WM2604
Quad 10-Bit Serial Input Voltage Output DAC
Production Data, June 1999, Rev 1.0
WOLFSON MICROELECTRONICS LTD
Lutton Court, Bernard Terrace, Edinburgh, EH8 9NX, UK
Tel: +44 (0) 131 667 9386
Fax: +44 (0) 131 667 5176
Email: sales@wolfson.co.uk
http://www.wolfson.co.uk
Production Data Datasheets contain final
specifications current on publication date.
Supply of products conforms to Wolfson
Microelectronics' Terms and Conditions.
1999 Wolfson Microelectronics Ltd
.
FEATURES
Four 10-bit voltage output DACs
Dual 2.7V to 5.5V supply (separate digital and analogue
supplies)
DNL
0.1 LSB, INL
0.4 LSB
Low power consumption:
-
5.5mW, slow mode - 5V supply
-
3.3mW, slow mode - 3V supply
TMS320, (Q)SPI
TM
TM
, and Microwire
TM
TM
compatible serial
interface
Programmable settling time of 4
s or 12
s typical
APPLICATIONS
Battery powered test instruments
Digital offset and gain adjustment
Battery operated/remote industrial controls
Machine and motion control devices
Wireless telephone and communication systems
Speech synthesis
Arbitrary waveform generation
ORDERING INFORMATION
DEVICE
TEMP. RANGE
PACKAGE
WM2604CDT
0 to 70C
16-pin TSSOP
WM2604IDT
-40 to 85C
16-pin TSSOP
DESCRIPTION
The WM2604 is a quadruple 10-bit voltage output, resistor string,
digital-to-analogue converter. Each DAC can be individually
powered down under software control. A hardware controlled mode
is provided that powers down all DACs. Power down reduces
current consumption to 10nA.
The device has been designed to interface efficiently to industry
standard microprocessors and DSPs, including the TMS320
family. The WM2604 is programmed with a 16-bit serial word
comprising of a DAC address, individual DAC control bits and a
10-bit value.
The WM2604 has provision for two supplies: one supply for the
serial interface (DVDD, DGND), and one for the DACs, reference
buffers and output buffers (AVDD, AGND). This enables a typical
application where the device can be controlled via a
microprocessor operating on a 3V supply, with the DACs operating
on a 5V supply. Alternatively, the supplies can be tied together in a
single supply application.
Excellent performance is delivered with a typical DNL of
0.1 LSB.
The settling time of the DAC is programmable to allow the designer
to optimize speed versus power dissipation. The output stage is
buffered by a x2 gain near rail-to-rail amplifier, which features a
Class AB output stage. DACs A and B can have a different
reference voltage to DACs C and D.
The device is available in a 16-pin TSSOP package. Commercial
temperature (0
to 70
C) and Industrial temperature (-40
to 85
C)
variants are supported.
BLOCK DIAGRAM
TYPICAL PERFORMANCE
(11) OUTD
(12) OUTC
(13) OUTB
(14) OUTA
12-BIT
DATA AND
CONTROL
HOLDING
LATCH
10-BIT
DAC
LATCH
16-BIT
SHIFT
REGISTER
AND
CONTROL
LOGIC
REFINAB (15)
POWER-ON
RESET
DIN (4)
FS (7)
SCLK (5)
NCS (6)
(9)
AGND
(8)
DGND
(3)
NLDAC
(2)
NPD
AVDD
(16)
DVDD
(1)
X2
DAC A
DAC C
DAC D
POWERDOWN/
SPEED
CONTROL
WM2604
2-BIT
CONTROL
LATCH
REFINCD (10)
DAC B
X1
DAC
OUTPUT
BUFFER
data
REFERENCE
INPUT BUFFER
AVDD = DVDD =5V, V
REF
= 2.048V, Speed = Fast mode, Load = 10k/100pF
-1
-0.8
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
1
0
256
512
767
1023
CODE
DNL (LSB)
WM2604
Production Data
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 June 1999
2
PIN CONFIGURATION
12
11
10
16
15
14
13
5
6
7
1
2
3
4
REFINCD
OUTD
OUTC
OUTB
OUTA
AVDD
REFINAB
FS
NCS
SCLK
DIN
NLDAC
DVDD
NPD
8
DGND
9
AGND
PIN DESCRIPTION
PIN NO
NAME
TYPE
DESCRIPTION
1
DVDD
Supply
Digital supply.
2
NPD
Digital input
Power down. Powers down all DACs overriding their individual power down
settings and all output stages. This pin is active low.
3
NLDAC
Digital input
Load DAC. Digital input active low. NLDAC must be taken low to update
the DAC latch from the holding latches.
4
DIN
Digital input
Serial data input.
5
SCLK
Digital input
Serial clock input.
6
NCS
Digital input
Chip select. This pin is active low.
7
FS
Digital input
Frame synchronisation for serial input data.
8
DGND
Ground
Digital ground.
9
AGND
Ground
Analogue ground.
10
REFINCD
Analogue input
Voltage reference input for DACs C and D.
11
OUTD
Analogue output
DAC D output.
12
OUTC
Analogue output
DAC C output.
13
OUTB
Analogue output
DAC B output.
14
OUTA
Analogue output
DAC A output.
15
REFINAB
Analogue input
Voltage reference input for DACs A and B.
16
AVDD
Supply
Analogue supply.
WM2604
Production Data
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 June 99
3
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or
beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to
damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this
device.
CONDITION
MIN
MAX
Supply voltages, AVDD to AGND, DVDD to DGND
7V
Supply voltage differences, AVDD to DVDD
-2.8V
2.8V
Digital input voltage
-0.3V
DVDD + 0.3V
Reference input voltage
-0.3V
AVDD + 0.3V
Operating temperature range, T
A
WM2604C
WM2604I
0
C
-40
C
70
C
85
C
Storage temperature
-65
C
150
C
Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds
260
C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply voltage
AVDD, DVDD
2.7
5.5
V
High-level digital input voltage
V
IH
DVDD = 2.7V to 5.5V
2
V
Low-level digital input voltage
V
IL
DVDD = 2.7V to 5.5V
0.8
V
Reference voltage to REFINAB,
REFINCD
V
REF
See Note
AVDD - 1.5
V
Load resistance
R
L
2
10
k
Load capacitance
C
L
100
pF
Serial clock rate
f
SCLK
20
MHz
WM2604CDT
0
70
C
Operating free-air temperature
T
A
WM2604IDT
-40
85
C
Note: Reference voltages greater than AVDD/2 will cause output saturation for large DAC codes.
WM2604
Production Data
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 June 1999
4
ELECTRICAL CHARACTERISTICS
Test Conditions:
R
L
= 10k
, C
L
= 100pF. AVDD = DVDD
= 5V
10%, V
REF
= 2.048V and AVDD = DVDD
= 3V
10%, V
REF
= 1.024V over
recommended operating free-air temperature range (unless noted otherwise).
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Static DAC Specifications
Resolution
10
bits
Integral non-linearity
INL
See Note 1
0.4
1
LSB
Differential non-linearity
DNL
See Note 2
0.1
0.25
LSB
Zero code error
ZCE
See Note 3
3
12
mV
Gain error
GE
See Note 4
0.25
0.6
% FSR
d.c. power supply rejection ratio
DC PSRR
See Note 5
0.5
mV/V
Zero code error temperature coefficient
See Note 6
10
ppm/
C
Gain error temperature coefficient
See Note 6
10
ppm/
C
DAC Output Specifications
Output voltage range
0
AVDD - 0.1
V
Output load regulation
2k
to 10k
load
See Note 7
0.1
0.25
%
Power Supplies
No load, V
IH
= DVDD, V
IL
= 0V
AVDD = 5V,
V
REF
= 2.048V Slow
1.4
2.2
AVDD = 5V,
V
REF
= 2.048V Fast
3.5
5.5
AVDD = 3V,
V
REF
= 1.024V Slow
1.0
1.5
Active supply current
I
DD
AVDD = 3V,
V
REF
= 1.024V Fast
See Note 8
3.0
4.5
mA
Power down supply current
No load, all digital inputs
0V or DVDD
See Note 9
0.01
10
A
Dynamic DAC Specifications
Slew rate
DAC code 32 to 1023,
10% to 90%
Slow
Fast
See Note 10
0.5
2.5
1.0
4.0
V/
s
V/
s
Settling time
DAC code 32 to 1023
Slow
Fast
See Note 11
12.0
4.0
s
s
Glitch energy
Code 511 to 512
10
nV-s
Signal to noise ratio
SNR
fs = 400ksps, f
OUT
= 1kHz,
BW = 20kHz
See Note 12
60
68
dB
Signal to noise and distortion ratio
SNRD
fs = 400ksps, f
OUT
= 1kHz,
BW = 20kHz
See Note 12
54
65
dB
Total harmonic distortion
THD
fs
= 400ksps, f
OUT
= 1kHz,
BW = 20kHz
See Note 12
-68
-54
dB
Spurious free dynamic range
SPFDR
fs
= 400ksps, f
OUT
= 1kHz,
BW = 20kHz
See Note 12
54
70
dB
WM2604
Production Data
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 June 99
5
Test Conditions:
R
L
= 10k
, C
L
= 100pF. AVDD = DVDD
= 5V
10%, V
REF
= 2.048V and AVDD = DVDD
= 3V
10%, V
REF
= 1.024V over
recommended operating free-air temperature range (unless noted otherwise).
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Reference
Reference input resistance
R
REFIN
10
M
Reference input capacitance
C
REFIN
5
pF
Reference feedthrough
V
REF
= 1V
PP
at 1kHz
+ 1.024V dc, DAC code 0
-75
dB
Reference input bandwidth
V
REF
= 0.2V
PP
+ 1.024V dc
DAC code 512
Slow
Fast
0.5
1
MHz
MHz
Digital Inputs
High level input current
I
IH
Input voltage = DVDD
1
A
Low level input current
I
IL
Input voltage = 0V
-1
A
Input capacitance
C
I
3
pF
Notes:
1.
Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects of
zero code and full scale errors).
2.
Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two codes. A
guarantee of monotonicity means the output voltage changes in the same direction (or remains constant) as a change in digital input code.
3.
Zero code error is the voltage output when the DAC input code is zero.
4.
Gain error is the deviation from the ideal full scale output excluding the effects of zero code error.
5.
Power supply rejection ratio is measured by varying AVDD from 4.5V to 5.5V and measuring the proportion of this signal imposed on
the zero code error and the gain error.
6.
Zero code error and Gain error temperature coefficients are normalised to full scale voltage.
7.
Output load regulation is the difference between the output voltage at full scale with a 10k
load and 2k
load. It is expressed as a
percentage of the full scale output voltage with a 10k
load.
8.
I
DD
is measured while continuously writing code 512 to the DAC. For V
IH
< DVDD - 0.7V and V
IL
> 0.7V supply current will increase.
9.
Typical supply current in power down mode is 10nA. Production test limits are wider for speed of test.
10. Slew rate results are for the lower value of the rising and falling edge slew rates.
11. Settling time is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and falling edges. Limits
are ensured by design and characterisation, but are not production tested.
12. SNR, SNRD, THD and SPFDR are measured on a synthesised sinewave at frequency f
OUT
generated with a sampling frequency fs
.
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