICATIONS
Some basic circuit configurations are shown in Figures 8 and 9. Figure 8 shows the 8408 connected in a unipolar con-
figuration (2-Quadrant Multiplication), and Table 5 shows the Code Table. Resistors R1, R2, R3, and R4 are used to
trim full scale output. Full-scale output voltage = VREF 1 LSB = VREF (128) or VREF x (255/256) with all digital
inputs high. Low temperature coefficient (approximately 50 ppm/C) resistors or trimmers should be selected if used.
Full scale can also be adjusted using VREF voltage. This will eliminate resistors R1, R2, R3, and R4. In many applica-
tions, R1 through R4 are not required, and the maximum gain error will then be that of the DAC.
Each DAC exhibits a variable output resistance that is code dependent.This produces a code-dependent, differential
nonlinearity term at the amplifier's output which can have a maximum value of 0.67 times the amplifier's offset voltage.
This differential nonlinearity term adds to the R-2R resistor ladder differential-nonlinearity; the output may no longer be
monotonic. To maintain monotonicity and minimize gain and linearity errors, it is recommended that the op amp offset
voltage be adjusted to less than 10% of 1 LSB (1 LSB = 28 x VREF or 1/256 x VREF), or less than 3.9 mV over the
operating temperature range. Zeroscale output voltage (with all digital inputs low) may be adjusted using the op amp
offset adjustment. Capacitors C1, C2, C3, and C4 provide phase compensation and help prevent overshoot and ring-
ing when using high speed op amps.
Figure 9 shows the recommended circuit configuration for the bipolar operation (4-quadrant multiplication), and Table
6 shows the Code Table. Trimmer resistors R17, R18, R19, and R20 are used only if gain error adjustments are
required and range between 50
and 1000
. Resistors R21, R22, R23, and R24 will range between 50
and 500
. If these resistors are used, it is essential that resistor pairs R9R13, R10R14, R11R15, R12R16 are matched
both in value and tempco. They should be within 0.01%; wire wound or metal foil types are preferred for best temper-
ature coefficient matching. The circuits of Figure 8 and 9 can either be used as a fixed reference D/A converter, or as
an attenuator with an ac input voltage.
Memory
12
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
T
ABLE
5. U
NIPOLAR
B
INARY
C
ODE
T
ABLE
(R
EFER
TO
F
IGURE
8)
F
IGURE
8. Q
UAD
DAC U
NIPOLAR
O
PERATION
(2-Q
UADRANT
M
ULTIPLICATION
)
Memory
13
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
F
IGURE
9. Q
UAD
DAC B
IPOLAR
O
PERATION
(4-Q
UADRANT
M
ULTIPLICATION
)
T
ABLE
6. B
IPOLAR
(O
FFSET
B
INARY
) C
ODE
T
ABLE
(R
EFER
TO
F
IGURE
9)
Memory
14
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
APPLICATION HINTS
General Ground Management: AC or transient voltages between AGND and DGND can appear as noise at the 8408's
analog output. Note that in Figures 5 and 6, IOUT2A/IOUT2B and IOUT 2C/IOUT 2D are connected to AGND. There-
fore, it is recommended that AGND and DGND be tied together at the 8408 socket. In systems where AGND and
DGND are tied together on the backplane, two diodes (1N914 or equivalent) should be connected in inverse parallel
between AGND and DGND.
Write Enable Timing: During the period when both DS and R/W are held low, the DAC latches are transparent and the
analog output responds directly to the digital data input. To prevent unwanted variations of the analog output, the R/W
should not go low until the data bus is fully settled (DATA VALID).
SINGLE SUPPLY, VOLTAGE OUTPUT OPERATION
The 8408 can be connected with a single +5 V supply to produce DAC output voltages from 0 V to +1.5 V. In Figure
10, the 8408 R-2R ladder is inverted from its normal connection. A +1.500 V reference is connected to the current out-
put pin 4 (IOUT 1A), and the normal VREF input pin becomes the DAC output. Instead of a normal current output, the
R-2R ladder outputs a voltage. The OP-490, consisting of four precision low power op amps that can operate its inputs
and outputs to zero volts, buffers the DAC to produce a low impedance output voltage from 0 V to +1.5 V full-scale.
Table 7 shows the code table.
With the supply and reference voltages as shown, better than 1/2 LSB differential and integral nonlinearity can be
expected. To maintain this performance level, the +5 V supply must not drop below 4.75 V. Similarly, the reference
voltage must be no higher than 1.5 V. This is because the CMOS switches require a minimum level of bias in order to
maintain the linearity performance.
T
ABLE
7. S
INGLE
S
UPPLY
B
INARY
C
ODE
T
ABLE
(R
EFER
TO
F
IGURE
10)
Memory
15
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
F
IGURE
10. U
NIPOLAR
S
UPPLY
, V
OLTAGE
O
UTPUT
DAC O
PERATION
F
IGURE
11. A D
IGITALLY
P
ROGRAMMABLE
U
NIVERSAL
A
CTIVE
F
ILTER
Memory
16
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
A DIGITALLY PROGRAMMABLE ACTIVE FILTER
A powerful D/A converter application is a programmable active filter design as shown in Figure 11. The design is
based on the state-variable filter topology which offers stable and repeatable filter characteristics. DAC B and DAC D
can be programmed in tandem with a single digital byte load which sets the center frequency of the filter. DAC A sets
the Q of the filter. DAC C sets the gain of the filter transfer function. The unique feature of this design is that varying
the gain of filter does not affect the Q of the filter. Similarly, the reverse is also true. This makes the programmability of
the filter extremely reliable and predictable. Note that low-pass, high-pass, and bandpass outputs are available. This
sophisticated function is achieved in only two IC packages.
The network analyzer photo shown in Figure 12 superimposes five actual bandpass responses ranging from the low-
est frequency of 75 Hz (1 LSB ON) to a full-scale frequency of 19.132 kHz (all bits ON), which is equivalent to a 256 to
1 dynamic range. The frequency is determined by fC = 1/2
RC where R is the ladder resistance (RIN) of the 8408,
and C is 1000 pF. Note that from device to device, the resistance RIN varies. Thus some tuning may be necessary.
F
IGURE
12. P
ROGRAMMABLE
A
CTIVE
F
ILTER
B
AND
-P
ASS
F
REQUENCY
R
ESPONSE
All components used are available off-the-shelf. Using low drift thin-film resistors, the 8408 exhibits very stable perfor-
mance over temperature. The wide bandwidth of the OP-470 produces excellent high frequency and high Q response.
In addition, the OP470's low input offset voltage assures an unusually low dc offset at the filter output.
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All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
F
IGURE
13. A D
IGITALLY
P
ROGRAMMABLE
, L
OW
-D
ISTORTION
S
INEWAVE
O
SCILLATOR
A LOW-DISTORTION, PROGRAMMABLE SINEWAVE OSCILLATOR
By varying the previous state-variable filter topology slightly, one can obtain a very low distortion sinewave oscillator
with programmable frequency feature as shown in Figure 13. Again, DAC B and DAC D in tandem control the oscillat-
ing frequency based on the relationship fC = 1/2
RC. Positive feedback is accomplished via the 82.5 k
and the 20
k
potentiometer. The Q of the oscillator is determined by the ratio of 10 k
and 475
in series with the FET transis-
tor, which acts as an automatic gain control variable resistor. The AGC action maintains a very stable sinewave ampli-
tude at any frequency. Again, only two ICs accomplish a very useful function.
At the highest frequency setting, the harmonic distortion level measures 0.016%. As the frequencies drop, distortion
also drops to a low of 0.006%. At the lowest frequency setting, distortion came back up to a worst case of 0.035%
Memory
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All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
F28-02
Note: All dimensions in inches
28 P
IN
R
AD
-P
AK
F
LAT
P
ACKAGE
S
YMBOL
D
IMENSION
M
IN
N
OM
M
AX
A
0.190
0.207
0.224
b
0.015
0.017
0.022
c
0.004
0.005
0.009
D
--
0.720
0.740
E
0.380
0.410
0.420
E1
--
--
0.440
E2
0.180
0.250
--
E3
0.030
0.080
--
e
0.050 BSC
L
0.360
0.370
0.380
Q
0.062
0.073
0.081
S1
0.000
0.027
--
N
28
Memory
19
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
Important Notice:
These data sheets are created using the chip manufacturers published specifications. Maxwell Technologies verifies
functionality by testing key parameters either by 100% testing, sample testing or characterization.
The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.
Maxwell Technologies' products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.
Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Tech-
nologies. Maxwell Technologies' liability shall be limited to replacement of defective parts.
Memory
20
All data sheets are subject to change without notice
2002 Maxwell Technologies
All rights reserved.
Quad 8-Bit Multiplying CMOS
D/A Converter with Memory
8408
08.20.02 REV 1
Product Ordering Options
Model Number
Feature
Option Details
8408
RP
F
X
Screening Flow
Package
Radiation Feature
Base Product
Nomenclature
S = Maxwell Class S
B = Maxwell Class B
I = Industrial (testing @ -55C,
+25C, +125C)
E = Engineering (testing @ +25C)
F = Flat Pack
RP = R
AD
-P
AK
package
Quad 8-Bit Multiplying CMOS D/A
Converter with Memory