1
SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
DESCRIPTION...
The SP486E and SP487E are low-power quad differential line drivers that meet the
specifications of RS-485 and RS-422 serial protocols with enhanced ESD performance. The
ESD tolerance has been improved on these devices to over +15kV for both Human Body
Model and IEC1000-4-2 Air Discharge Method. These devices are superior drop-in replace-
ments to Sipex's SP486 and SP487 devices as well as popular industry standards. As with
the original versions, the SP486E features a common driver enable control and the SP487E
provides independent driver enable controls for each pair of drivers. Both feature wide
common-mode input ranges. Both are available in 16-pin plastic DIP and SOIC packages.
s
RS-485 or RS-422 Applications
s
Quad Differential Line Drivers
s
Driver Output Disable
s
7V to +12V Common Mode Output
Range
s
100
A Supply Current
s
Single +5V Supply Operation
s
Superior Drop-in Replacement for
SN75172, SN75174, LTC486, and
LTC487
s
Improved ESD Specifications:
+15kV Human Body Model
+15kV IEC1000-4-2 Air Discharge
+8kV IEC1000-4-2 Contact Discharge
1
2
3
4
SP487E
DI
1
DO
1
A
DO
1
B
EN
1
/EN
2
DO
2
B
DO
2
A
DI
2
GND
V
CC
DI
4
DO
4
A
DO
4
B
EN
3
/EN
4
DO
3
B
DO
3
A
DI
3
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
1
2
3
4
SP486E
DI
1
DO
1
A
DO
1
B
EN
DO
2
B
DO
2
A
DI
2
GND
V
CC
DI
4
DO
4
A
DO
4
B
EN
DO
3
B
DO
3
A
DI
3
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
SP486E and SP487E
Enhanced Quad RS-485/RS-422 Line Drivers
2
SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
ABSOLUTE MAXIMUM RATINGS
These are stress ratings only and functional operation
of the device at these or any other above those indicated
in the operation sections of the specifications below is
not implied. Exposure to absolute maximum rating
conditions for extended periods of time may affect
reliability.
V
CC
.................................................................. +7V
Input Voltages
Logic .................................... 0.5V to (V
CC
+0.5V)
Drivers ................................. 0.5V to (V
CC
+0.5V)
Driver Output Voltage ................................... +14V
Input Currents
Logic ........................................................ +25mA
Driver ....................................................... +25mA
Storage Temperature ................. 65
C to +150
C
Power Dissipation
Plastic DIP .............................................. 375mW
(derate 7mW/
C above +70
C)
Small Outline .......................................... 375mW
(derate 7mW/
C above +70
C)
Lead Temperature (soldering, 10 sec) ......... 300
C
SPECIFICATIONS
V
CC
= 5V
5%; typicals at 25
C; T
MIN
T
A
T
MAX
unless otherwise noted.
PARAMETER
MIN.
TYP.
MAX.
UNIT
CONDITIONS
DC CHARACTERISTICS
Digital Inputs
DI, EN, EN, EN
1
/EN
2
, EN
3
/EN
4
Voltage
V
IL
0.8
Volts
V
IH
2.0
Volts
Input Current
+2
A
V
IN
= 0V to V
CC
DRIVER OUTPUTS
Differential Voltage
V
CC
Volts
I
O
= 0; unloaded
2
Volts
R
L
= 50
(RS-422)
1.5
2
V
CC
Volts
R
L
= 27
(RS-485);
Fig.
1
Change in Output Magnitude
0.2
Volts
R
L
= 27
or 50
;
Fig.
1
for Complementary Output State
Common Mode Output Voltage
2.3
3
Volts
R
L
= 27
or 50
;
Fig.
1
Change in Common Mode Output Magnitude
0.2
Volts
R
L
= 27
or 50
;
Fig.
1
for Complementary Output State
R
L
= 50
(RS-422)
R
L
= 27
(RS-485)
Maximum Data Rate
10
Mbps
Shortcircuit Current
V
OH
+250
mA
7V
V
O
+12V
V
OL
+250
mA
7V
V
O
+12V
High Impedance Output Current
+2
+200
A
V
O
= 7V to +12V
POWER REQUIREMENTS
Supply Voltage
4.75
5.00
5.25
Volts
Supply Current
0.5
10
mA
No load, output enabled
0.5
10
A
No load, output disabled
ENVIRONMENTAL AND MECHANICAL
Operating Temperature
C
0
+70
C
E
40
+85
C
Storage Temperature
65
+150
C
Package
_P
16pin Plastic DIP
_T
16pin SOIC
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SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
PINOUT -- SP486E
1
2
3
4
SP486E
DI
1
DO
1
A
DO
1
B
EN
DO
2
B
DO
2
A
DI
2
GND
V
CC
DI
4
DO
4
A
DO
4
B
EN
DO
3
B
DO
3
A
DI
3
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
A
B
R
DIFF
C
L1
C
L2
EN
EN
DI
DRIVER
Figure 2. Driver Timing Test
V
OC
V
DO
A
B
R
R
Figure 1. Driver DC Test Load
S
1
OUTPUT
UNDER TEST
S
2
V
CC
500 ohms
C
L
Figure 3. Driver Timing Test Load
SP486E PINOUT
Pin 1 -- DI
1
-- Driver 1 Input -- If Driver 1
output is enabled, logic 0 on DI
1
forces driver
output DO
1
A low and DO
1
B high. A logic 1 on
DI
1
with Driver 1 output enabled forces driver
DO
1
A high and DO
1
B low.
Pin 2 -- DO
1
A -- Driver 1 output A.
Pin 3 -- DO
1
B -- Driver 1 output B.
Pin 4 -- EN -- Driver Output Enable. Please
refer to SP486E Truth Table (1).
Pin 5 -- DO2B -- Driver 2 output B.
Pin 6 -- DO
2
A -- Driver 2 output A.
Pin 7 -- DI
2
-- Driver 2 Input -- If Driver 2
output is enabled, logic 0 on DI
2
forces driver
output DO
2
A low and DO
2
B high. A logic 1 on
DI
2
with Driver 2 output enabled forces driver
DO
2
A high and DO
2
B low.
Pin 8 -- GND -- Digital Ground.
Pin 9 -- DI
3
-- Driver 3 Input -- If Driver 3
output is enabled, logic 0 on DI
3
forces driver
output DO
3
A low and DO
3
B high. A logic 1 on
DI
3
with Driver 3 output enabled forces driver
DO
3
A high and DO
3
B low.
Pin 10 -- DO
3
A -- Driver 3 output A.
Pin 11 -- DO
3
B -- Driver 3 output B.
Pin 12 -- EN -- Driver Output Disable. Please
refer to SP486E Truth Table (1).
Pin 13 -- DO
4
B -- Driver 4 output B.
Pin 14 -- DO
4
A -- Driver 4 output A.
Pin 15 -- DI
4
-- Driver 4 Input -- If Driver 4
output is enabled, logic 0 on DI
4
forces driver
output DO
4
A low and DO
4
B high. A logic 1 on
DI
4
with Driver 3 output enabled forces driver
DO
4
A high and DO
4
B low.
Pin 16 -- Supply Voltage V
CC
-- 4.75V
V
CC
5.25V.
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SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
PINOUT -- SP487E
1
2
3
4
SP487E
DI
1
DO
1
A
DO
1
B
EN
1
/EN
2
DO
2
B
DO
2
A
DI
2
GND
V
CC
DI
4
DO
4
A
DO
4
B
EN
3
/EN
4
DO
3
B
DO
3
A
DI
3
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
SP487E PINOUT
Pin 1 -- DI
1
-- Driver 1 Input -- If Driver 1
output is enabled, logic 0 on DI
1
forces driver
output DO
1
A low and DO
1
B high. A logic 1 on
DI
1
with Driver 1 output enabled forces driver
DO
1
A high and DO
1
B low.
Pin 2 -- DO
1
A -- Driver 1 output A.
Pin 3 -- DO
1
B -- Driver 1 output B.
Pin 4 -- EN
1
/EN
2
-- Driver 1 and 2 Output
Enable. Please refer to SP487E Truth Table (2).
Pin 5 -- DO
2
B -- Driver 2 output B.
Pin 6 -- DO
2
A -- Driver 2 output A.
Pin 7 -- DI
2
-- Driver 2 Input -- If Driver 2
output is enabled, logic 0 on DI
2
forces driver
output DO
2
A low and DO
2
B high. A logic 1 on
DI
2
with Driver 2 output enabled forces driver
DO
2
A high and DO
2
B low.
Pin 8 -- GND -- Digital Ground.
Pin 9 -- DI
3
-- Driver 3 Input -- If Driver 3
output is enabled, logic 0 on DI
3
forces driver
output DO
3
A low and DO
3
B high. A logic 1 on
DI
3
with Driver 3 output enabled forces driver
DO
3
A high and DO
3
B low.
Pin 10 -- DO
3
A -- Driver 3 output A.
INPUT
ENABLES
OUTPUTS
DI
EN
EN
OUTA
OUTB
H
H
X
H
L
L
H
X
L
H
H
X
L
H
L
L
X
L
L
H
X
L
H
HiZ
HiZ
Table 1. SP486E Truth Table
INPUT
ENABLES
OUTPUTS
DI
EN1/EN2 or EN3/EN4
OUTA
OUTB
H
H
H
L
L
H
L
H
X
L
HiZ
HiZ
Table 2. SP487E Truth Table
Pin 11 -- DO
3
B -- Driver 3 output B.
Pin 12 -- EN
3
/EN
4
-- Driver 3 and 4 Output
Enable. Please refer to SP487E Truth Table (2).
Pin 13 -- DO
4
B -- Driver 4 output B.
Pin 14 -- DO
4
A -- Driver 4 output A.
Pin 15 -- DI
4
-- Driver 4 Input -- If Driver 4
output is enabled, logic 0 on DI
4
forces driver
output DO
4
A low and DO
4
B high. A logic 1 on
DI
4
with Driver 3 output enabled forces driver
DO
4
A high and DO
4
B low.
Pin 16 -- Supply Voltage V
CC
-- 4.75V
V
CC
5.25V.
FEATURES...
The SP486E and SP487E are lowpower quad
differential line drivers meeting RS-485 and
RS-422 standards. The SP486E features active
high and active low common driver enable
controls; the SP487E provides independent,
active high driver enable controls for each pair
of drivers. The driver outputs are shortcircuit
limited to 200mA. Data rates up to 10Mbps are
supported. Both are available in 16pin plastic
DIP and SOIC packages.
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SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
Figure 4. Driver Propagation Delays
3V
0V
B
A
V
O
V
O
V
O
V
O
1
2
t
r
t
f
10%
90%
90%
10%
V
O
1
2
V
DIFF
= V(A) V(B)
F = 1MHZ: t
r
< 10ns: t
f
< 10ns
t
PLH
t
PHL
DI
1.5V
1.5V
AC PARAMETERS
V
CC
= 5V
5%; typicals at 25
C; T
AMB
= 25
C unless otherwise noted.
PARAMETER
MIN.
TYP.
MAX.
UNIT
CONDITIONS
PROPAGATION DELAY
Driver Input to Output
R
DIFF
= 54 Ohms, C
L1
= C
L2
=
100pF;
Figure 2
Low to High (t
PLH
)
20
40
60
ns
High to Low (t
PHL
)
20
40
60
ns
Differential Skew (t
SKEW
)
5
15
ns
t
SKEW
= t
PLH
- t
PHL
Driver Rise Time (t
R
)
10% to 90%
SP486E
20
ns
SP487E
20
ns
Driver Fall Time (t
F
)
90% to 10%
SP486E
20
ns
SP487E
20
ns
DRIVER ENABLE
To Output High
60
110
ns
C
L
= 100pF;
Figures 3 and 5
(S
2
closed)
To Output Low
60
115
ns
C
L
= 100pF;
Figures 3 and 5
(S
1
closed)
DRIVER DISABLE
From Output Low
60
130
ns
C
L
= 15pF;
Figures 3 and 5
(S
1
closed)
From Output High
60
130
ns
C
L
= 15pF;
Figures 3 and 5
(S
2
closed)
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SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
3V
0V
5V
V
OH
0V
V
O
Output normally low
F = 1MHZ: t
r
< 10ns: t
f
< 10ns
t
ZL
t
LZ
EN
V
OL
1.5V
1.5V
2.3V
A, B
0.5V
t
ZH
2.3V
0.5V
t
HZ
Output normally high
Figure 5. Driver Enable/Disable Timing
R
R
C
C
C
C
S
S
R
R
S
S
SW1
SW1
SW2
SW2
R
C
Device
Under
Test
DC Power
Source
C
S
R
S
SW1
SW2
Figure 6. ESD Test Circuit for Human Body Model
R
RS
S and
and R
RV
V add up to 330
add up to 330
f
for IEC1000-4-2.
or IEC1000-4-2.
RS and RV add up to 330
for IEC1000-4-2.
Contact-Discharge Module
Contact-Discharge Module
R
R
V
V
R
R
C
C
C
C
S
S
R
R
S
S
SW1
SW1
SW2
SW2
R
C
Device
Under
Test
DC Power
Source
C
S
R
S
SW1
SW2
R
V
Contact-Discharge Module
Figure 7. ESD Test Circuit for IEC1000-4-2
V
CC
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SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
ESD TOLERANCE
The SP486E and SP487E devices incorporate
ruggedized ESD cells on all driver output and
receiver input pins. The ESD structure is
improved over our previous family for more
rugged applications and environments sensitive
to electro-static discharges and associated
transients. The improved ESD tolerance is at
least +15kV without damage nor latch-up.
There are different methods of ESD testing
applied:
a) MIL-STD-883, Method 3015.7
b) IEC1000-4-2 Air-Discharge
c) IEC1000-4-2 Direct Contact
The Human Body Model has been the generally
accepted ESD testing method for semiconductors.
This method is also specified in MIL-STD-883,
Method 3015.7 for ESD testing. The premise of
this ESD test is to simulate the human body's
potential to store electro-static energy and
discharge it to an integrated circuit. The
simulation is performed by using a test model as
shown in Figure 6. This method will test the IC's
capability to withstand an ESD transient during
normal handling such as in manufacturing areas
where the ICs tend to be handled frequently.
The IEC-1000-4-2, formerly IEC801-2, is
generally used for testing ESD on equipment and
systems. For system manufacturers, they must
guarantee a certain amount of ESD protection
since the system itself is exposed to the outside
environment and human presence. The premise
with IEC1000-4-2 is that the system is required
to withstand an amount of static electricity when
ESD is applied to points and surfaces of the
equipment that are accessible to personnel during
normal usage. The transceiver IC receives most
of the ESD current when the ESD source is
applied to the connector pins. The test circuit for
IEC1000-4-2 is shown on Figure 7. There are
two methods within IEC1000-4-2, the Air
Discharge method and the Contact Discharge
method.
Figure 8. ESD Test Waveform for IEC1000-4-2
t=0ns
t=30ns
0A
15A
30A
t
i
With the Air Discharge Method, an ESD voltage
is applied to the equipment under test (EUT)
through air. This simulates an electrically charged
person ready to connect a cable onto the rear of
the system only to find an unpleasant zap just
before the person touches the back panel. The
high energy potential on the person discharges
through an arcing path to the rear panel of the
system before he or she even touches the system.
This energy, whether discharged directly or
through air, is predominantly a function of the
discharge current rather than the discharge
voltage. Variables with an air discharge such as
approach speed of the object carrying the ESD
potential to the system and humidity will tend to
change the discharge current. For example, the
rise time of the discharge current varies with the
approach speed.
The Contact Discharge Method applies the ESD
current directly to the EUT. This method was
devised to reduce the unpredictability of the
ESD arc. The discharge current rise time is
constant since the energy is directly transferred
without the air-gap arc. In situations such as
hand held systems, the ESD charge can be directly
discharged to the equipment from a person already
holding the equipment. The current is transferred
on to the keypad or the serial port of the equipment
directly and then travels through the PCB and finally
to the IC.
8
SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
The circuit model in Figures 6 and 7 represent
the typical ESD testing circuit used for all three
methods. The C
S
is initially charged with the DC
power supply when the first switch (SW1) is on.
Now that the capacitor is charged, the second
switch (SW2) is on while SW1 switches off. The
voltage stored in the capacitor is then applied
through R
S
, the current limiting resistor, onto the
device under test (DUT). In ESD tests, the SW2
switch is pulsed so that the device under test
receives a duration of voltage.
For the Human Body Model, the current limiting
resistor (R
S
) and the source capacitor (C
S
) are
1.5kW an 100pF, respectively. For IEC-1000-4-2,
the current limiting resistor (R
S
) and the source
capacitor (C
S
) are 330W an 150pF, respectively.
The higher C
S
value and lower R
S
value in the
IEC1000-4-2 model are more stringent than the
Human Body Model. The larger storage capacitor
injects a higher voltage to the test point when
SW2 is switched on. The lower current limiting
resistor increases the current charge onto the test
point.
DEVICE PIN
HUMAN BODY
IEC1000-4-2
TESTED
MODEL Air Discharge Direct Contact Level
Driver Outputs
+15kV
+15kV
+8kV
4
Receiver Inputs
+15kV
+15kV
+8kV
4
Table 3. Transceiver ESD Tolerance Levels
9
SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
D
ALTERNATE
END PINS
(BOTH ENDS)
D1 = 0.005" min.
(0.127 min.)
E
PACKAGE: PLASTIC
DUALINLINE
(NARROW)
DIMENSIONS (Inches)
Minimum/Maximum
(mm)
A = 0.210" max.
(5.334 max).
E1
C
L
A2
A1 = 0.015" min.
(0.381min.)
B
B1
e = 0.100 BSC
(2.540 BSC)
e
A
= 0.300 BSC
(7.620 BSC)
A2
B
B1
C
D
E
E1
L
16PIN
0.115/0.195
(2.921/4.953)
0.014/0.022
(0.356/0.559)
0.045/0.070
(1.143/1.778)
0.008/0.014
(0.203/0.356)
0.780/0.800
(19.812/20.320)
0.300/0.325
(7.620/8.255)
0.240/0.280
(6.096/7.112)
0.115/0.150
(2.921/3.810)
0/ 15
(0/15)
10
SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
D
E
H
PACKAGE: PLASTIC
SMALL OUTLINE (SOIC)
(WIDE)
DIMENSIONS (Inches)
Minimum/Maximum
(mm)
A
A1
L
B
e
A
A1
B
D
E
e
H
L
16PIN
0.093/0.104
(2.352/2.649)
0.004/0.012
(0.102/0.300)
0.013/0.020
(0.330/0.508)
0.398/0.413
(10.10/10.49)
0.291/0.299
(7.402/7.600)
0.050 BSC
(1.270 BSC)
0.394/0.419
(10.00/10.64)
0.016/0.050
(0.406/1.270)
0/8
(0/8)
11
SP486E/487EDS/06 SP486E/487E Enhanced Quad RS-485/RS-422 Line Drivers Copyright 2000 Sipex Corporation
ORDERING INFORMATION
Quad RS485 Drivers:
Model .................................. Enable/Disable ........................ Temperature Range ......................... Package
SP486ECP ....... Common; active Low and Active High ............ 0
C to +70
C .................. 16pin Plastic DIP
SP486ECT ........ Common; active Low and Active High ............ 0
C to +70
C ........................... 16pin SOIC
SP486EEP ........ Common; active Low and Active High .......... 40
C to +85
C ................ 16pin Plastic DIP
SP486EET ........ Common; active Low and Active High .......... 40
C to +85
C ......................... 16pin SOIC
SP487ECP ............ One per driver pair; active High ................. 0
C to +70
C .................. 16pin Plastic DIP
SP487ECT ............. One per driver pair; active High ................. 0
C to +70
C ........................... 16pin SOIC
SP487EEP ............. One per driver pair; active High ............... 40
C to +85
C ................ 16pin Plastic DIP
SP487EET ............. One per driver pair; active High ............... 40
C to +85
C ......................... 16pin SOIC
Sipex Corporation reserves the right to make changes to any products described herein. Sipex does not assume any liability arising out of the
application or use of any product or circuit described hereing; neither does it convey any license under its patent rights nor the rights of others.
Corporation
SIGNAL PROCESSING EXCELLENCE
Please consult the factory for pricing and availability on a Tape-On-Reel option.
Sipex Corporation
Headquarters and
Sales Office
22 Linnell Circle
Billerica, MA 01821
TEL: (978) 667-8700
FAX: (978) 670-9001
e-mail: sales@sipex.com
Sales Office
233 South Hillview Drive
Milpitas, CA 95035
TEL: (408) 934-7500
FAX: (408) 935-7600
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