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Электронный компонент: WM2625ID

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WM2625
Low Power Dual 8-bit Serial Input DAC
Production Data, April 2001, Rev. 1.0
WOLFSON MICROELECTRONICS LTD
Lutton Court, Bernard Terrace, Edinburgh, EH8 9NX, UK
Tel: +44 (0) 131 667 9386
Fax: +44 (0) 131 667 5176
Email: sales@wolfson.co.uk
www.wolfsonmicro.com
Production Data Datasheets contain final
specifications current on publication date.
Supply of products conforms to Wolfson
Microelectronics' Terms and conditions.
2001 Wolfson Microelectronics Ltd
.
FEATURES
Dual 8-bit voltage output DAC
Single supply from 2.7V to 5.5V
Low supply current
-
0.8mA typical in slow mode
-
1.8mA typical in fast mode
DNL
0.2 LSB, INL
0.5 LSB (max)
Monotonic over temperature
DSP compatible serial interface
Programmable settling time of 1
s or 3
s typical
High impedance reference input buffer
APPLICATIONS
Digital servo control loops
Industrial process control
Battery powered instruments and controls
Machine and motion control devices
Digital offset and gain adjustment
ORDERING INFORMATION
DEVICE
TEMP. RANGE
PACKAGE
WM2625CD
0 to 70C
8-pin SOIC
WM2625ID
-40 to 85C
8-pin SOIC
DESCRIPTION
The WM2625 is a dual 8-bit voltage output, resistor string
digital-to-analogue converter. It can operate with supply
voltages between 2.7V and 5.5V and can be powered down
under software control. Power down reduces current
consumption to 1
A.
The device has been designed for glueless interface to industry
standard microprocessors and DSPs. The WM2625 is
programmed with a 16-bit serial word including 4 control bits
and 8 data bits.
Excellent performance is delivered with a typical DNL of
0.2LSBs. Monotonicity is guaranteed over the operating
temperature range. The settling time of the DAC is
programmable to allow for optimisation of speed versus power
dissipation. The analogue output is buffered by a rail-to-rail
amplifier with a gain of two and a Class AB output stage.
The reference voltage input features a high impedance buffer
which eliminates the need to keep the reference source
impedance low.
The WM2625 is available in an 8-pin SOIC package.
Commercial (0
to 70
C) and Industrial (-40
to 85
C)
temperature range variants are available.
BLOCK DIAGRAM
TYPICAL PERFORMANCE
WM2625
SERIAL
INTERFACE
AND
CONTROL
LOGIC
POWER-
DOWN AND
SPEED
CONTROL
X1
X1
X2
X2
REF
DIN
SCLK
NCS
OUTA
OUTB
8
8
2
VDD
GND
DAC
DAC
VDD = 5V, V
REF
= 2.048V, Speed = Fast Mode, T
A
= 25.5
O
C
-0.1
-0.08
-0.06
-0.04
-0.02
0
0.02
0.04
0.06
0.08
0.1
0
32
64
96
128
160
192
224
256
DIGITAL CODE
D
N
L
-
D
i
f
f
e
re
nt
i
a
l
N
on-
Li
ne
a
r
i
t
y
(
L
S
B
s
)
WM2625
Production Data
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 April 2001
2
PIN CONFIGURATION
1
2
3
4
NCS
DIN
SCLK
GND
REF
OUTA
VDD
OUTB
5
6
7
8
PIN DESCRIPTION
PIN NO
NAME
TYPE
DESCRIPTION
1
DIN
Digital input
Serial data input
2
SCLK
Digital input
Serial clock input
3
NCS
Digital input
Chip select. This pin is active low.
4
OUTA
Digital input
DAC A analogue voltage output
5
GND
Supply
Ground
6
REF
Analogue input
Voltage reference input
7
OUT
Analogue output
DAC B analogue voltage output
8
VDD
Supply
Positive power supply
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
MAX
Supply voltage, VDD to GND
7V
Digital input voltage
-0.3V
VDD + 0.3V
Reference input voltage
-0.3V
VDD + 0.3V
Operating temperature range, T
A
WM2625CD
WM2625ID
0
C
-40
C
70
C
85
C
Storage temperature
-65
C
150
C
Soldering lead temperature, 1.6mm (1/16 inch) from package body for
10 seconds
260
C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply voltage
VDD
2.7
5.5
V
High-level digital input voltage
V
IH
VDD = 2.7V to 5.5V
2
V
Low-level digital input voltage
V
IL
VDD = 2.7V to 5.5V
0.8
V
Reference voltage to REF pin
V
REF
See Note
GND
VDD - 1.5
V
Load resistance
R
L
2
k
Load capacitance
C
L
100
pF
Serial clock frequency
f
SCLK
20
MHz
WM2625CD
0
70
C
Operating free-air temperature
T
A
WM2625ID
-40
85
C
Note: Reference input voltages greater than VDD/2 will cause clipping for large DAC codes.
Production Data
WM2625
WOLFSON MICROELECTRONICS LTD
PD
Rev 1.0 April 2001
3
ELECTRICAL CHARACTERISTICS
Test Conditions:
R
L
= 10k
, C
L
= 100pF. VDD
= 5V 10%, V
REF
= 2.048V and VDD
= 3V 10%, V
REF
= 1.024V over recommended operating free-
air temperature range (unless noted otherwise).
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Static DAC Specifications
Resolution
8
bits
Integral non-linearity
INL
See Note 1
0.3
0.5
LSB
Differential non-linearity
DNL
See Note 2
0.07
0.2
LSB
Zero code error
ZCE
See Note 3
12
mV
Gain error
GE
See Note 4
0.5
% FSR
D.C. power supply rejection ratio
D.C. PSRR
See Note 5
-65
mV/V
Zero code error temperature coefficient
See Note 6
10
ppm/
C
Gain error temperature coefficient
See Note 6
10
ppm/
C
DAC Output Specifications
Output voltage range
0
VDD - 0.4
V
Output load regulation
2k
to 10k
load
See Note 7
0.29
% FS
Power Supplies
No load, DAC value = 128,
all digital inputs 0V or VDD
Active supply current
I
DD
Slow Mode
0.8
1
mA
Fast Mode
1.8
2.3
mA
Power down supply current
See Note 8
1
3
A
Dynamic DAC Specifications
Slew rate
SR
DAC output 10%-90%
Slow
Fast
See Note 9
0.5
3
V/
s
V/
s
Full-scale settling time
t
s
DAC output 10%-90%
Slow
Fast
See Note 10
3
1
10
3
s
s
Glitch energy
DIN = 0 to 1, f
CLK
= 100kHz,
NCS = VDD
5
nV-s
Signal to noise ratio
SNR
52
54
dB
Signal to noise and distortion ratio
SINAD
48
49
dB
Total harmonic distortion
THD
-50
-48
dB
Spurious free dynamic range
SFDR
f
s
= 102kSPS,
f
OUT
= 1kHz,
See Note 11
48
50
dB
Reference
Reference input resistance
R
REFIN
10
M
Reference input capacitance
C
REFIN
5
pF
Reference feedthrough
V
REF
= 1V
PP
at 1kHz
+ 1.024V dc, DAC code 0
-80
dB
Reference input bandwidth
V
REF
= 0.2V
PP
+ 1.024V dc
Slow
Fast
0.525
1.3
MHz
MHz
Digital Inputs
High level input current
I
IH
Input voltage = VDD
-1
1
A
Low level input current
I
IL
Input voltage = 0V
-1
1
A
Input capacitance
C
I
8
pF
WM2625
Production Data
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 April 2001
4
Notes:
1.
Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the
effects of zero code and full scale errors).
2.
Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two
codes. A guarantee of monotonicity means the output voltage always changes in the same direction (or remains constant) as
the digital input code.
3.
Zero code error is the voltage output when the DAC input code is zero.
4.
Gain error is the deviation from the ideal full-scale output excluding the effects of zero code error.
5.
Power supply rejection ratio is measured by varying VDD from 4.5V to 5.5V and measuring the proportion of this signal
imposed on the zero code error and the gain error.
6.
Zero code error and Gain error temperature coefficients are normalised to full-scale voltage.
7.
Output load regulation is the difference between the output voltage at full scale with a 10k
load and 2k
load. It is
expressed as a percentage of the full scale output voltage with a 10k
load.
8.
I
DD
is measured while continuously writing code 128 to the DAC. For V
IH
< VDD - 0.7V and V
IL
> 0.7V supply current will
increase.
9.
Slew rate results are for the lower value of the rising and falling edge slew rates
10. Settling time is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and falling
edges. Limits are ensured by design and characterisation, but are not production tested.
11. SNR, SNRD, THD and SPFDR are measured on a synthesised sine wave at frequency f
OUT
generated with a sampling
frequency f
s.
SERIAL INTERFACE
NCS
SCLK
DIN
1
2
3
4
5 15
16
D0
D1
D12
D13
D14
D15
t
WL
t
WH
t
SUD
t
HD
t
SUCSCK
t
SUC16CS
Figure 1 Timing Diagram
Test Conditions:
R
L
= 10k
, C
L
= 100pF. VDD
= 5V
10%, V
REF
= 2.048V and VDD
= 3V
10%, V
REF
= 1.024V over recommended operating
free-air temperature range (unless noted otherwise).
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
t
SUCSCK
Setup time, NCS low before first falling SCLK edge
10
ns
t
SUC16CS
Setup time, 16
th
falling SCLK edge (when data bit D0
is sampled) before NCS rising edge.
10
ns
t
WH
Pulse duration, SCLK high.
25
ns
t
WL
Pulse duration, SCLK low.
25
ns
t
SUD
Setup time, data ready before SCLK falling edge.
10
ns
t
HD
Hold time, data held valid after SCLK falling edge.
10
ns
Production Data
WM2625
WOLFSON MICROELECTRONICS LTD
PD
Rev 1.0 April 2001
5
TYPICAL PERFORMANCE GRAPHS
VDD = 5V, V
REF
= 2.048V, Speed = Fast Mode, T
A
= 25.5
O
C
-0.2
-0.15
-0.1
-0.05
0
0.05
0.1
0.15
0.2
0
32
64
96
128
160
192
224
256
DIGITAL CODE
I
N
L -
I
n
t
e
gr
a
l
Non-
Li
ne
a
r
i
t
y
(
L
SBs
)
Figure 2 Integral Non-Linearity
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
0
1
2
3
4
5
6
7
8
9
10
ISINK - mA
OU
TP
U
T
V
O
LTA
GE
-
V
Slow
Fast
VDD = 3V, V
REF
= 1V, Input Code = 0
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
0
1
2
3
4
5
6
7
8
9
10
ISINK - mA
OU
TP
U
T
V
O
LTA
GE
-
V
Slow
Fast
VDD = 5V, V
REF
= 2V, Input Code = 0
Figure 3 Sink Current VDD = 3V
Figure 4 Sink Current VDD = 5V
2.025
2.03
2.035
2.04
2.045
2.05
2.055
2.06
0
1
2
3
4
5
6
7
8
9
10
ISOURCE - mA
OU
TP
U
T
V
O
LTA
GE
-
V
Slow
Fast
VDD = 3V, V
REF
= 1V, Input Code = 4095
4.065
4.07
4.075
4.08
4.085
4.09
4.095
4.1
0
1
2
3
4
5
6
7
8
9
10
ISOURCE - mA
OU
TP
U
T
V
O
LTA
GE
-
V
Slow
Fast
VDD = 5V, V
REF
= 2V, Input Code = 4095
Figure 5 Source Current VDD = 3V
Figure 6 Source Current VDD = 5V