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Электронный компонент: 74ABT20PW

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Philips Semiconductors
Product specification
74ABT20
Dual 4-input NAND gate
1
1995 Sep 22
853-1811 15793
QUICK REFERENCE DATA
SYMBOL
PARAMETER
CONDITIONS
T
amb
= 25
C;
GND = 0V
TYPICAL
UNIT
t
PLH
t
PHL
Propagation
delay
An, Bn, Cn, Dn
to Yn
C
L
= 50pF;
V
CC
= 5V
2.7
2.2
ns
t
OSLH
t
OSHL
Output to
Output skew
CC
0.3
ns
C
IN
Input
capacitance
V
I
= 0V or V
CC
3
pF
I
CC
Total supply
current
Outputs disabled;
V
CC
= 5.5V
50
A
PIN CONFIGURATION
14
13
12
11
10
9
8
7
6
5
4
3
2
1
GND
V
CC
B1
A1
Y1
NC
D1
C1
A0
B0
Y0
NC
C0
D0
SA00350
PIN DESCRIPTION
PIN
NUMBER
SYMBOL
NAME AND FUNCTION
1, 2, 4, 5, 9,
10, 12, 13
An, Bn,
Cn, Dn
Data inputs
6, 8
Yn
Data outputs
7
GND
Ground (0V)
14
V
CC
Positive supply voltage
LOGIC SYMBOL
D0
A1
B1
A0
B0
C0
C1
D1
Y0
Y1
6
8
1
2
4
5
9
10
12
13
V
CC
= Pin 14
GND = Pin 7
SA00351
LOGIC DIAGRAM
V
CC
= Pin 14
GND = Pin 7
SA00352
Y0
6
1
2
4
A0
B0
C0
5
D0
Y1
8
9
10
12
A1
B1
C1
13
D1
LOGIC SYMBOL (IEEE/IEC)
SF00068
&
6
8
1
2
4
5
9
10
12
13
FUNCTION TABLE
INPUTS
OUTPUT
An
Bn
Cn
Dn
Yn
L
X
X
X
H
X
L
X
X
H
X
X
L
X
H
X
X
X
L
H
H
H
H
H
L
NOTES:
H = High voltage level
L
= Low voltage level
X = Don't care
ORDERING INFORMATION
PACKAGES
TEMPERATURE RANGE
OUTSIDE NORTH AMERICA
NORTH AMERICA
DWG NUMBER
14-Pin Plastic DIP
40
C to +85
C
74ABT20 N
74ABT20 N
SOT27-1
14-Pin plastic SO
40
C to +85
C
74ABT20 D
74ABT20 D
SOT108-1
14-Pin Plastic SSOP Type II
40
C to +85
C
74ABT20 DB
74ABT20 DB
SOT337-1
14-Pin Plastic TSSOP Type I
40
C to +85
C
74ABT20 PW
74ABT20PW DH
SOT402-1
Philips Semiconductors
Product specification
74ABT20
Dual 4-input NAND gate
1995 Sep 22
2
ABSOLUTE MAXIMUM RATINGS
1, 2
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
DC supply voltage
0.5 to +7.0
V
I
IK
DC input diode current
V
I
< 0
18
mA
V
I
DC input voltage
3
1.2 to +7.0
V
I
OK
DC output diode current
V
O
< 0
50
mA
V
OUT
DC output voltage
3
output in Off or High state
0.5 to +5.5
V
I
OUT
DC output current
output in Low state
40
mA
T
stg
Storage temperature range
65 to 150
C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150
C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
MIN
MAX
UNIT
V
CC
DC supply voltage
4.5
5.5
V
V
I
Input voltage
0
V
CC
V
V
IH
High-level input voltage
2.0
V
V
IL
Low-level input voltage
0.8
V
I
OH
High-level output current
15
mA
I
OL
Low-level output current
20
mA
t/
v
Input transition rise or fall rate
0
10
ns/V
T
amb
Operating free-air temperature range
40
+85
C
DC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
T
amb
= +25
C
T
amb
= 40
C
to +85
C
UNIT
MIN
TYP
MAX
MIN
MAX
V
IK
Input clamp voltage
V
CC
= 4.5V; I
IK
= 18mA
0.9
1.2
1.2
V
V
OH
High-level output voltage
V
CC
= 4.5V; I
OH
= 15mA; V
I
= V
IL
or V
IH
2.5
2.9
2.5
V
V
OL
Low-level output voltage
V
CC
= 4.5V; I
OL
= 20mA; V
I
= V
IL
or V
IH
0.35
0.5
0.5
V
I
I
Input leakage current
V
CC
= 5.5V; V
I
= GND or 5.5V
0.01
1.0
1.0
A
I
OFF
Power-off leakage current
V
CC
= 0.0V; V
O
or V
I
4.5V
5.0
100
100
A
I
CEX
Output High leakage current
V
CC
= 5.5V; V
O
= 5.5V; V
I
= GND or V
CC
5.0
50
50
A
I
O
Output current
1
V
CC
= 5.5V; V
O
= 2.5V
50
75
180
50
180
mA
I
CC
Quiescent supply current
V
CC
= 5.5V; V
I
= GND or V
CC
2
50
50
A
I
CC
Additional supply current per
input pin
2
V
CC
= 5.5V; One data input at 3.4V, other
inputs at V
CC
or GND
0.25
500
500
A
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flop or latch after applying the power.
Philips Semiconductors
Product specification
74ABT20
Dual 4-input NAND gate
1995 Sep 22
3
AC CHARACTERISTICS
GND = 0V; t
R
= t
F
= 2.5ns; C
L
= 50pF, R
L
= 500
SYMBOL
PARAMETER
WAVEFORM
LIMITS
UNIT
SYMBOL
PARAMETER
WAVEFORM
T
amb
= +25
C
V
CC
= +5.0V
T
amb
= 40
C to +85
C
V
CC
= +5.0V
0.5V
UNIT
MIN
TYP
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
An, Bn, Cn, Dn to Yn
1
1.0
1.0
2.7
2.2
3.9
3.4
1.0
1.0
4.6
3.8
ns
t
OSHL
t
OSLH
1
Output to Output skew
An or Bn to Yn
2
0.3
0.5
0.5
ns
NOTE:
1. Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same
device. The specification applies to any outputs switching in the the same direction, either HIGHto-LOW (t
OSHL
) or LOW-to-HIGH (t
OSLH
);
parameter guaranteed by design.
AC WAVEFORMS
V
M
= 1.5V, V
IN
= GND to 3.0V
VM
VM
VM
VM
Yn
An, Bn,
Cn, Dn
tPHL
tPLH
SA00353
Waveform 1.
Propagation Delay for Inverting Outputs
OUTPUT N
same part
INPUT
SA00381
OUTPUT
t
PLH
MIN
t
PHL
MIN
t
PLH
MAX
t
PHL
MAX
t
OSLH
t
OSHL
Waveform 2. Common edge skew
TEST CIRCUIT AND WAVEFORMS
PULSE
GENERATOR
RT
VIN
D.U.T.
VOUT
CL
RL
VCC
Test Circuit for Outputs
VM
VM
tW
AMP (V)
NEGATIVE
PULSE
10%
10%
90%
90%
0V
VM
VM
tW
AMP (V)
POSITIVE
PULSE
90%
90%
10%
10%
0V
tTHL (tF)
tTLH (tR)
tTHL (tF)
tTLH (tR)
V
M
= 1.5V
Input Pulse Definition
DEFINITIONS
R
L
=
Load resistor; see AC CHARACTERISTICS for value.
C
L
=
Load capacitance includes jig and probe capacitance;
see AC CHARACTERISTICS for value.
R
T
=
Termination resistance should be equal to Z
OUT
of
pulse generators.
INPUT PULSE REQUIREMENTS
FAMILY
74ABT
SH00067
Amplitude
Rep. Rate
t
W
t
F
3.0V
1MHz
500ns
2.5ns
t
R
2.5ns