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Электронный компонент: M470L0914ET0

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200pin DDR SDRAM SODIMM
M470L6423CK0
Rev. 0.2 Jan. 2002
512MB DDR SDRAM MODULE
200pin SODIMM
(64Mx64 based on DDP 64Mx 8 DDR SDRAM)
64bit Non-ECC/Parity
Revision 0.2
Jan. 2002
This is to advise Samsung customers that, until August 1, 2003, in accordance with certain terms of an agreement, Samsung is prohibited
from selling any DRAM products configured in "Multi-Die Plastic" format for use as components in general and scientific computers, such as
mainframes, servers, work stations or desk top personal computers (hereinafter "Prohibited Computer Use"). Applications such as mobile,
including cell phones, telecom, including televisions and display monitors, or non-desktop computer systems, including laptops, notebook
computers, are, however, permissible. "Multi-Die Plastic" is defined as two or more Dram die encapsulated within a single plastic leaded
package
200pin DDR SDRAM SODIMM
M470L6423CK0
Rev. 0.2 Jan. 2002
Revision History
Revision 0.0 (August 2001)
1. First release.
Revision 0.1 (Dec. 2001)
- Add derating values for the specifications if the single-ended clock skew rate is less than 1.0V/ns in page 47.
- Revised "Absolute maximum rating" table in page 38.
. Changed "Voltage on VDDQ supply relative to VSS" value from -0.5~3.6V to -1~3.6V
. Changed "power dissipation" value from 1.0W to 1.5W.
- Revised AC parameter table
- Deleted typical current in IDD spec. table
- Included address and control input setup/hold time(tIS/tIH) at slow slew rate in DDR200/266 AC specification
- Deleted Exit self refresh to write command(tXSW) in DDR200/266 AC specification
- Rename tXSA(exit self refresh to bank active command) to tXSNR(exit self refresh to non read command) at DDR200/266
- Rename tXSR(exit self refresh to read command) to tXSRD at DDR200/266
- Rename tWPREH(DQS in hold time) to tWPRE at DDR200/266
- Rename tREF(Refresh interval time) to tREFI at DDR200/266
- Changed tWR value from 2tCK to 15ns.
--Rename tCDLR(Write data out to Read command) t0 tWTR
- Added tDAL(tWR+tRP)
Revision 0.2 (Jan, 2002)
1. Added tRAP(Active to Read w/ autoprecharge command)
From
To
DDR266A
DDR266B
DDR200
DDR266A
DDR266B
DDR200
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
tHZ
tACmin
-400ps
tACmax
-400ps
tACmin
-400ps
tACmax
-400ps
tACmin
-400ps
tACmax
-400ps
-0.75
+0.75
-0.75
+0.75
-0.8
+0.8
tLZ
tACmin
-400ps
tACmax
-400ps
tACmin
-400ps
tACmax
-400ps
tACmin
-400ps
tACmax
-400ps
-0.75
+0.75
-0.75
+0.75
-0.8
+0.8
tWPST
(tCK)
0.25
0.25
0.25
0.4
0.6
0.4
0.6
0.4
0.6
tPDEX
10ns
10ns
10ns
7.5ns
7.5ns
10ns
200pin DDR SDRAM SODIMM
M470L6423CK0
Rev. 0.2 Jan. 2002
GENERAL DESCRIPTION
PIN DESCRIPTION
* These pins are not used in this module.
Pin Name
Function
A0 ~ A12
Address input (Multiplexed)
BA0 ~ BA1
Bank Select Address
DQ0 ~ DQ63
Data input/output
DQS0 ~ DQS7
Data Strobe input/output
CK0~ CK2,
CK0 ~ CK2
Clock input
CKE0 ~ CKE1
Clock enable input
CS0 ~ CS1
Chip select input
RAS
Row address strobe
CAS
Column address strobe
WE
Write enable
DM0 ~ DM7
Data - in mask
VDD
Power supply (2.5V)
VDDQ
Power Supply for DQS(2.5V)
VSS
Ground
VREF
Power supply for reference
VDDSPD
Serial EEPROM Power
Supply ( 2.3V to 3.6V)
SDA
Serial data I/O
SCL
Serial clock
SA0 ~ 2
Address in EEPROM
VDDID
VDD identification flag
NC
No connection
SAMSUNG ELECTRONICS CO., Ltd. reserves the right to change products and specifications without notice.
M470L6423CK0 200pin DDR SDRAM SODIMM
64Mx64 200pin DDR SDRAM SODIMM based on DDP 64Mx8
The Samsung M470L6423CK0 is 64M bit x 64 Double Data
Rate SDRAM high density memory modules.
The Samsung M470L6423CK0 consists of eight CMOS DDP
64M x 8 bit with 4banks Double Data Rate SDRAMs in 54pin
TSOP-II(400mil) packages mounted on a 200pin glass-epoxy
substrate. Four 0.1uF decoupling capacitors are mounted on
the printed circuit board in parallel for each DDR SDRAM.
The M470L6423CK0 is Dual In-line Memory Modules and
intended for mounting into 200pin edge connector sockets.
Synchronous design allows precise cycle control with the use
of system clock. Data I/O transactions are possible on both
edges of DQS. Range of operating frequencies, programmable
latencies and burst lengths allow the same device to be useful
for a variety of high bandwidth, high performance memory sys-
tem applications.
Performance range
Power supply : Vdd: 2.5V
0.2V, Vddq: 2.5V
0.2V
Double-data-rate architecture; two data transfers per clock cycle
Bidirectional data strobe(DQS)
Differential clock inputs(CK and CK )
DLL aligns DQ and DQS transition with CK transition
Programmable Read latency 2, 2.5 (clock)
Programmable Burst length (2, 4, 8)
Programmable Burst type (sequential & interleave)
Edge aligned data output, center aligned data input
Auto & Self refresh, 7.8us refresh interval(8K/64ms refresh)
Serial presence detect with EEPROM
PCB : Height 1250 mil, double sided component
Part No.
Max Freq.
Interface
M470L6423CK0-C(L)B3 166MHz(6ns@CL=2.5)
SSTL_2
M470L6423CK0-C(L)A2 133MHz(7.5ns@CL=2)
M470L6423CK0-C(L)B0 133MHz(7.5ns@CL=2.5)
M470L6423CK0-C(L)A0 100MHz(10ns@CL=2)
FEATURE
PIN CONFIGURATIONS (Front side/back side)
Pin
Front
Pin
Front
Pin
Front
Pin
Back
Pin
Back
Pin
Back
1
3
5
7
9
11
13
15
17
19
21
23
25
27
29
31
33
35
37
39
41
43
45
47
49
51
53
55
57
59
61
63
65
VREF
VSS
DQ0
DQ1
VDD
DQS0
DQ2
VSS
DQ3
DQ8
VDD
DQ9
DQS1
VSS
DQ10
DQ11
VDD
CK0
/CK0
VSS
DQ16
DQ17
VDD
DQS2
DQ18
VSS
DQ19
DQ24
VDD
DQ25
DQS3
VSS
DQ26
67
69
71
73
75
77
79
81
83
85
87
89
91
93
95
97
99
101
103
105
107
109
111
113
115
117
119
121
123
125
127
129
131
133
DQ27
VDD
CB0
CB1
VSS
DQS8
CB2
VDD
CB3
DU
VSS
CK2
/CK2
VDD
CKE1
DU
A12
A9
VSS
A7
A5
A3
A1
VDD
A10/AP
BA0
/WE
/S0
DU(A13)
VSS
DQ32
DQ33
VDD
DQS4
135
137
139
141
143
145
147
149
151
153
155
157
159
161
163
165
167
169
171
173
175
177
179
181
183
185
187
189
191
193
195
197
199
DQ34
VSS
DQ35
DQ40
VDD
DQ41
DQS5
VSS
DQ42
DQ43
VDD
VDD
VSS
VSS
DQ48
DQ49
VDD
DQS6
DQ50
VSS
DQ51
DQ56
VDD
DQ57
DQS7
VSS
DQ58
DQ59
VDD
SDA
SCL
VDDSPD
VDDID
2
4
6
8
10
12
14
16
18
20
22
24
26
28
30
32
34
36
38
40
42
44
46
48
50
52
54
56
58
60
62
64
66
VREF
VSS
DQ4
DQ5
VDD
DM0
DQ6
VSS
DQ7
DQ12
VDD
DQ13
DM1
VSS
DQ14
DQ15
VDD
VDD
VSS
VSS
DQ20
DQ21
VDD
DM2
DQ22
VSS
DQ23
DQ28
VDD
DQ29
DM3
VSS
DQ30
68
70
72
74
76
78
80
82
84
86
88
90
92
94
96
98
100
102
104
106
108
110
112
114
116
118
120
122
124
126
128
130
132
134
DQ31
VDD
CB4
CB5
VSS
DM8
CB6
VDD
CB7
DU/(RESET)
VSS
VSS
VDD
VDD
CKE0
DU(BA2)
A11
A8
VSS
A6
A4
A2
A0
VDD
BA1
/RAS
/CAS
/S1
DU
VSS
DQ36
DQ37
VDD
DM4
136
138
140
142
144
146
148
150
152
154
156
158
160
162
164
166
168
170
172
174
176
178
180
182
184
186
188
190
192
194
196
198
200
DQ38
VSS
DQ39
DQ44
VDD
DQ45
DM5
VSS
DQ46
DQ47
VDD
/CK1
CK1
VSS
DQ52
DQ53
VDD
DM6
DQ54
VSS
DQ55
DQ60
VDD
DQ61
DM7
VSS
DQ62
DQ63
VDD
SA0
SA1
SA2
D U
Key
Key
200pin DDR SDRAM SODIMM
M470L6423CK0
Rev. 0.2 Jan. 2002
CKE0
I/0 0
I/0 1
I/0 2
I/0 3
I/0 4
I/0 5
I/0 6
I/0 7
D0
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQS
S0
A0 - A13
A0-A13: DDR SDRAMs D0 - D7
BA0 - BA1
BA0-BA1: DDR SDRAMs D0 - D7
RAS
RAS: SDRAMs D0 - D7
CAS
CAS: SDRAMs D0 - D7
WE
WE: SDRAMs D0 - D7
A0
Serial PD
A1
A2
SA0
SA1
SA2
SCL
SDA
WP
V
S S
D0 - D7
D0 - D7
V
DD
/V
DDQ
D0 - D7
D0 - D7
VREF
V
DDID
Strap: see Note 4
V
DDSPD
SPD
Clock Wiring
Clock
Input
SDRAMs
CK0/ CK0
CK1/ CK1
CK2/ CK2
4 SDRAMs
4 SDRAMs
NC
DM
DQS0
DM0
*Clock Net Wiring
Card
Edge
Dram1
Dram2
R=120
5%
CK
CK
Dram3
Dram4
I/0 0
I/0 1
I/0 2
I/0 3
I/0 4
I/0 5
I/0 6
I/0 7
D4
DQS
S0
DM
DQS4
DM4
I/0 0
I/0 1
I/0 2
I/0 3
I/0 4
I/0 5
I/0 6
I/0 7
D1
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQS
S1
DM
DQS1
DM1
I/0 0
I/0 1
I/0 2
I/0 3
I/0 4
I/0 5
I/0 6
I/0 7
D5
DQS
S1
DM
DQS5
DM5
I/0 0
I/0 1
I/0 2
I/0 3
I/0 4
I/0 5
I/0 6
I/0 7
D2
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQS
S0
DM
DQS2
DM2
I/0 0
I/0 1
I/0 2
I/0 3
I/0 4
I/0 5
I/0 6
I/0 7
D6
DQS
S0
DM
DQS6
DM6
I/0 0
I/0 1
I/0 2
I/0 3
I/0 4
I/0 5
I/0 6
I/0 7
D3
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQS
S1
DM
DQS3
DM3
I/0 0
I/0 1
I/0 2
I/0 3
I/0 4
I/0 5
I/0 6
I/0 7
D7
DQS
S1
DM
DQS7
DM7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
CKE1
S1
S1
S0
S0
S1
S1
S0
S0
S0
S1
CKE0 CKE1
CKE0 CKE1
CKE1 CKE0
CKE1 CKE0
CKE0 CKE1
CKE0 CKE1
CKE1 CKE0
CKE1 CKE0
Notes:
1. DQ-to-I/O wiring is shown as recom-
mended but may be changed.
2. DQ/DQS/DM/CKE/CS relationships must
be maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms.
FUNCTIONAL BLOCK DIAGRAM
200pin DDR SDRAM SODIMM
M470L6423CK0
Rev. 0.2 Jan. 2002
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
Note :
POWER & DC OPERATING CONDITIONS (SSTL_2 In/Out)
Notes 1. Includes
25mV margin for DC offset on V
REF
, and a combined total of
50mV margin for all AC noise and DC offset on V
REF
,
bandwidth limited to 20MHz. The DRAM must accommodate DRAM current spikes on V
REF
and internal DRAM noise coupled
TO V
REF
, both of which may result in V
REF
noise. V
REF
should be de-coupled with an inductance of
3nH.
2.V
TT
is not applied directly to the device. V
T T
is a system supply for signal termination resistors, is expected to be set equal to
V
REF
, and must track variations in the DC level of V
REF
3. V
I D
is the magnitude of the difference between the input level on CK and the input level on CK.
4. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in
simulation. The AC and DC input specifications are relative to a VREF envelop that has been bandwidth limited to 200MHZ.
5. The value of V
IX
is expected to equal 0.5*V
DDQ
of the transmitting device and must track variations in the dc level of the same.
6. These charactericteristics obey the SSTL-2 class II standards.
Recommended operating conditions(Voltage referenced to V
SS
=0V, T
A
=0 to 70
C)
Parameter
Symbol
Min
Max
Unit
Note
Supply voltage(for device with a nominal V
DD
of 2.5V)
V
DD
2.3
2.7
I/O Supply voltage
V
DDQ
2.3
2.7
V
I/O Reference voltage
V
REF
VDDQ/2-50mV
VDDQ/2+50mV
V
1
I/O Termination voltage(system)
V
TT
V
REF
-0.04
V
REF
+0.04
V
2
Input logic high voltage
V
I H
(DC)
V
REF
+0.15
V
DDQ
+0.3
V
4
Input logic low voltage
V
IL
(DC)
-0.3
V
REF
-0.15
V
4
Input Voltage Level, CK and CK inputs
V
I N
(DC)
-0.3
V
DDQ
+0.3
V
Input Differential Voltage, CK and CK inputs
V
I D
(DC)
0.3
V
DDQ
+0.6
V
3
Input crossing point voltage, CK and CK inputs
V
IX
(DC)
1.15
1.35
V
5
Input leakage current
I
I
-2
2
uA
Output leakage current
I
O Z
-5
5
uA
Output High Current(Normal strengh driver)
;V
OUT
= V
T T
+ 0.84V
I
OH
-16.8
mA
Output High Current(Normal strengh driver)
;V
OUT
= V
T T
- 0.84V
I
OL
16.8
mA
Output High Current(Half strengh driver)
;V
OUT
=
V
T T
+ 0.45V
I
OH
-9
mA
Output High Current(Half strengh driver)
;V
OUT
= V
T T
- 0.45V
I
OL
9
mA
Parameter
Symbol
Value
Unit
Voltage on any pin relative to V
SS
V
IN
, V
OUT
-0.5 ~ 3.6
V
Voltage on V
DD
& V
DDQ
supply relative to V
SS
V
DD
, V
DDQ
-1.0 ~ 3.6
V
Storage temperature
T
STG
-55 ~ +150
C
Power dissipation
P
D
24
W
Short circuit current
I
OS
50
mA
Absolute Maximum Rate