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Электронный компонент: 27C8100-10

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FEATURES
1M x 8 or 512K x 16 organization
+12.5V programming voltage
Fast access time: 100/120/150/200 ns
Totally static operation
Completely TTL compatible
Operating current: 60mA
Standby current: 100uA
Package type:
- 42 pin plastic DIP
- 44 pin SOP
REV. 2.4, NOV. 19, 2002
P/N: PM0261
1
GENERAL DESCRIPTION
The MX27C8100 is a 5V only, 8M-bit, One Time Program-
mable Read Only Memory. It is organized as 1M x 8 or
512K x 16, operates from a single + 5 volt supply, has
a static standby mode, and features fast single address
location programming. All programming signals are TTL
levels, requiring a single pulse. For programming outside
from the system, existing EPROM programmers may be
used. The MX27C8100 supports a intelligent fast pro-
gramming algorithm which can result in programming
time of less than two minutes.
This One Time Programmable Read Only Memory is
packaged in industry standard 42 pin dual-in-line plastic
package and 44 pin SOP packages.
PIN CONFIGURATIONS
PDIP
BLOCK DIAGRAM
SOP
MX27C8100
8M-BIT [1M x8/512K x16] CMOS OTP ROM
MX27C8100
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
A18
A17
A7
A6
A5
A4
A3
A2
A1
A0
CE
GND
OE
Q0
Q8
Q1
Q9
Q2
Q10
Q3
Q11
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
NC
A8
A9
A10
A11
A12
A13
A14
A15
A16
BYTE/VPP
GND
Q15/A-1
Q7
Q14
Q6
Q13
Q5
Q12
Q4
VCC
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
NC
A18
A17
A7
A6
A5
A4
A3
A2
A1
A0
CE
GND
OE
Q0
Q8
Q1
Q9
Q2
Q10
Q3
Q11
NC
NC
A8
A9
A10
A11
A12
A13
A14
A15
A16
BYTE/VPP
GND
Q15/A1
Q7
Q14
Q6
Q13
Q5
Q12
Q4
VCC
MX27C8100
CONTROL
LOGIC
OUTPUT
BUFFERS
Q0~Q14
Q15/A-1
CE
OE
BYTE/VPP
A0~A18
ADDRESS
INPUTS
Y-DECODER
X-DECODER
Y-SELECT
8M BIT
CELL
MAXTRIX
VCC
GND
.
.
.
.
.
.
.
.
.
.
.
.
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2
REV. 2.4, NOV. 19, 2002
P/N: PM0261
MX27C8100
SYMBOL
PIN NAME
A0~A18
Address Input
Q0~Q14
Data Input/Output
CE
Chip Enable Input
OE
Output Enable Input
BYTE/VPP
Word/Byte Selection/Program Supply Voltage
Q15/A-1
Q15(Word mode)/LSB addr. (Byte mode)
VCC
Power Supply Pin (+5V)
GND
Ground Pin
PIN DESCRIPTION
WORD MODE(BYTE = VCC)
CE
OE
Q15/A-1
MODE
Q0-Q14
SUPPLY CURRENT
H
X
High Z
Non selected
High Z
Standby(ICC2)
L
H
High Z
Non selected
High Z
Operating(ICC1)
L
L
DOUT
Selected
DOUT
Operating(ICC1)
NOTE : X = H or L
TRUTH TABLE OF BYTE FUNCTION
BYTE MODE(BYTE = GND)
CE
OE
Q15/A-1
MODE
Q0-Q7
SUPPLY CURRENT
H
X
X
Non selected
High Z
Standby(ICC2)
L
H
X
Non selected
High Z
Operating(ICC1)
L
L
A-1 input
Selected
DOUT
Operating(ICC1)
3
REV. 2.4, NOV. 19, 2002
P/N: PM0261
MX27C8100
FUNCTIONAL DESCRIPTION
THE PROGRAMMING OF THE MX27C8100
When the MX27C8100 is delivered, the chip has all 8M
bits in the "ONE" or HIGH state. "ZEROs" are loaded into
the MX27C8100 through the procedure of programming.
For programming, the data to be programmed is applied
with 16 bits in parallel to the data pins.
Vcc must be applied simultaneously or before Vpp, and
removed simultaneously or after Vpp. When
programming an MXIC One Time Programmable Read
Only Memory, a 0.1uF capacitor is required across Vpp
and ground to suppress spurious voltage transients
which may damage the device.
FAST PROGRAMMING
The device is set up in the fast programming mode when
the programming voltage VPP = 12.75V is applied, with
VCC = 6.25 V and OE = VIH (Algorithm is shown in Figure
1). The programming is achieved by applying a single
TTL low level 50us pulse to the CE input after addresses
and data line are stable. If the data is not verified, an
additional pulse is applied for a maximum of 25 pulses.
This process is repeated while sequencing through each
address of the device. When the programming mode is
completed, the data in all address is verified at VCC =
VPP = 5V
10%.
PROGRAM INHIBIT MODE
Programming of multiple MX27C8100's in parallel with
different data is also easily accomplished by using the
Program Inhibit Mode. Except for CE and OE, all like
inputs of the parallel MX27C8100 may be common. A
TTL low-level program pulse applied to an MX27C8100
CE input with VPP = 12.5
0.5 V will program the
MX27C8100. A high-level CE input inhibits the other
MX27C8100 from being programmed.
PROGRAM VERIFY MODE
Verification should be performed on the programmed bits
to determine that they were correctly programmed. The
verification should be performed with OE at VIL, CE at
VIH, and VPP at its programming voltage.
AUTO IDENTIFY MODE
The auto identify mode allows the reading out of a binary
code from an One Time Programmable Read Only
Memory that will identify its manufacturer and device
type. This mode is intended for use by programming
equipment for the purpose of automatically matching the
device to be programmed with its corresponding
programming algorithm. This mode is functional in the
25
C
5
C ambient temperature range that is required
when programming the MX27C8100.
To activate this mode, the programming equipment must
force 12.0
0.5 V on address line A9 of the device. Two
identifier bytes may then be sequenced from the device
outputs by toggling address line A0 from VIL to VIH. All
other address lines must be held at VIL during auto
identify mode.
Byte 0 ( A0 = VIL) represents the manufacturer code, and
byte 1 (A0 = VIH), the device identifier code. For the
MX27C8100, these two identifier bytes are given in the
Mode Select Table. All identifiers for manufacturer and
device codes will possess odd parity, with the MSB (Q15)
defined as the parity bit.
READ MODE
The MX27C8100 has two control functions, both of which
must be logically satisfied in order to obtain data at the
outputs. Chip Enable (CE) is the power control and
should be used for device selection. Output Enable (OE)
is the output control and should be used to gate data to
the output pins, independent of device selection.
Assuming that addresses are stable, address access
time (tACC) is equal to the delay from CE to output (tCE).
Data is available at the outputs tOE after the falling edge
of OE's, assuming that CE has been LOW and addresses
have been stable for at least tACC - t OE.
WORD-WIDE MODE
With BYTE/VPP at VCC 0.2V outputs Q0-7 present
data Q0-7 and outputs Q8-15 present data Q8-15, after
CE and OE are appropriately enabled.
4
REV. 2.4, NOV. 19, 2002
P/N: PM0261
MX27C8100
MODE SELECT TABLE
BYTE/
MODE
CE
OE
A9
A0
Q15/A-1
VPP(5)
Q8-14
Q0-7
Read (Word)
VIL
VIL
X
X
Q15 Out
VCC
Q8-14 Out
Q0-7 Out
Read (Upper Byte)
VIL
VIL
X
X
VIH
GND
High Z
Q8-15 Out
Read (Lower Byte)
VIL
VIL
X
X
VIL
GND
High Z
Q0-7 Out
Output Disable
VIL
VIH
X
X
High Z
X
High Z
High Z
Standby
VIH
X
X
X
High Z
X
High Z
High Z
Program
VIL
VIH
X
X
Q15 In
VPP
Q8-14 In
Q0-7 In
Program Verify
VIH
VIL
X
X
Q15 Out
VPP
Q8-14 Out
Q0-7 Out
Program Inhibit
VIH
VIH
X
X
High Z
VPP
High Z
High Z
Manufacturer Code(3)
VIL
VIL
VH
VIL
0B
VCC
00H
C2H
Device Code(3)
VIL
VIL
VH
VIH
1B
VCC
38H
16H
NOTES:
1. VH = 12.0V
0.5V
2. X Either VIL or VIH.
3. A1 - A8, A10 - A18 = VIL (for auto select)
4. See DC Programming Characteristics for VPP voltages.
5. BYTE/VPP is intended for operation under DC Voltage conditions
only.
6. Manufacture code = 00C2H
Device code = B816H
It is recommended that CE be decoded and used as the
primary device-selecting function, while OE be made a
common connection to all devices in the array and
connected to the READ line from the system control bus.
This assures that all deselected memory devices are in
their low-power standby mode and that the output pins
are only active when data is desired from a particular
memory device.
SYSTEM CONSIDERATIONS
During the switch between active and standby
conditions, transient current peaks are produced on the
rising and falling edges of Chip Enable. The magnitude
of these transient current peaks is dependent on the
output capacitance loading of the device. At a minimum,
a 0.1 uF ceramic capacitor (high frequency, low inherent
inductance) should be used on each device between Vcc
and GND to minimize transient effects. In addition, to
overcome the voltage drop caused by the inductive
effects of the printed circuit board traces on One Time
Programmable Read Only Memory arrays, a 4.7 uF bulk
electrolytic capacitor should be used between VCC and
GND for each eight devices. The location of the
capacitor should be close to where the power supply is
connected to the array.
BYTE-WIDE MODE
With BYTE/VPP at GND
0.2V, outputs Q8-15 are tri-
stated. If Q15/A-1 = VIH, outputs Q0-7 present data bits
Q8-15. If Q15/A-1 = VIL, outputs Q0-7 present data bits
Q0-7.
STANDBY MODE
The MX27C8100 has a CMOS standby mode which
reduces the maximum VCC current to 100 uA. It is
placed in CMOS standby when CE is at VCC
0.3 V. The
MX27C8100 also has a TTL-standby mode which
reduces the maximum VCC current to 1.5 mA. It is
placed in TTL-standby when CE is at VIH. When in
standby mode, the outputs are in a high-impedance
state, independent of the OE input.
TWO-LINE OUTPUT CONTROL FUNCTION
To accommodate multiple memory connections, a two-
line control function is provided to allow for:
1. Low memory power dissipation,
2. Assurance that output bus contention will not
occur.
5
REV. 2.4, NOV. 19, 2002
P/N: PM0261
MX27C8100
START
ADDRESS = FIRST LOCATION
VCC = 6.25V
VPP = 12.75V
X = 0
PROGRAM ONE 50us PULSE
INCREMENT X
X = 25?
VERIFY BYTE
LAST ADDRESS
VCC = VPP = 5.25V
DEVICE PASSED
VERIFY ALL BYTES
?
DEVICE FAILED
INCREMENT ADDRESS
INTERACTIVE
SECTION
VERIFY SECTION
FAIL
PASS
YES
PASS
NO
YES
NO
FAIL
FIGURE 1. FAST PROGRAMMING FLOW CHART
FAIL
?
6
REV. 2.4, NOV. 19, 2002
P/N: PM0261
MX27C8100
SWITCHING TEST CIRCUITS
SWITCHING TEST WAVEFORMS
DEVICE
UNDER
TEST
DIODES = IN3064
OR EQUIVALENT
CL = 100 pF including jig capacitance
6.2K ohm
1.8K ohm
+5V
CL
2.0V
0.8V
TEST POINTS
INPUT
2.0V
0.8V
OUTPUT
AC TESTING: AC driving levels are 2.4V/0.4V.
Input pulse rise and fall times are < 10ns.
AC driving levels
7
REV. 2.4, NOV. 19, 2002
P/N: PM0261
MX27C8100
NOTICE:
Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended period may affect reliability.
NOTICE:
Specifications contained within the following tables are subject to
change.
ABSOLUTE MAXIMUM RATINGS
RATING
VALUE
Ambient Operating Temperature
0
o
C to 70
o
C
Storage Temperature
-65
o
C to 125
o
C
Applied Input Voltage
-0.5V to 7.0V
Applied Output Voltage
-0.5V to VCC + 0.5V
VCC to Ground Potential
-0.5V to 7.0V
A9 & VPP
-0.5V to 13.5V
DC/AC Operating Conditions for Read Operation
MX27C8100
-10
-12
-15
-20
Operating Temperature
Commercial
0
C to 70
C
0
C to 70
C
0
C to 70
C
0
C to 70
C
Vcc Power Supply
5V
10%
5V
10%
5V
10%
5V
10%
DC CHARACTERISTICS
SYMBOL
PARAMETER
MIN.
MAX. UNIT
CONDITIONS
VOH
Output High Voltage
2.4
V
IOH = -0.4mA
VOL
Output Low Voltage
0.4
V
IOL = 2.1mA
VIH
Input High Voltage
2.0
VCC + 0.5
V
VIL
Input Low Voltage
-0.3
0.8
V
ILI
Input Leakage Current
-10
10
uA
VIN = 0 to 5.5V
ILO
Output Leakage Current
-10
10
uA
VOUT = 0 to 5.5V
ICC3
VCC Power-Down Current
100
uA
CE = VCC
0.3V
ICC2
VCC Standby Current
1.5
mA
CE = VIH
ICC1
VCC Active Current
60
mA
CE = VIL, f=5MHz, Iout = 0mA
IPP
VPP Supply Current Read
10
uA
CE = OE = VIL, VPP = 5.5V
CAPACITANCE
TA = 25
o
C, f = 1.0 MHz (Sampled only)
SYMBOL
PARAMETER
TYP.
MAX.
UNIT
CONDITIONS
CIN
Input Capacitance
8
12
pF
VIN = 0V
COUT
Output Capacitance
8
12
pF
VOUT = 0V
CVPP
VPP Capacitance
18
25
pF
VPP = 0V
8
REV. 2.4, NOV. 19, 2002
P/N: PM0261
MX27C8100
AC CHARACTERISTICS
27C8100-10
27C8100-12
27C8100-15
27C8100-20
SYMBOL PARAMETER
MIN.
MAX.
MIN. MAX.
MIN. MAX.
MIN.
MAX.
UNIT
CONDITIONS
tACC
Address to Output Delay
100
120
150
200
ns
CE = OE = VIL
tCE
Chip Enable to Output Delay
100
120
150
200
ns
OE = VIL
tOE
Output Enable to Output Delay
40
50
65
80
ns
CE = VIL
tDF
OE High to Output Float,
0
30
0
35
0
50
0
50
ns
or CE High to Output Float0
tOH
Output Hold from Address,
0
0
0
0
ns
CE or OE which ever occurred first
tBHA
BYTE Access Time
100
120
150
200
ns
tOHB
BYTE Output Hold Time
0
0
0
0
ns
tBHZ
BYTE Output Delay Time
70
70
70
70
ns
tBLZ
BYTE Output Set Time
10
10
10
10
ns
AC PROGRAMMING CHARACTERISTICS
TA = 25
o
C
5
o
C
SYMBOL
PARAMETER
MIN.
TYP.
MAX.
UNIT
tAS
Address Setup Time
2.0
us
tOES
OE Setup Time
2.0
us
tDS
Data Setup Time
2.0
us
tAH
Address Hold Time
0
us
tDH
Data Hold Time
2.0
us
tDFP
Chip Enable to Output Float Delay
0
130
ns
tVCS
VCC Setup Time
2.0
us
tVPS
BYTE/VPP Setup Time
2.0
us
tPW
CE initial Program Pulse Width
50
us
tOE
Data valid from OE
150
ns
DC PROGRAMMING CHARACTERISTICS
TA = 25
o
C
5
o
C
SYMBOL
PARAMETER
MIN.
MAX.
UNIT
CONDITIONS
VOH
Output High Voltage
2.4
V
IOH = -0.40mA
VOL
Output Low Voltage
0.4
V
IOL = 2.1mA
VIH
Input High Voltage
2.0
VCC + 0.5
V
VIL
Input Low Voltage
-0.3
0.8
V
ILI
Input Leakage Current
-10
10
uA
VIN = 0 to 5.5V
VH
A9 Auto Select Voltage
11.5
12.5
V
ICC3
VCC Supply Current (Program & Verify)
50
mA
IPP2
VPP Supply Current(Program)
30
mA
CE = VIL, OE = VIH
VCC1
Fast Programming Supply Voltage
6.00
6.50
V
VPP1
Fast Programming Voltage
12.5
13.0
V
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REV. 2.4, NOV. 19, 2002
P/N: PM0261
MX27C8100
WAVEFORMS
READ CYCLE(WORD MODE)
READ CYCLE(BYTE MODE)
ADDRESS
INPUTS
DATA
OUT
OE
CE
DATA ADDRESS
VALID DATA
tDF
tACC
tCE
tOE
tOH
tACC
tOH
tBHA
tBLZ
tOHB
tBHZ
HIGH-Z
VALID DATA
VALID DATA
HIGH-Z
A-1
BYTE/VPP
Q0-Q7
Q15-Q8
VALID DATA
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MX27C8100
WAVEFORMS
FAST PROGRAMMING ALGORITHM WAVEFORMS
Addresses
CE
OE
DATA
BYTE/VPP
VCC
VIH
VIL
VPP1
VCC
VCC1
VCC
VIH
VIL
VIH
VIL
DATA OUT VALID
DATA SET
VALID ADDRESS
tAS
tVPS
tVCS
tOE
tPW
tDS
tDH
tOES
tDFP
tAH
VERIFY
PROGRAM
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MX27C8100
PLASTIC PACKAGE
PART NO.
ACCESS TIME
OPERATING CURRENT
STANDBY CURRENT
PACKAGE
(ns)
MAX.(mA)
MAX.(uA)
MX27C8100PC-10
100
60
100
42 Pin DIP(ROM pin out)
MX27C8100PC-12
120
60
100
42 Pin DIP(ROM pin out)
MX27C8100PC-15
150
60
100
42 Pin DIP(ROM pin out)
MX27C8100PC-20
200
60
100
42 Pin DIP(ROM pin out)
MX27C8100MC-10
100
60
100
44 Pin SOP(ROM pin out)
MX27C8100MC-12
120
60
100
44 Pin SOP(ROM pin out)
MX27C8100MC-15
150
60
100
44 Pin SOP(ROM pin out)
MX27C8100MC-20
200
60
100
44 Pin SOP(ROM pin out)
ORDERING INFORMATION
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MX27C8100
PACKAGE INFORMATION
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MX27C8100
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MX27C8100
Revision History
Revision No. Description
Page
Date
2.0
1) Eliminate Interactive Programming Mode.
5/30/1997
2) Programming pulse change from 100us to 50us
2.1
IPP : 100uA----> 10uA
8/8/1997
2.2
Modify Package Information
P12,13
JAN/12/2000
2.3
Modify Package Information: change title
P12
NOV/12/2001
Modify Package Information: add coplanarity parameter
P13
2.4
To modify Package Information
P12,13
NOV/19/2002
MX27C8100
M
ACRONIX
I
NTERNATIONAL
C
O.,
L
TD.
HEADQUARTERS:
TEL:+886-3-578-6688
FAX:+886-3-563-2888
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ACRONIX
A
MERICA,
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NC.
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CHICAGO OFFICE:
TEL:+1-847-963-1900
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MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice.