ChipFind - документация

Электронный компонент: V53C8126HT35

Скачать:  PDF   ZIP
1
V53C8126H
V53C8126H Rev. 1.1 July 1997
MOSEL VITELIC
HIGH PERFORMANCE
35
40
45
50
Max.
RAS
Access Time, (t
RAC
)
35 ns
40 ns
45 ns
50 ns
Max. Column Address Access Time, (t
CAA
)
18 ns
20 ns
22 ns
24 ns
Min. Fast Page Mode Cycle Time, (t
PC
)
21 ns
23 ns
25 ns
28 ns
Min. Read/Write Cycle Time, (t
RC
)
70 ns
75 ns
80 ns
90 ns
PRELIMINARY
V53C8126H
ULTRA-HIGH PERFORMANCE,
128K X 8 BIT FAST PAGE MODE
CMOS DYNAMIC RAM
Features
s
128K x 8-bit organization
s
RAS
access time: 35, 40, 45, 50 ns
s
Fast Page Mode supports sustained I/O data
rates up to 40 MHz
s
Read-Modify-Write,
RAS
-Only Refresh,
CAS
-Before-
RAS
Refresh capability
s
Refresh Interval
V53C8126H 512 cycles/8 ms
s
Available in 26/24 pin 300 mil SOJ and 28 pin
TSOP package
Description
The V53C8126H is a high speed 131,072 x 8 bit
CMOS dynamic random access memory. The
V53C8126H offers a combination of features: Fast
Page Mode for high data bandwidth, fast usable
speed, CMOS standby current.
All inputs and outputs are TTL compatible. Input
and output capacitances are significantly lowered to
allow increased system performance. Fast Page
Mode operation allows random access of up to 256
columns (x8) bits within a row with cycle times as
short as 21 ns. Because of static circuitry, the
CAS
clock is not in the critical timing path. The flow-
through column address latches allow address
pipelining while relaxing many critical system timing
requirements for fast usable speed. These features
make the V53C8126H ideally suited for graphics,
digital signal processing and high performance
peripherals.
Device Usage Chart
Operating
Package Outline
Access Time (ns)
Power
Temperature
Temperature
Range
K
T
35
40
45
50
Std.
Mark
0
C to 70
C
Blank
2
V53C8126H
V53C8126H Rev. 1.1 July 1997
MOSEL VITELIC
Description
Pkg.
Pin Count
SOJ
K
26/24
FAMILY
DEVICE
PKG
( t
RAC
)
SPEED
PWR.
V
5
3
C
1
2
6
35 (35 ns)
40 (40 ns)
45 (45 ns)
50 (50 ns)
TEMP.
BLANK (0
C to 70
C)
BLANK (NORMAL)
K (SOJ)
T (TSOP)
H
8
8126H 01
26/24 Lead SOJ
PIN CONFIGURATION
Top View
Pin Names
A
0
A
8
Address Inputs (A
8
: Row
Address only)
RAS
Row Address Strobe
CAS
Column Address Strobe
WE
Write Enable
OE
Output Enable
I/O
1
I/O
8
Data Input, Output
V
CC
+5V Supply
V
SS
0V Supply
NC
No Connect
28 Lead TSOP
PIN CONFIGURATION
Top View
CAS
I/O5
I/O6
I/O7
I/O8
VSS
VSS
NC
I/O1
I/O2
I/O3
I/O4
NC
WE
OE
A8
A7
A6
A5
A4
NC
VCC
NC
A3
A2
A1
A0
RAS
28
27
26
25
24
23
22
21
20
19
18
17
16
15
8125H 03
1
2
3
4
5
6
7
8
9
10
11
12
13
14
V
SS
1
I/O
1
2
I/O
2
3
I/O
3
4
I/O
4
5
WE
6
RAS
8
A
0
9
A
1
10
A
2
11
A
3
12
V
CC
V
SS
I/O
8
I/O
7
I/O
6
I/O
5
CAS
OE
A
8
(Row Add. only)
A
7
A
6
A
5
A
4
13
26
25
24
23
22
21
19
18
17
16
8126H 02
15
14
3
V53C8126H
V53C8126H Rev. 1.1 July 1997
MOSEL VITELIC
Block Diagram
Absolute Maximum Ratings*
Ambient Temperature
Under Bias ............................. 10
C to +80
C
Storage Temperature (plastic) .... 55
C to +125
C
Voltage Relative to V
SS ....................
1.0 V to +7.0 V
Data Output Current .................................... 50 mA
Power Dissipation ......................................... 1.0 W
*Note: Operation above Absolute Maximum Ratings can
adversely affect device reliability.
Capacitance*
T
A
= 25
C, V
CC
= 5 V
10%, V
SS
= 0 V
Symbol
Parameter
Typ. Max.
Unit
C
IN1
Address Input
3
4
pF
C
IN2
RAS
,
CAS
,
WE
,
OE
4
5
pF
C
OUT
Data Input/Output
5
7
pF
* Note: Capacitance is sampled and not 100% tested
A 0
A 1
A7
A8
SENSE AMPLIFIERS
REFRESH
COUNTER
VCC
VSS
9
I/O 1
ADDRESS BUFFERS
AND PREDECODERS
ROW
DECODERS
512
MEMORY
ARRAY
COLUMN DECODERS
DATA I/O BUS
Y0Y7
X0X8
256 x 8
8126H 04
I/O
BUFFER
I/O2
I/O3
I/O4
OE CLOCK
GENERATOR
WE CLOCK
GENERATOR
CAS CLOCK
GENERATOR
RAS CLOCK
GENERATOR
OE
128K x 8
Fast Page Mode
WE
CAS
RAS


I/O 5
I/O6
I/O7
I/O8
4
V53C8126H
V53C8126H Rev. 1.1 July 1997
MOSEL VITELIC
DC and Operating Characteristics (1-2)
T
A
= 0
C to 70
C, V
CC
= 5 V
10%, V
SS
= 0 V, unless otherwise specified.
V53C8126H
Time
Min.
Typ.
Max.
Unit Test Conditions
Notes
I
LI
Input Leakage Current
10
10
A
V
SS
V
IN
V
CC
(any input pin)
I
LO
Output Leakage Current
10
10
A
V
SS
V
OUT
V
CC
(for High-Z State)
RAS
,
CAS
at V
IH
35
160
40
150
mA
t
RC
= t
RC
(min.)
1, 2
45
145
50
135
I
CC2
V
CC
Supply Current,
RAS
,
CAS
at V
IH
TTL Standby
4
mA
other inputs
V
SS
35
160
I
CC3
40
150
mA
t
RC
= t
RC
(min.)
2
45
145
50
135
I
CC4
35
95
40
90
mA
Minimum Cycle
1, 2
45
85
50
80
I
CC5
V
CC
Supply Current,
2
mA
RAS
=V
IH
,
CAS
=V
IL
1
Standby, Output Enabled
other inputs
V
SS
I
CC6
V
CC
Supply Current,
RAS
V
CC
0.2 V,
CMOS Standby
1
mA
CAS
V
CC
0.2 V,
All other inputs
V
SS
V
IL
Input Low Voltage
1
0.8
V
3
V
IH
Input High Voltage
2.4
V
CC
+1
V
3
V
OL
Output Low Voltage
0.4
V
I
OL
= 4.2 mA
V
OH
Output High Voltage
2.4
V
I
OH
= 5 mA
Access
I
CC1
V
CC
Supply Current,
Operating
V
CC
Supply Current,
Fast Page Mode
Operation
V
CC
Supply Current,
RAS
-Only Refresh
Symbol
Parameter
5
V53C8126H
V53C8126H Rev. 1.1 July 1997
MOSEL VITELIC
AC Characteristics
T
A
= 0
C to 70
C, V
CC
= 5 V
10%, V
SS
= 0V unless otherwise noted
AC Test conditions, input pulse levels 0 to 3V
35
40
45
50
#
Symbol
Symbol
Parameter
Min. Max. Min. Max. Min. Max. Min. Max.
Unit
Notes
1
t
RL1RH1
t
RAS
RAS
Pulse Width
35
75K
40
75K
45
75K
50
75K
ns
2
t
RL2RL2
t
RC
Read or Write Cycle Time
70
75
80
90
ns
3
t
RH2RL2
t
RP
RAS
Precharge Time
25
25
25
30
ns
4
t
RL1CH1
t
CSH
CAS
Hold Time
35
40
45
50
ns
5
t
CL1CH1
t
CAS
CAS
Pulse Width
12
12
13
14
ns
6
t
RL1CL1
t
RCD
RAS
to
CAS
Delay
16
23
17
28
18
32
19
36
ns
7
t
WH2CL2
t
RCS
Read Command Setup Time
0
0
0
0
ns
4
8
t
AVRL2
t
ASR
Row Address Setup Time
0
0
0
0
ns
9
t
RL1AX
t
RAH
Row Address Hold Time
6
7
8
9
ns
10
t
AVCL2
t
ASC
Column Address Setup Time
0
0
0
0
ns
11
t
CL1AX
t
CAH
Column Address Hold Time
4
5
6
7
ns
12
t
CL1RH1(R)
t
RSH (R)
RAS
Hold Time (Read Cycle)
12
12
13
14
ns
13
t
CH2RL2
t
CRP
CAS
to
RAS
Precharge Time
5
5
5
5
ns
14
t
CH2WX
t
RCH
Read Command Hold Time
0
0
0
0
ns
5
Referenced to
CAS
15
t
RH2WX
t
RRH
Read Command Hold Time
0
0
0
0
ns
5
Referenced to
RAS
16
t
OEL1RH2
t
ROH
RAS
Hold Time
8
8
9
10
ns
Referenced to
OE
17
t
GL1QV
t
OAC
Access Time from
OE
12
12
13
14
ns
18
t
CL1QV
t
CAC
Access Time from
CAS
12
12
13
14
ns
6, 7
19
t
RL1QV
t
RAC
Access Time from
RAS
35
40
45
50
ns
6, 8, 9
20
t
AVQV
t
CAA
Access Time from Column
18
20
22
24
ns
6, 7, 10
Address
21
t
CL1QX
t
LZ
OE
or
CAS
to Low-Z Output
0
0
0
0
ns
16
22
t
CH2QZ
t
HZ
OE
or
CAS
to High-Z Output
0
6
0
6
0
7
0
8
ns
16
23
t
RL1AX
t
AR
Column Address Hold Time
28
30
35
40
ns
from
RAS
24
t
RL1AV
t
RAD
RAS
to Column Address
11
17
12
20
13
23
14
26
ns
11
Delay Time
25
t
CL1RH1(W)
t
RSH (W)
RAS
or
CAS
Hold Time
12
12
13
14
ns
in Write Cycle
26
t
WL1CH1
t
CWL
Write Command to
CAS
12
12
13
14
ns
Lead Time
JEDEC